IP Library Granted Patent US 9,082,884
Granted Patent B2
US 9,082,884 · App. 14/059,379 · Granted Jul 14, 2015

Schottky diode

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Quick Facts
Patent No.
US 9,082,884
App. No.
14/059,379
Granted
Jul 14, 2015
Kind
B2
Abstract

A Schottky diode has: a semiconductor layer stack including a GaN layer formed over a substrate and an AlGaN layer formed on the GaN layer and having a wider bandgap than the GaN layer; an anode electrode and a cathode electrode which are formed at an interval therebetween on the semiconductor layer stack; and a block layer formed in a region between the anode electrode and the cathode electrode so as to contact the AlGaN layer. A part of the anode electrode is formed on the block layer so as not to contact the surface of the AlGaN layer. The barrier height between the anode electrode and the block layer is greater than that between the anode electrode and the AlGaN layer.

Claims (20)

1. A Schottky diode, comprising:

a substrate;

a semiconductor layer stack including a first nitride semiconductor layer formed over the substrate and a second nitride semiconductor layer formed on the first nitride semiconductor layer and having a wider bandgap than the first nitride semiconductor layer;

an anode electrode and a cathode electrode which are formed at an interval therebetween on the semiconductor layer stack; and

a block layer formed in a region between the anode electrode and the cathode electrode so as to contact the second nitride semiconductor layer, wherein:

a channel is formed at an interface between the first nitride semiconductor and the second nitride semiconductor,

the anode electrode forms a Schottky contact with the channel,

the cathode electrode forms an ohmic contact with the channel,

a part of the anode electrode is formed on the block layer so as not to contact an upper surface of the second nitride semiconductor layer, and

a potential barrier height between the anode electrode and the block layer is greater than a potential barrier height between the anode electrode and the second nitride semiconductor layer.

2. The Schottky diode of claim 1 , wherein

the semiconductor layer stack includes multiple first nitride semiconductor layers and multiple second nitride semiconductor layers, and

the first nitride semiconductor layers and the second nitride semiconductor layers are alternately stacked.

3. The Schottky diode of claim 1 , wherein

the semiconductor layer stack has a stepped portion formed by removing a part of the second nitride semiconductor layer so as to expose the first nitride semiconductor layer, and

the anode electrode is formed so as to cover the stepped portion and to contact the block layer.

4. The Schottky diode of claim 1 , wherein

the block layer is comprised of an insulating material.

5. The Schottky diode of claim 1 , wherein

the block layer is comprised of a semiconductor.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 4, 2025
From: INFINEON TECHNOLOGIES AUSTRIA AG
To: PANASONIC HOLDINGS CORPORATION
Reel/Frame 072853/0508 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2024
From: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
To: PANASONIC HOLDINGS CORPORATION
Reel/Frame 069503/0625 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ERRONEOUSLY FILED APPLICATION NUMBERS 13/384239, 13/498734, 14/116681 AND 14/301144 PREVIOUSLY RECORDED ON REEL 034194 FRAME 0143. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Dec 24, 2020
From: PANASONIC CORPORATION
To: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Reel/Frame 056788/0362 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 10, 2014
From: PANASONIC CORPORATION
To: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Reel/Frame 034194/0143 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 12, 2014
From: SHIBATA, DAISUKE; ANDA, YOSHIHARU
To: PANASONIC CORPORATION
Reel/Frame 032199/0314 →