Granted Patent B2

US 9,356,569 · App. 14/057,886 · Granted May 31, 2016

Abstract

Claims (7)

1. A semiconductor device, comprising: a differential amplifier including two inputs, wherein the differential amplifier is part of a bandgap voltage reference circuit; and a ready-flag circuit operably coupled to the differential amplifier, the ready-flag circuit configured to monitor two or more internal nodes of the differential amplifier and to produce a signal indicating whether a voltage difference between the two inputs has been minimized, wherein a first of the two internal nodes is located between two PMOS transistors within the differential amplifier, wherein a second of the two internal nodes is located between a PMOS transistor and an NMOS transistor within the differential amplifier, wherein the ready-flag circuit is configured to produce the signal after the differential amplifier has attained operational status and the output of the bandgap voltage reference circuit has reached its nominal value for a pre-determined period of time, wherein the first internal node is asserted high and attains an approximately constant voltage value when the differential amplifier reaches a predetermined bias condition, wherein a voltage value of the second internal node follows a supply voltage value of the differential amplifier, and wherein the voltage value of the second internal node is lower than a voltage value of the first internal node when the differential amplifier has not reached the predetermined bias condition.

2. The semiconductor device of claim 1 , wherein the differential amplifier is a folded cascode differential amplifier.

3. The semiconductor device of claim 1 , wherein the voltage value of the second internal node becomes larger than the voltage value of the first internal node when the differential amplifier has reached the predetermined bias condition.

4. The semiconductor device of claim 1 , wherein the ready-flag circuit includes a voltage or current comparator having an inverting input coupled to the first internal node and a non-inverting input coupled to the second internal node, and wherein the voltage or current comparator includes a Schmitt trigger-type buffer.

5. The semiconductor device of claim 4 , wherein the ready-flag circuit further includes a pull-down circuit coupled to an output of the voltage or current comparator, the pull-down circuit configured to couple the signal to a reference voltage value when the differential amplifier has not attained operational status.

6. A method, comprising: monitoring, via a ready-flag circuit, a first and a second internal node of a differential amplifier, wherein the differential amplifier is part of a bandgap voltage reference circuit; and producing, via the ready-flag circuit, a signal indicating whether a voltage difference between the first and second internal nodes has been minimized, wherein a first of the two internal nodes is located between two PMOS transistors of the differential amplifier, wherein a second of the two internal nodes is located between a PMOS transistor and an NMOS transistor of the differential amplifier, wherein the ready-flag circuit is configured to produce the signal in response to the differential amplifier having reached a bias condition and an output of the bandgap voltage reference circuit having reached its nominal value for a pre-determined period of time, wherein the first internal node is asserted high and attains an approximately constant voltage in response to the differential amplifier having reached the bias condition, wherein a voltage of the second internal node follows a supply voltage of the differential amplifier, and wherein the voltage of the second internal node is lower than a voltage of the first internal node in response to the differential amplifier not having reached the bias condition.

7. The method of claim 6 , wherein the voltage of the second internal node becomes larger than the voltage of the first internal node in response to the differential amplifier having reached the bias condition.

Assignments (17)