Determination Of Electromigration Features
For one or more geometric elements partitioned into a plurality of geometric element portions, the expected current directions through each geometric element portion are determined. Using the expected current directions, each expected current path through the geometric element portions is determined. Based upon the expected current paths, and the physical characteristics represented by the geometric element portions in those expected current paths, the electromigration features corresponding to the geometric element or elements are determined. For example, the length of the longest expected current path through the geometric element or elements can be identified based upon the lengths of the geometric element portions and the directions of their currents, and this length can then be compared with the Blech length for the geometric element or elements.
1 . A method of determining electromigration features corresponding to one or more geometric elements in layout design data, comprising:
for one or more geometric elements partitioned into portions, employing a computer to determine expected current directions through the geometric element portions;
based upon the determined current directions, employing a computer to identify an expected current path through the geometric element portions; and
employing a computer to determine electromigration features corresponding to the one or more geometric elements based upon at least one physical characteristic represented by the geometric element portions in the expected current path.
2 . The method recited in claim 1 , wherein the at least one physical characteristic is selected from the group consisting of: portion width, portion length, and represented material.
3 . The method recited in claim 2 , wherein
the at least one physical characteristic includes portion length, and
the electromigration features corresponding to the one or more geometric elements is the Bletch length.