Statistical optimization in place-and-route
Place-and-route (P&R) includes maintaining a set of local arrival time information and local required time information associated with a circuit layout; determining a candidate fix on a critical path in the circuit layout; statistically determining, using one or more computer processors, a set of one or more adjusted local slacks associated with a region affected by the candidate fix; and in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement, accepting the candidate fix.
1. A place-and-route (P&R) method, comprising:
maintaining a set of local arrival time information and local required time information associated with a circuit layout;
determining a candidate fix on a critical path in the circuit layout;
determining a first circuit portion that is affected by the candidate fix, wherein the first circuit portion that is affected by the candidate fix includes at least a portion of a fan-out path that fans out from the candidate fix, or at least a portion of an unconnected path that is unconnected to the critical path and whose timing is affected by the candidate fix;
statistically determining, using one or more computer processors, a set of one or more adjusted local slacks associated with the first circuit portion affected by the candidate fix; and
in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement in the first circuit portion, accepting the candidate fix and updating a set of local arrival time information and local required time information associated with a second circuit portion affected by the candidate fix.
2. The method of claim 1 , further comprising identifying the critical path.
3. The method of claim 1 , wherein the second circuit portion is greater than the first circuit portion.
4. The method of claim 1 , wherein:
the critical path is a first critical path;
the candidate fix is a first candidate fix; and
the method further comprises, in the event that the set of one or more adjusted local slacks indicates that the first candidate fix results in the timing improvement in the first circuit portion:
identifying a second critical path based on the updated set of local arrival times and local required times associated with the second circuit portion; and
determining a second candidate fix on the second critical path.
5. The method of claim 1 , wherein statistically determining the set of one or more adjusted local slacks associated with the first circuit portion affected by the candidate fix includes selecting, at a fanout location, a fanout path among a plurality of fanout paths to compute the set of one or more adjusted local slacks.
6. The method of claim 5 , wherein the selected fanout path results in a least local statistical slack among the fanout paths at the fanout location.
7. The method of claim 1 , wherein an adjusted local slack is statistically determined based at least in part on an expected slack and a variance of the slack.
8. The method of claim 1 , wherein an adjusted local slack is statistically determined based at least in part on a mean slack, a variance of launch clock data, a variance of capture clock, and a variance of Clock Re-convergence Pessimism Removal (CRPR) time.
9. The method of claim 1 , wherein the candidate fix on the critical path includes a logical fix on the critical path.
10. The method of claim 1 , wherein the candidate fix on the critical path includes a logical fix on the critical path, the logical fix on the critical path includes: changing the size of a cell, adding one or more buffers, replacing a cell with a different cell with greater driving strength, or local area logic resynthesis.
11. A place-and-route (P&R) method, comprising:
maintaining a set of local arrival time information and local required time information associated with a circuit layout;
determining a candidate fix on a critical path in the circuit layout;
statistically determining, using one or more computer processors, a set of one or more adjusted local slacks associated with a circuit portion affected by the candidate fix; and
in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement, accepting the candidate fix; wherein
an adjusted local slack (slack) is statistically determined according to:
slack= E (slack)− n _sigma*sqrt(Var(slack)), wherein:
E(slack) corresponds to a mean slack;
n_sigma corresponds to a configurable value; and
Var(slack) corresponds to a variance of the slack.
12. A place-and-route (P&R) method, comprising:
maintaining a set of local arrival time information and local required time information associated with a circuit layout;
determining a candidate fix on a critical path in the circuit layout;
statistically determining, using one or more computer processors, a set of one or more adjusted local slacks associated with a circuit portion affected by the candidate fix; and
in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement, accepting the candidate fix; wherein
an adjusted local slack (slack) is statistically determined according to:
slack= E (slack)− n _sigma*sqrt(Var(launch_clock_data))− n _sigma*sqrt(Var(capture_clock)−Var(capture_crpr)).
13. A place-and-route (P&R) method, comprising:
maintaining a set of local arrival time information and local required time information associated with a circuit layout;
determining a candidate fix on a critical path in the circuit layout;
statistically determining, using one or more computer processors, a set of one or more adjusted local slacks associated with a circuit portion affected by the candidate fix; and
in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement, accepting the candidate fix; wherein
an adjusted local slack (slack) is statistically determined according to:
slack= E (slack)− n _sigma*sqrt(Var(arrival_time_data)+Var(required_time_data))− n _sigma*sqrt(Var(launch_clock)−Var(launch_crpr))− n _sigma*sqrt(Var(capture_clock)−Var(capture_crpr)).
14. A system for place-and-route (P&R), comprising:
one or more processors configured to:
maintain a set of local arrival time information and local required time information associated with a circuit layout;
determine a candidate fix on a critical path in the circuit layout;
determine a first circuit portion that is affected by the candidate fix, wherein the first circuit portion that is affected by the candidate fix includes at least a portion of a fan-out path that fans out from the candidate fix, or at least a portion of an unconnected path that is unconnected to the critical path and whose timing is affected by the candidate fix;
statistically determine a set of one or more adjusted local slacks associated with a the first circuit portion affected by the candidate fix; and
in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement in the first circuit portion, accept the candidate fix and update a set of local arrival time information and local required time information associated with a second circuit portion affected by the candidate fix; and
one or more memories coupled to the one or more processors and configured to provide the one or more processors with instructions.
15. The system of claim 14 , wherein the one or more processors are further configured to identify the critical path.
16. The system of claim 14 , wherein the second circuit portion is greater than the first circuit portion.
17. The system of claim 14 , wherein:
the critical path is a first critical path;
the candidate fix is a first candidate fix; and
the one or more processors are further configured to, in the event that the set of one or more adjusted local slacks indicates that the first candidate fix results in the timing improvement in the first circuit portion:
identify a second critical path based on the updated set of local arrival times and local required times associated with the second circuit portion; and
determine a second candidate fix on the second critical path.
18. The system of claim 14 , wherein to statistically determine the set of one or more adjusted local slacks associated with the first circuit portion affected by the candidate fix includes to select, at a fanout location, a fanout path among a plurality of fanout paths to compute the set of one or more adjusted local slacks.
19. The system of claim 18 , wherein the selected fanout path results in a least local statistical slack among the fanout paths at the fanout location.
20. The system of claim 14 , wherein an adjusted local slack is statistically determined based at least in part on an expected slack and a variance of the slack.
21. The system of claim 14 , wherein an adjusted local slack is statistically determined based at least in part on a mean slack, a variance of launch clock data, a variance of capture clock, and a variance of Clock Re-convergence Pessimism Removal (CRPR) time.
22. A system for place-and-route (P&R), comprising:
one or more processors configured to:
maintain a set of local arrival time information and local required time information associated with a circuit layout;
determine a candidate fix on a critical path in the circuit layout;
statistically determine a set of one or more adjusted local slacks associated with a circuit portion affected by the candidate fix; and
in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement, accept the candidate fix; and
one or more memories coupled to the one or more processors and configured to provide the one or more processors with instructions; wherein
an adjusted local slack (slack) is statistically determined according to:
slack= E (slack)− n _sigma*sqrt(Var(slack)), wherein:
E(slack) corresponds to a mean slack;
n_sigma corresponds to a configurable value; and
Var(slack) corresponds to a variance of the slack.
23. A system for place-and-route (P&R), comprising:
one or more processors configured to:
maintain a set of local arrival time information and local required time information associated with a circuit layout;
determine a candidate fix on a critical path in the circuit layout;
statistically determine a set of one or more adjusted local slacks associated with a circuit portion affected by the candidate fix; and
in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement, accept the candidate fix; and
one or more memories coupled to the one or more processors and configured to provide the one or more processors with instructions; wherein
an adjusted local slack (slack) is statistically determined according to:
slack= E (slack)− n _sigma*sqrt(Var(launch_clock_data))− n _sigma*sqrt(Var(capture_clock)−Var(capture_crpr)).
24. A system for place-and-route (P&R), comprising:
one or more processors configured to:
maintain a set of local arrival time information and local required time information associated with a circuit layout;
determine a candidate fix on a critical path in the circuit layout;
statistically determine a set of one or more adjusted local slacks associated with a circuit portion affected by the candidate fix; and
in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement, accept the candidate fix; and
one or more memories coupled to the one or more processors and configured to provide the one or more processors with instructions; wherein
an adjusted local slack (slack) is statistically determined according to:
slack= E (slack)− n _sigma*sqrt(Var(arrival_time_data)+Var(required_time_data))− n _sigma*sqrt(Var(launch_clock)−Var(launch_crpr))− n _sigma*sqrt(Var(capture_clock)−Var(capture_crpr)).
25. A computer program product for place-and-route (P&R), the computer program product being embodied in a non-transitory computer readable storage medium and comprising computer instructions for:
maintaining a set of local arrival time information and local required time information associated with a circuit layout;
determining a candidate fix on a critical path in the circuit layout;
determining a first circuit portion that is affected by the candidate fix, wherein the first circuit portion that is affected by the candidate fix includes at least a portion of a fan-out path that fans out from the candidate fix, or at least a portion of an unconnected path that is unconnected to the critical path and whose timing is affected by the candidate fix;
statistically determining a set of one or more adjusted local slacks associated with the first circuit portion affected by the candidate fix; and
in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement in the first circuit portion, accepting the candidate fix and updating a set of local arrival time information and local required time information associated with a second circuit portion affected by the candidate fix.