INTEGRATED CIRCUIT DEVICE AND METHOD FOR SELF-HEATING AN INTEGRATED CIRCUIT DEVICE
An integrated circuit device comprises a first clock signal source, arranged to provide at least one first clock signal; a second clock signal source, arranged to provide at least one second clock signal different from the at least one first clock signal; and a plurality of sequential logic cells, at least one of the plurality connected to receive, in a first mode, the at least one first clock signal or at least one clock signal derived from the at least one first clock signal, and to receive, in a second mode, the at least one second clock signal or at least one clock signal derived from the at least one second clock signal; wherein in the second mode the at least one second clock signal is adapted to the at least one of the plurality of sequential logic cells to generate in at least a portion of the integrated circuit device a current consumption when the at least one first clock signal is not a toggling signal.
1 . An integrated circuit device, comprising
a first clock signal source, arranged to provide at least one first clock signal;
a second clock signal source, arranged to provide at least one second clock signal; and
a plurality of sequential logic cells, at least one of said plurality connected to receive, in a first mode, said at least one first clock signal or at least one clock signal derived from said at least one first clock signal, and to receive, in a second mode, said at least one second clock signal or at least one clock signal derived from said at least one second clock signal; wherein in said second mode said at least one second clock signal is adapted to said at least one of said plurality of sequential logic cells to generate in at least a portion of said integrated circuit device a current consumption when said at least one first clock signal is not a toggling signal.
2 . The integrated circuit device as claimed in claim 1 , wherein said portion of said integrated circuit device comprises said at least one of said plurality of sequential logic cells.
3 . The integrated circuit device as claimed in claim 1 , comprising a clock distribution network having at least one input terminal connected to said first and second clock signal sources, and at least one output terminal connected to said plurality of sequential logic cells; said clock distribution network being arranged to receive said at least one first clock signal in said first mode and said at least one second clock signal in said second mode and to provide said at least one first clock signal or said at least one clock signal derived from said at least one first clock signal in said first mode, and to provide said at least one second clock signal or said at least one clock signal derived from said at least one second clock signal in said second mode.
4 . The integrated circuit device as claimed in claim 3 , wherein said portion of said integrated circuit device comprises at least a part of said clock distribution network.
5 . The integrated circuit device as claimed in claim 1 , wherein said at least one of said plurality of sequential logic cells comprises a reset-input arranged to receive a reset signal; and wherein said reset signal is enabled when said integrated circuit device is in said second mode.
6 . The integrated circuit device as claimed in claim 1 , wherein a clock rate of at least one second clock signal is higher than a clock rate of said at least one first clock signal.
7 . The integrated circuit device as claimed in claim 1 , wherein said second clock source comprises a first ring oscillator circuit.
8 . The integrated circuit device as claimed in claim 1 , wherein said at least one second clock signal is a steady-state signal.
9 . The integrated circuit device as claimed in claim 1 , comprising
a temperature sensing unit arranged to provide a temperature measurement of said integrated circuit device; and
a mode controller unit arranged to switch said integrated circuit device from said second mode into said first mode when a value of said temperature measurement is above a threshold value corresponding to a minimum normal operation temperature.
10 . The integrated circuit device as claimed in claim 9 , wherein said minimum normal operation temperature is defined to at least partly compensate for a switching delay caused by a temperature inversion effect encountered at one or more field-effect transistor circuits comprised in said plurality of sequential logic cells.
11 . The integrated circuit device as claimed in claim 9 , wherein said mode controller unit is arranged to switch said integrated circuit device from said first mode into said second mode when a value of said temperature measurement is below said threshold value.
12 . The integrated circuit device as claimed in claim 9 , wherein said temperature sensing unit comprises a second ring oscillator circuit.
13 . A method for self-heating an integrated circuit device, comprising
providing at least one first clock signal, by a first clock signal source;
providing at least one second clock signal, by a second clock signal source;
receiving, in a first mode, said at least one first clock signal or at least one clock signal derived from said at least one first clock signal, by at least one of a plurality of sequential logic cells; and
receiving, in a second mode, said at least one second clock signal or at least one clock signal derived from said at least one second clock signal, by said at least one of said plurality of sequential logic cells; wherein in said second mode said at least one second clock signal is adapted to said at least one of said plurality of sequential logic cells to generate in at least a portion of said integrated circuit device a current consumption when said at least one first clock signal is not a toggling signal.
14 . The method as claimed in claim 13 , comprising
providing a temperature measurement of said integrated circuit device; and
switching said integrated circuit device from said second mode into said first mode when a value of said temperature measurement is above a threshold value corresponding to a minimum normal operation temperature.