IP Library Granted Patent US 9,170,483
Granted Patent B2
US 9,170,483 · App. 14/015,279 · Granted Oct 27, 2015

Photomask, photomask set, exposure apparatus and exposure method

Inventors: Shoji Takano (Tokyo, JP); Fumihiko Matsuda (Tokyo, JP); Yoshihiko Narisawa (Tokyo, JP)
Assignee: NIPPON MEKTRON, LTD.
G03F1/42G03F7/20G03F9/7003G03F9/7084G03F9/7088
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Quick Facts
Patent No.
US 9,170,483
App. No.
14/015,279
Granted
Oct 27, 2015
Kind
B2
Abstract

There is provided a photomask capable of improving alignment accuracy with respective photomasks disposed on the front and rear faces of a substrate. A photomask has a drawing pattern for exposure formed on one face opposing a substrate, a first alignment mark for alignment with a substrate side mark formed on the substrate, the first alignment mark being provided in a region of the one face, the region opposing the substrate when the substrate is retained and the drawing pattern is not formed in the region, and a second alignment mark for alignment with a third alignment mark provided on another photomask, the second alignment mark being provided in a region which does not oppose the substrate when the substrate is retained.

Claims (20)

1. A photomask for use with another photomask and a flexible printed substrate having a photosensitive resist layer being provided on both front and rear faces of the flexible printed substrate, the photomask comprising:

a drawing pattern for exposure formed on one face opposing the flexible printed substrate;

a first alignment mark for alignment with a substrate side mark formed on the flexible printed substrate, the first alignment mark being provided in a region of the one face, the region opposing the flexible printed substrate when the flexible printed substrate is retained and the drawing pattern is not formed in the region; and

a second alignment mark for alignment with a third alignment mark provided on the another photomask opposing the other face of the flexible printed substrate, the second alignment mark being provided in a region which does not oppose the flexible printed substrate when the flexible printed substrate is retained.

2. The photomask according to claim 1 , wherein

a recessed portion is provided in the one face, and when negative pressure is applied via a pressure generating means, the recessed portion applies the negative pressure to an opposing face of the flexible printed substrate which opposes the one face.

3. The photomask according to claim 2 , wherein

the recessed portion is provided with a suction trench extending along the one face and a suction hole penetrating to the suction trench from another face on an opposite side of the one face.

4. The photomask according to claim 3 , wherein

the suction trench is formed in a ring shape, the first alignment mark is provided on an inside surrounded by the ring-shaped suction trench on the one face, and the second alignment mark is provided on an outside of the ring-shaped suction trench on the one face.

5. A photomask set a flexible printed substrate having a photosensitive resist layer being provided on both front and rear faces of the flexible printed substrate, the photomask pair comprising:

a first photomask; and

a second photomask, wherein

the first photomask comprises:

a drawing pattern for exposure formed on one face opposing the flexible printed substrate;

a first alignment mark for alignment with a substrate side mark formed on the flexible printed substrate, the first alignment mark being provided in a region of the one face, the region opposing the flexible printed substrate when the flexible printed substrate is retained and the drawing pattern is not formed in the region; and

a second alignment mark for alignment with a third alignment mark provided on the second photomask, the second alignment mark being provided in a region which does not oppose the flexible printed substrate when the flexible printed substrate is retained, and

the second photomask comprises:

a drawing pattern for exposure formed on one face opposing the flexible printed substrate; and

the third alignment mark for alignment with the second alignment mark provided on the first photomask, the third alignment mark being provided in a region of the one face wherein the region does not oppose the flexible printed substrate when the flexible printed substrate is retained.

Assignments (2)
CHANGE OF NAME Recorded Sep 26, 2025
From: NIPPON MEKTRON, LTD.
To: MEKTEC CORPORATION
Reel/Frame 072961/0045 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 30, 2013
From: TAKANO, SHOJI; MATSUDA, FUMIHIKO; NARISAWA, YOSHIHIKO
To: NIPPON MEKTRON, LTD.
Reel/Frame 031119/0802 →
Priority Claims (1)
JP 2012-202022 · Sep 13, 2012 · national
Continuity (1)
Related Publication 20140072904A1 · Mar 13, 2014