IP Library Granted Patent US 9,231,209
Granted Patent B2
US 9,231,209 · App. 14/081,409 · Granted Jan 5, 2016

Nanocomposite material, tunable resistor device, and method

Inventors: Jeremy West Mares (Nashville, TN); Sharon M. Weiss (Franklin, TN)
Assignee: Vanderbilt University
H01L45/1683H01L45/08H01L45/1226H01L45/1253H01L45/1266H01L45/14H01L45/146H01L45/1608Y10S977/779
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Quick Facts
Patent No.
US 9,231,209
App. No.
14/081,409
Granted
Jan 5, 2016
Kind
B2
Abstract

Various embodiments of a composite material are provided. In one embodiment of the present invention a nanometer-scale composite material comprises, by volume, from about 1% to about 99% variable-conductivity material and from about 99% to about 1% conductive material. The composite material exhibits memristive properties when a voltage differential is applied to the nanocomposite. In another embodiment, a variable resistor device includes a first electrode terminal and a second electrode terminal and a nanocomposite in electrical communication with the electrode terminals. The composite material comprises, by volume, from about 1% to about 99% variable-conductivity material and from about 99% to about 1% conductive material. The memristor is tunable as the minimum instantaneous resistance can be altered several orders of magnitude by varying the composition and ratio of the variable-conductivity material and conductive material constituents of the composites.

Claims (46)

1. A composite material comprising:

from about 1% to about 99% variable-conductivity material;

from about 99% to about 1% conductive material;

wherein the conductive material and variable-conductivity material comprise nanometer-scale particles having an average lineal dimension that ranges from about one nanometer to about one micron: and

wherein the composite material exhibits memristive properties when a voltage differential is applied to the composite material.

2. The composite material of claim 1 , Wherein the conductive material is a metal or a semiconductor material.

3. The composite material of claim 1 , wherein the conductive material is a doped semiconductor.

4. The composite material of claim 1 , wherein the variable-conductivity material is a solid ionic conductor material.

5. The composite material of claim 1 , wherein the variable-conductivity material is a metal oxide.

6. The composite material of claim 1 , wherein the composite material comprises, by volume, from about 10% to about 90% variable-conductivity material and from about 90% to about 10% conductive material.

7. The composite material of claim 1 , wherein the volumetric ratio of the variable-conductivity material to the conductive material ranges from about 35% :65% to about 70% :30%.

8. The composite material of claim 1 , wherein the conductive material is selected from the group of: gold, silver, silicon, germanium gallium arsenide, and mixtures thereof.

9. The composite material of claim 1 , wherein the variable conductivity material is a metal oxide selected from the group of nickel oxide, zinc oxide, titanium dioxide hafnium oxide, silicon oxide, vanadium oxide and mixtures thereof.

10. The composite material of claim 1 , wherein the variable-conductivity material is a solid ionic conductor material selected from the group of: silver iodide, copper iodide, lanthanum fluoride, silver fluoride, and combinations thereof.

11. The composite material of claim 1 , wherein the composite material comprise, by volume, from about 35% to about 65% silicon and from about 65% to about 35% nickel oxide.

12. The composite material of claim 1 , wherein the variable-conductivity material is nickel-oxide and the conductive material is silicon.

13. The composite material of claim 12 , wherein the volume ratio of nickel-oxide to silicon ranges from about 1% :99% to about 99% :1%.

14. The composite material of claim 12 , wherein the volume ratio of nickel-oxide to silicon ranges from about 35% :65% to about 75% :25%.

15. The composite material of claim 1 , wherein the composite material has a minimum resistance that ranges from about 1 kΩto about 5 GΩwhen a voltage differential that ranges from zero to 10 Volts is applied to the composite material.

16. A variable resistor device comprising:

a composite material comprising a nanometer-scale conductive material and nanometer-scale variable-conductive material;

a first electrode connected to the composite material and a second electrode connected to the composite material; and

wherein the variable resistor device exhibits memristive properties in response to voltage applied across the first electrode and the second electrode.

17. The variable resistor device of claim 16 , wherein the nanometer-scale conductive material and the nanometer-scale variable-conductive material comprise particles having an average diameter that ranges from about one nanometer to about one micron.

18. The variable resistor device of claim 16 , wherein the variable-conductivity material of the composite comprises metal oxide.

19. The variable resistor device of claim 16 , wherein the conductive material of the composite comprises semiconductor material.

20. The composite material of claim 16 , wherein the variable-conductivity material of the composite comprises a solid ionic conductor material.

21. The variable resistor device of claim 16 , wherein the volumetric ratio of the variable-conductivity material to the conductive material ranges from about 1% :99% to about 99% :1%.

22. The variable resistor device of claim 16 , wherein the volumetric ratio of the variable-conductivity material to the conductive material ranges from about 35% :65% to about 75% :25%.

23. The variable resistor device of claim 16 , wherein the conductive material is selected from the group of: gold, silver, silicon, germanium, gallium arsenide, and mixtures thereof.

24. The variable resistor device of claim 18 , wherein the metal oxide material is selected from the group of: nickel oxide, zinc oxide, titanium dioxide, hafnium oxide, silicon oxide, vanadium oxide and mixtures thereof.

25. The variable resistor device of claim 16 , wherein the composite material comprises, by volume, from about 25% to about 75% nickel-oxide and from about 75% to about 25% silicon.

26. The variable resistor device of claim 16 , wherein the composite material is a film structure.

27. The variable resistor device of claim 26 , wherein the conductive material is present in the film as a host material having defined pores, and the variable-conductivity material is present as an intercalating material disposed within the pores.

28. A method for making a composite comprising:

hybridizing a nanometer-scale conductive material with a nanometer-scale variable-conductivity material to form a composite material comprising, by volume, from about 1% to about 99% variable-conductivity material and from about 99% to about 1% conductive material.

29. The method of claim 28 , wherein the ratio, by volume, of variable-conductivity material to conductive material ranges from about 25% :75% to about 75% :25%.

30. The method of claim 28 , wherein hybridizing comprises:

forming the conductive material into a film structure having pores therein; and

fining the pores of the film structure with particles of the variable-conductive material via at least one of the following techniques: sol-gel deposition, thermal deposition, and electron beam deposition.

31. The method of claim 28 , further comprising:

fabricating a first electrode and a second electrode on the composite via photolithography; and

wherein the first electrode and the second electrode comprise a material selected from the group of: gold, silver, platinum, nickel, aluminum and mixtures thereof.

32. The method of claim 28 , wherein:

the conductive material is selected from the group of: gold, silver, silicon, germanium, gallium, arsenide, and mixtures thereof; and

the variable-conductivity material is selected from the group of: nickel oxide, zinc oxide, titanium dioxide, hafnium oxide, silicon oxide, vanadium oxide, silver iodide, copper iodide, lanthanum fluoride, silver fluoride and mixtures thereof.

Assignments (2)
CONFIRMATORY LICENSE Recorded Jan 13, 2015
From: VANDERBILT UNIVERSITY
To: DEFENSE THREAT REDUCTION AGENCY; DEPT. OF DEFENSE; UNITED STATES GOVERNMENT
Reel/Frame 034696/0248 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 31, 2014
From: MARES, JEREMY WEST; WEISS, SHARON M
To: VANDERBILT UNIVERSITY
Reel/Frame 032562/0763 →
Continuity (2)
Provisional Application 61727263 · Nov 16, 2012
Related Publication 20140138601A1 · May 22, 2014