IP Library Granted Patent US 9,472,723
Granted Patent B2
US 9,472,723 · App. 14/091,355 · Granted Oct 18, 2016

Deposition of semiconductor nanocrystals for light emitting devices

Inventors: Vladimir Bulovic (Lexington, MA); Katherine Wei Song (Cambridge, MA); Ronny Costi (Ashdod, MA)
Assignee: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
H01L33/36H01L21/02057H01L27/286H01L33/005H01L33/06H01L51/4233H01L51/502H01L33/0087Y02E10/549
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Quick Facts
Patent No.
US 9,472,723
App. No.
14/091,355
Granted
Oct 18, 2016
Kind
B2
Abstract

A method of depositing semiconductor nanocrystals on a surface can include applying a voltage to the nanocrystals.

Claims (17)

1. A method for depositing a film of semiconductor nanocrystals comprising:

applying a voltage between two electrodes in a solution that includes a plurality of semiconductor nanocrystals, wherein the voltage creates an electric field that drives the plurality of semiconductor nanocrystals to be deposited onto a surface of the two electrodes to form a semiconductor nanocrystal film, and wherein a thickness of the semiconductor nanocrystal film is less than 100 nm,

washing a surface of the two electrodes with a solvent while applying a voltage bias.

2. The method of claim 1 , wherein the plurality of semiconductor nanocrystals are colloidal semiconductor nanocrystals.

3. The method of claim 1 , wherein the plurality of semiconductor nanocrystals include a Group II-VI compound, a Group II-V compound, a Group III-VI compound, a Group III-V compound, a Group IV-VI compound, a Group I-III-VI compound, a Group II-IV-VI compound, or a Group II-IV-V compound.

4. The method of claim 1 , wherein the plurality of semiconductor nanocrystals include CdSe and ZnS.

5. The method of claim 1 , wherein a quantum yield of the plurality of semiconductor nanocrystals is at least 10%.

6. The method of claim 1 , wherein a quantum yield of the plurality of semiconductor nanocrystals is at least 50%.

7. The method of claim 1 , wherein a quantum yield of the plurality of semiconductor nanocrystals is at least 80%.

8. The method of claim 1 , wherein the semiconductor nanocrystal film includes a monolayer formed from the plurality of semiconductor nanocrystals.

9. The method of claim 1 , wherein the thickness of the semiconductor nanocrystal film is less than 50 nm.

10. The method of claim 1 , wherein the thickness of the semiconductor nanocrystal film is less than 10 nm.

11. The method of claim 1 , wherein the solution includes a compound capable of removing passivating ligands surrounding the plurality of the semiconductor nanocrystals.

12. The method of claim 11 , wherein the compound includes acetonitrile.

13. The method of claim 1 , wherein the solvent includes chloroform.

14. The method of claim 1 , wherein the electric field is between 25 V cm −1 and 50 V cm −1 .

15. The method of claim 1 , wherein the semiconductor nanocrystal film has a root mean square roughness of less than 5 nm.

Assignments (3)
CONFIRMATORY LICENSE Recorded Apr 10, 2018
From: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
To: UNITED STATES DEPARTMENT OF ENERGY
Reel/Frame 045913/0339 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 24, 2015
From: BULOVIC, VLADIMIR; SONG, KATHERINE WEI; COSTI, RONNY
To: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
Reel/Frame 036169/0248 →
CONFIRMATORY LICENSE Recorded Jun 6, 2014
From: MASACHUSETTS INSTITUTE OF TECHNOLOGY
To: ENERGY, UNITED STATES DEPARTMENT OF
Reel/Frame 033161/0858 →
Continuity (2)
Provisional Application 61730236 · Nov 27, 2012
Related Publication 20140147951A1 · May 29, 2014