Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask

1. A structure for discharging extreme ultraviolet mask (EUV mask) when said EUV mask is inspected by using a charged particle beam inspection tool, comprising:

means for conducting charge on an EUV mask in inspecting said EUV mask by using the charged particle beam inspection system having a detector for receiving signal electron emanating from said EUV mask;

a grounding pin to contact said means;

a slider with a top surface divided into a flat area and a downward-tilted area;

an elastic element connecting to a back side of said slider;

an arm structure comprising a body, said grounding pin on a front end of said body and a prop connecting to said body, wherein said prop contacts said flat area; and

said EUV mask moving toward a front side of said slider to push said slider back and press said elastic element, so that said prop moves along said top surface of said slider and then contacts said downward-tilted area to make said body of said arm structure tilt and said grounding pin contact said means.

2. A structure for discharging extreme ultraviolet mask (EUV mask) when said EUV mask is inspected by using a charged particle beam inspection tool, comprising:

means for conducting charge on an EUV mask in inspecting said EUV mask by using the charged particle beam inspection system having a detector for receiving signal electron emanating from said EUV mask;

a grounding pin to contact said means;

a gripper unit for fixing said EUV mask in place through rotation of said gripper unit about a first pivot substantially parallel with a first center axis of a first rolling member set at a bottom end of said gripper unit;

an arm structure comprising a body, said grounding pin on a top end of said body and a second rolling member set at a bottom end of said body, wherein said grounding pin reciprocates to contact said means and leave said EUV mask through rotation of said body about a second pivot substantially parallel with a second center axis of said second rolling member;

at least one first resilient member and at least one second resilient member each with one end being fixed, and respectively with the other ends being connected to said gripper unit and to said body of said arm structure, for respectively providing a first force to said gripper unit toward a first direction and a second force to said body of said arm structure toward a second direction; and

a reciprocating member for causing said first rolling member and said second rolling member to rotate, said reciprocating member comprising a fix end and a mobile end pivoting said fixed end, said reciprocating member being in contact with said first rolling member and said second rolling member such that said first rolling member and said second rolling member rolls freely on a surface of said reciprocating member.

3. A structure for discharging extreme ultraviolet mask (EUV mask) when said EUV mask is inspected by using a charged particle beam inspection tool, comprising:

means for conducting charge on an EUV mask in inspecting said EUV mask by using the charged particle beam inspection system having a detector for receiving signal electron emanating from said EUV mask;

a grounding pin to contact said means;

a hollow cylinder having two opposite trenches formed on an inner surface of a side wall of said hollow cylinder, wherein each trench has a lengthwise ditch and an upward-tilted ditch connecting to a top end of said lengthwise ditch;

a column having two opposite protrusions on an outer surface of said column passing through said hollow cylinder, and said protrusions respectively arranged within said opposite trenches to move along said lengthwise ditch and said upward-tilted ditch;

said grounding pin arranged on a top surface of said column; and

a reciprocating member configured for pushing said column to move, wherein when said reciprocating member pushes said column to move down, said column moves down in relative to said hollow cylinder and said grounding pin contacts said means, when said reciprocating member pushes said column to move up continuously in relative to said hollow cylinder, said column moves up straightly and then deflects as said protrusions move along said lengthwise ditch and said upward-tilted ditch, so that said grounding pin is far away from said means.

4. A structure for discharging extreme ultraviolet mask (EUV mask) when said EUV mask is inspected by using a charged particle beam inspection tool, comprising:

means for conducting charge on an EUV mask in inspecting said EUV mask by using the charged particle beam inspection system having a detector for receiving signal electron emanating from said EUV mask;

a grounding pin to contact said means;

a hollow cylinder having two opposite trenches passing through a side wall of said hollow cylinder, wherein each trench has a lengthwise ditch passing through said side wall and an upward-tilted ditch passing through said side wall and connecting to a top end of said lengthwise ditch;

a column having two opposite branch structures passing through said hollow cylinder, and said branch structures respectively arranged within said opposite trenches to move along said lengthwise ditch and said titled-upward ditch, wherein every branch structure comprises at least two horizontal rods;

said grounding pin arranged on a top surface of said column; and

a reciprocating member configured for pushing said column to move, wherein when said reciprocating member pushes said column to move down, said column moves down in relative to said hollow cylinder and said grounding pin contacts said means, and when said reciprocating member pushes said column to move up continuously in relative to said hollow cylinder, said column moves up straightly and then deflects as said branch structures move along said lengthwise ditch and said upward-tilted ditch, so that said grounding pin is far away from said means.

5. A structure for discharging EUV mask when said EUV mask is inspected by using a charged particle beam inspection tool, comprising:

a first conductive layer on one side of an EUV mask;

a second conductive layer on a surface opposite to a reflective surface of said EUV mask;

a grounding pin to contact said second conductive layer in inspecting said EUV mask by using the charged particle beam inspection tool having a detector for receiving signal electron emanating from said EUV mask, so that charge on said reflective surface of said EUV mask is grounded through said second conductive layer to said grounding pin;

a gripper unit for fixing said EUV mask in place through rotation of said gripper unit about a first pivot substantially parallel with a first center axis of a first rolling member set at a bottom end of said gripper unit;

an arm structure comprising a body, said grounding pin on a top end of said body and a second rolling member set at a bottom end of said body, wherein said grounding pin reciprocates to contact said second conductive layer of said EUV mask and leave said second conductive layer through rotation of said body about a second pivot substantially parallel with a second center axis of said second rolling member;

at least one first resilient member and at least one second resilient member each with one end being fixed, and respectively with the other ends being connected to said gripper unit and to said body of said arm structure, for respectively providing a first force to said gripper unit toward a first direction and a second force to said body of said arm structure toward a second direction; and

a reciprocating member for causing said first rolling member and said second rolling member to rotate, said reciprocating member comprising a fix end and a mobile end pivoting said fixed end, said reciprocating member being in contact with said first rolling member and said second rolling member such that said first rolling member and said second rolling member rolls freely on a surface of said reciprocating member.

6. A structure for discharging EUV mask when said EUV mask is inspected by using a charged particle beam inspection tool, comprising:

a first conductive layer on one side of an EUV mask;

a second conductive layer on a surface opposite to a reflective surface of said EUV mask;

a grounding pin to contact said second conductive layer in inspecting said EUV mask by using the charged particle beam inspection tool having a detector for receiving signal electron emanating from said EUV mask, so that charge on said reflective surface of said EUV mask is grounded through said second conductive layer to said grounding pin;

a hollow cylinder having two opposite trenches formed on an inner surface of a side wall of said hollow cylinder, wherein each trench has a lengthwise ditch and a downward-tilted ditch connecting to a bottom end of said lengthwise ditch;

a column having two opposite protrusions on an outer surface of said column passing through said hollow cylinder, and said protrusions respectively arranged within said opposite trenches to move along said lengthwise ditch and said downward-tilted ditch;

said grounding pin arranged on a top surface of said column; and

a reciprocating member configured for pushing said column to move, wherein when said reciprocating member pushes said column to move up, said column moves up in relative to said hollow cylinder and said grounding pin contacts said second conductive layer, when said reciprocating member pushes said column to move down continuously in relative to said hollow cylinder, said column moves down straightly and then deflects as said protrusions move along said lengthwise ditch and said downward-tilted ditch, so that said grounding pin is far away from said second conductive layer.