IP Library Granted Patent US 8,937,719
Granted Patent B2
US 8,937,719 · App. 14/058,055 · Granted Jan 20, 2015

High accuracy imaging colorimeter by special designed pattern closed-loop calibration assisted by spectrograph

Inventors: Ye Yin (Sunnyvale, CA); Gabriel G. Marcu (San Jose, CA); Jiaying Wu (San Jose, CA)
G01J3/28
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Quick Facts
Patent No.
US 8,937,719
App. No.
14/058,055
Granted
Jan 20, 2015
Kind
B2
Abstract

This specification describes various embodiments that relate to methods for providing a wideband colorimeter that can include more accurate outputs. In one embodiment, a narrowband instrument, such as a spectrometer or spectrograph, can be used for calibration of a wideband colorimeter, so that more accurate outputs can be provided. In one embodiment, an optical test equipment, which consists of both a wideband colorimeter and a narrowband spectrograph, can be used for providing a more accurately calibrated wideband colorimeter. As an example, a spectra-camera, which is a hybrid system consisting of both a wideband colorimeter and a narrowband spectrograph, can be used for simultaneous testing by both the wideband colorimeter and the narrowband spectrograph. By doing simultaneous testing, accurate calibration of the wideband colorimeter can be achieved. This specification further describes a mathematical model to characterize a wideband three channel colorimeter with a narrowband multiple channel spectrometer.

Claims (36)

1. A system configured to use a narrowband color measurement device to calibrate an output of a wideband color measurement device, the system comprising:

a splitter configured to split an image of a test pattern into a first image and a second image;

a first image pipeline to direct the first image to a narrowband device configured to capture a first data from the first image;

a second image pipeline to direct the second image to a wideband device configured to capture a second data from the second image, wherein the captured first data and the captured second data are used to determine a best fit correction matrix relating color data of the captured first data and the captured second data, and the best fit correction matrix is evaluated for being acceptable as a calibration parameter for a color measurement of the wideband device.

2. The system of claim 1 , wherein the best fit correction matrix is used for calibration of the wideband device.

3. The system of claim 2 , wherein the wideband device is a colorimeter.

4. The system of claim 3 , wherein the colorimeter includes a Bayer filter.

5. The system of claim 3 , wherein the colorimeter includes a color wheel.

6. The system of claim 2 , wherein the narrowband device is a spectrometer.

7. A method for using a narrowband color measurement device to calibrate an output of a wideband color measurement device, the method comprising:

splitting an image of a test pattern into a first image and a second image;

directing the first image to a narrowband device using a first image pipeline;

capturing a first data from the first image using the narrowband device;

directing the second image to a wideband device using a second image pipeline;

capturing a second data from the second image using the wideband device;

determining, using the captured first data and the captured second data, a best fit correction matrix relating color data of the captured first data and the captured second data; and

evaluating the best fit correction matrix for being acceptable as a calibration parameter for a color measurement of the wideband device.

8. The method of claim 7 , wherein the test pattern belongs to a set of predetermined test patterns comprising 61 unique digital color stimulus patterns.

9. The method of claim 7 , wherein the wideband device is a colorimeter.

10. The method of claim 9 , wherein the colorimeter includes a Bayer filter.

11. The method of claim 9 , wherein the colorimeter includes a color wheel.

12. The method of claim 7 , wherein the narrowband device is a spectrometer.

13. The method of claim 7 , wherein the best fit correction matrix is a 3×3 matrix.

14. The method of claim 7 , wherein the best fit correction matrix is a 3×4 matrix.

15. A non-transitory computer-readable medium storing instructions that when executed by a processor of a computing device cause the computing device to perform the steps of:

capturing a first data corresponding to a first image from a narrowband device;

capturing a second data corresponding to a second image from a wideband device, wherein the first image and the second image are derived from splitting an image of a test pattern;

determining, based on the captured first data and the captured second data, a best fit correction matrix relating color data of the captured first data and the captured second data; and

evaluating the best fit correction matrix for being acceptable as a calibration parameter for a color measurement of the wideband device.

16. The non-transitory computer-readable medium as recited in claim 15 , further comprising the steps of:

modifying an output of the wideband device using the best fit correction matrix.

17. The non-transitory computer-readable medium as recited in claim 15 , wherein the best fit correction matrix is a 3×3 matrix.

18. The non-transitory computer-readable medium as recited in claim 15 , wherein the best fit correction matrix is a 3×4 matrix.

19. The non-transitory computer-readable medium as recited in claim 15 , further comprising the steps of:

when the best fit correction matrix is determined to be unacceptable as the calibration parameter for the color measurement of the wideband device, capturing a new first image and a new second image.

20. The non-transitory computer-readable medium as recited in claim 15 , wherein the wideband device is a colorimeter and the narrowband device is a spectrometer.

Assignments (4)
CHANGE OF NAME Recorded Apr 28, 2023
From: INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GMBH
To: INSTRUMENT SYSTEMS GMBH
Reel/Frame 063490/0306 →
CHANGE OF ADDRESS Recorded Apr 20, 2023
From: INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GMBH
To: INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GMBH
Reel/Frame 063410/0513 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 23, 2016
From: APPLE INC.
To: INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GMBH
Reel/Frame 038679/0293 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 31, 2013
From: YIN, YE; MARCU, GABRIEL G.; WU, JIAYING
To: APPLE INC.
Reel/Frame 031523/0985 →
Continuity (2)
Provisional Application 61717523 · Oct 23, 2012
Related Publication 20140111807A1 · Apr 24, 2014