IP Library › Granted Patent US 9,052,449
Granted Patent B2
US 9,052,449 · App. 14/088,422 · Granted Jun 9, 2015

Light emitting device, manufacturing method thereof, and optical transceiver

Inventors: Misuzu Sagawa (Tokyo, JP); Katsuya Oda (Tokyo, JP); Kazuki Tani (Tokyo, JP)
Assignee: Hitachi, Ltd.
G02B6/1223G02B6/131H01S5/021H01S5/026H01S5/1014H01S5/1032H01S5/141
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Quick Facts
Patent No.
US 9,052,449
App. No.
14/088,422
Granted
Jun 9, 2015
Kind
B2
Abstract

The light emitting device includes an active layer formed on a semiconductor substrate for emitting light, a semiconductor layer of a first conductivity type electrically connected to one end of the active layer, a semiconductor layer of a second conductivity type electrically connected to the other end of the active layer, first and second electrodes, a feedback mechanism for laser oscillation, and a waveguide for guiding the light emitted from the active layer, in which the active layer is made of a semiconductor having an affinity with a silicon CMOS process, and the semiconductor layer of the first conductivity type and the semiconductor layer of the second conductivity type, and the waveguide are each made of silicon as a part of the semiconductor substrate.

Claims (21)

1. A light emitting device, comprising:

an active layer, formed on a semiconductor substrate, for emitting light, the active layer including:

a central region, and

a mode conversion region that tapers, in thickness and width, along the optical axis;

a semiconductor layer of a first conductivity type electrically connected to one end of the active layer;

a semiconductor layer of a second conductivity type electrically connected to the other end of the active layer;

first and second electrodes;

a feedback mechanism for laser oscillation; and

a waveguide for guiding the light emitted from the active layer,

wherein the active layer is made of a semiconductor having an affinity with a silicon CMOS process,

wherein the semiconductor layer of the first conductivity type, the semiconductor layer of the conductivity type, and the waveguide are each made of silicon as a part of the semiconductor substrate, and

wherein the mode conversion region couples the emitted light to the waveguide to minimize optical loss.

2. The light emitting device according to claim 1 , wherein the waveguide is adjacent to the active layer in such a manner as to be optically coupled to the active layer.

3. The light emitting device according to claim 1 , wherein the semiconductor substrate is a substrate made of silicon, a silicon dioxide, and silicon.

4. The light emitting device according to claim 3 , wherein silicon has the largest refractive index among the materials composing the waveguide.

5. The light emitting device according to claim 2 , wherein the mode conversion region of the active layer becomes thinner in film thickness as approaching the waveguide along the optical axis.

6. The light emitting device according to claim 2 , wherein the mode conversion region of the active layer becomes narrower as approaching the waveguide along the optical axis.

7. The light emitting device according to claim 5 , wherein an interface between the active layer and the semiconductor substrate and an interface on a side opposite to the active layer and the semiconductor substrate are approximately parallel to each other.

8. The light emitting device according to claim 1 , wherein the active layer is composed of either germanium or silicon/germanium.

9. The light emitting device according to claim 1 , wherein the mode conversion region tapers to a point proximate to the waveguide.

10. The light emitting device according to claim 1 , wherein the feedback mechanism includes Bragg reflectors.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 25, 2013
From: SAGAWA, MISUZU; ODA, KATSUYA; TANI, KAZUKI
To: HITACHI, LTD.
Reel/Frame 031666/0703 →
Priority Claims (1)
JP 2013-034078 · Feb 25, 2013 · national
Continuity (1)
Related Publication 20140241734A1 · Aug 28, 2014