IP Library Granted Patent US 8,878,643
Granted Patent B2
US 8,878,643 · App. 14/015,488 · Granted Nov 4, 2014

Resistor with temperature coefficient of resistance (TCR) compensation

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Quick Facts
Patent No.
US 8,878,643
App. No.
14/015,488
Granted
Nov 4, 2014
Kind
B2
Abstract

A current sense resistor and a method of manufacturing a current sensing resistor with temperature coefficient of resistance (TCR) compensation are disclosed. The resistor has a resistive strip disposed between two conductive strips. A pair of main terminals and a pair of voltage sense terminals are formed in the conductive strips. A pair of rough TCR calibration slots is located between the main terminals and the voltage sense terminals, each of the rough TCR calibration slots have a depth selected to obtain a negative starting TCR value observed at the voltage sense terminals. A fine TCR calibration slot is formed between the pair of voltage sense terminals.

Claims (36)

1. A resistor with temperature coefficient of resistance (TCR) compensation, the resistor comprising:

a resistive strip disposed between first and second conductive strips;

a first main terminal and a first voltage sense terminal formed in the first conductive strip;

a second main terminal and a second voltage sense terminal formed in the second conductive strip;

a first rough TCR calibration slot located between the first voltage sense terminal and the first main terminal, the first rough TCR calibration slot having an opening facing away from the resistive strip, and a depth that extends toward the resistive strip;

a second rough TCR calibration slot located between the second voltage sense terminal and the second main terminal, the second rough TC calibration slot having an opening facing away from the resistive strip, and a depth that extends toward the resistive strip; and

a fine TCR calibration slot formed between the first and second voltage sense terminals.

2. The resistor of claim 1 wherein each of the first and second rough TCR calibration slots has a depth selected to obtain a negative starting TCR value observed at the first and second voltage sense terminals, and wherein the fine TCR calibration slot has a depth selected to obtain a TCR value observed at the first and second voltage sense terminals that approaches zero.

3. The resistor of claim 1 further comprising a resistance calibration slot formed between the first and second main terminals, wherein the resistance calibration slot has a depth selected to calibrate a resistance value of the resistor.

4. The resistor of claim 1 wherein each of the first and second rough TCR calibration slots has an equal depth.

5. The resistor of claim 1 wherein each of the first and second rough TCR calibration slots has a different depth.

6. The resistor of claim 1 wherein the fine TCR calibration slot is formed in the resistive strip.

7. The resistor of claim 3 wherein the resistance calibration slot is formed in the resistive strip.

8. A method of manufacturing a resistor with temperature coefficient of resistance (TCR) compensation, the method comprising:

disposing a resistive strip between first and second conductive strips;

forming a first main terminal and a first voltage sense terminal in the first conductive strip, the first rough TCR calibration slot having an opening facing away from the resistive strip, and a depth that extends toward the resistive strip;

forming a second main terminal and a second voltage sense terminal in the second conductive strip, the second rough TC calibration slot having an opening facing away from the resistive strip, and a depth that extends toward the resistive strip;

forming a first rough TCR calibration slot between the first voltage sense terminal and the first main terminal;

forming a second rough TCR calibration slot between the second voltage sense terminal and the second main terminal; and

forming a fine TCR calibration slot between the first and second voltage sense terminals.

9. The method of claim 8 wherein each of the first and second rough TCR calibration slots has a depth selected to obtain a negative starting TCR value observed at the first and second voltage sense terminals, and wherein the fine TCR calibration slot has a depth selected to obtain a TCR value observed at the first and second voltage sense terminals that approaches zero.

10. The method of claim 8 further comprising forming a resistance calibration slot between the first and second main terminals, wherein the resistance calibration slot has a depth selected to calibrate a resistance value of the resistor.

11. The method of claim 8 wherein each of the first and second rough TCR calibration slots has an equal depth.

12. The method of claim 8 wherein each of the first and second rough TCR calibration slots has a different depth.

13. The method of claim 8 wherein the fine TCR calibration slot is formed in the resistive strip.

14. The method of claim 10 wherein the resistance calibration slot is formed in the resistive strip.

15. A resistor with temperature coefficient of resistance (TCR) compensation, the resistor comprising:

a resistive strip disposed between first and second conductive strips, each of the first and second conductive strips having a defined internal area;

a first main terminal and a first voltage sense terminal formed within the defined internal area of the first conductive strip;

a second main terminal and a second voltage sense terminal formed within the defined internal area of the second conductive strip; and

first and second TCR calibration slots, each having a plurality of TCR calibration legs located between the first and second main terminals.

16. The resistor of claim 15 wherein at least one of the plurality of TCR calibration legs has a length selected to obtain a rough TCR value observed at the first and second voltage sense terminals, and at least one of the plurality of TCR calibration legs has a length selected to obtain a TCR value observed at the first and second voltage sense terminals that approaches zero.

17. The resistor of claim 15 wherein the first and second conductive strips define a main current path, and at least one of the plurality of TCR calibration legs is disposed orthogonal to the main current path.

18. The resistor of claim 15 wherein the first and second conductive strips define a main current path, and at least one of the plurality of TCR calibration legs is disposed parallel to the main current path.

19. The resistor of claim 15 wherein at least one of the plurality of TCR calibration legs of the first TCR calibration slot has the same length as at least one of the plurality of TCR calibration legs of the second TCR calibration slot.

20. The resistor of claim 15 wherein at least one of the plurality of TCR calibration legs of the first TCR calibration slot has a different length than at least one of the plurality of TCR calibration legs of the second TCR calibration slot.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Jul 17, 2019
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: VISHAY DALE ELECTRONICS, INC.; DALE ELECTRONICS, INC.; VISHAY DALE ELECTRONICS, LLC; VISHAY-DALE
Reel/Frame 049772/0898 →
SECURITY INTEREST Recorded Jun 12, 2019
From: VISHAY DALE ELECTRONICS, INC.; DALE ELECTRONICS, INC.; VISHAY DALE ELECTRONICS, LLC; VISHAY-DALE, INC.; VISHAY INTERTECHNOLOGY, INC.; SILICONIX INCORPORATED; VISHAY-SILICONIX, INC.; VISHAY-SILICONIX; VISHAY SPRAGUE, INC.; VISHAY EFI, INC.; SPRAGUE ELECTRIC COMPANY; VISHAY GENERAL SEMICONDUCTOR, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 049440/0876 →
CHANGE OF NAME Recorded Feb 5, 2018
From: VISHAY DALE ELECTRONICS, INC.
To: VISHAY DALE ELECTRONICS, LLC
Reel/Frame 045246/0696 →
SECURITY AGREEMENT Recorded Dec 10, 2015
From: VISHAY DALE ELECTRONICS, LLC
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 037261/0616 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 2, 2015
From: SMITH, CLARK L.; BERTSCH, THOMAS L.; WYATT, TODD L.; VEIK, THOMAS L.
To: VISHAY DALE ELECTRONICS, INC.
Reel/Frame 037190/0874 →