IP Library Granted Patent US 9,437,776
Granted Patent B2
US 9,437,776 · App. 14/085,581 · Granted Sep 6, 2016

Method for manufacturing light emitting diodes with smooth surface for reflective electrode

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Quick Facts
Patent No.
US 9,437,776
App. No.
14/085,581
Granted
Sep 6, 2016
Kind
B2
Abstract

A light emitting diode comprising an epitaxial layer structure, a first electrode, and a second electrode. The first and second electrodes are separately disposed on the epitaxial layer structure, and the epitaxial layer structure has a root-means-square (RMS) roughness less than about 3 at a surface whereon the first electrode is formed.

Claims (31)

1. A method for manufacturing a light emitting diode, comprising:

forming an epitaxial layer structure, comprising a first epitaxial layer and a second epitaxial layer; and

depositing a first electrode on the first epitaxial layer of the epitaxial layer structure;

depositing a transparent ohmic contact layer on the second epitaxial layer of the epitaxial structure; and

depositing a second electrode on the transparent ohmic contact layer, wherein the transparent ohmic contact layer has a root-means-square (RMS) roughness less than about 3 nm at a surface whereon the second electrode is deposited.

2. The method of claim 1 , wherein the second electrode is formed by depositing metals including at least one selected from a group consisting of Ag, Pt, Ni, Cr, Ti, Al, Pd, W, Ru, Rh, Mo, and their alloys.

3. The method of claim 1 , wherein the first epitaxial layer is an n-type epitaxial layer and the second epitaxial layer is a p-type epitaxial layer.

4. The method of claim 3 , wherein the first electrode is an n-type electrode and wherein the second electrode is a p-type electrode.

5. The method of claim 3 , further comprising forming an active layer between the n-type epitaxial layer and the p-type epitaxial layer.

6. The method of claim 1 , wherein the second epitaxial layer is formed at a temperature no less than 950° C. at a growth rate no more than 150 Å/min.

7. The method of claim 1 , wherein the first and second electrodes are deposited on opposite sides of the epitaxial layer structure.

8. A method for manufacturing a light emitting diode, comprising:

forming an epitaxial layer structure, comprising a first epitaxial layer and a second epitaxial layer; and

depositing a first electrode on the first epitaxial layer of the epitaxial layer structure;

depositing a transparent ohmic contact layer on the second epitaxial layer of the epitaxial structure; and

depositing a second electrode on the transparent ohmic layer, wherein:

the transparent ohmic contact layer has a root-means-square (RMS) roughness less than about 3 nm at a surface whereon the second electrode is deposited, and

the light emitting diode is a vertical light emitting diode device.

9. The method of claim 7 , wherein the second electrode is mounted on a sub-mount substrate.

10. The method of claim 9 , wherein the substrate is selected from a group consisting of a metal, a semiconductor material, and a ceramic.

11. A method for manufacturing a light emitting diode, comprising:

forming an epitaxial layer structure, comprising a first epitaxial layer and a second epitaxial layer;

depositing a first electrode on the first epitaxial layer of the epitaxial layer structure;

depositing a transparent ohmic contact layer on the second epitaxial layer of the epitaxial layer structure; and

depositing a second electrode on the transparent ohmic contact layer, wherein:

the transparent ohmic contact layer has a root-means-square (RMS) roughness less than about 3 nm at a surface whereon the second electrode is deposited,

the second electrode is mounted on a sub-mount substrate, and

the substrate is selected from a group consisting of Cu, Mo, W, Al, Si, GaAs, GaP, InP, Ge, Al 2 O 3 and AlN.

12. The method of claim 1 , wherein the epitaxial layer structure is formed on a substrate, and the first and second electrodes are deposited on a same side of the substrate.

13. The method of claim 1 , wherein the second epitaxial layer is formed by MOCVD (Metal-Organic Chemical Vapor Deposition).

14. The method of claim 13 , wherein the second epitaxial layer is formed at a temperature no less than 950° C. at a growth rate no more than 150 Å/min.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 30, 2018
From: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 046986/0159 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 25, 2018
From: TOSHIBA CORPORATION
To: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 046450/0700 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 20, 2016
From: MANUTIUS IP, INC.
To: TOSHIBA CORPORATION
Reel/Frame 038334/0444 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2014
From: TOSHIBA TECHNO CENTER INC.
To: MANUTIUS IP, INC.
Reel/Frame 033787/0733 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 23, 2014
From: LIN, CHAO-KUN; LIU, HENG
To: BRIDGELUX, INC.
Reel/Frame 033376/0831 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 23, 2014
From: BRIDGELUX, INC.
To: TOSHIBA TECHNO CENTER INC.
Reel/Frame 033376/0857 →