Particle accelerator and method of reducing beam divergence in the particle accelerator

1. A cyclotron comprising an intermediate electrode disposed between a source of charged particles and a second electrode of the cyclotron, each of said source, said intermediate electrode and said second electrode being internal to the cyclotron, the charged particles being exposed to a first electric field extending between said source and said intermediate electrode prior to being exposed to a second electric field extending between said intermediate electrode and said second electrode, said second electrode having a time-varying voltage applied thereto such that said second electric field is time-varying, the magnitude of said first electric field being less than a peak magnitude of said second electric field.

2. The cyclotron of claim 1 wherein said intermediate electrode has a time-varying voltage applied thereto such that the magnitude of said first electric field is time-varying.

3. The cyclotron of claim 1 wherein said intermediate electrode has a DC voltage applied thereto such that the magnitude of said first electric field is substantially non-varying in time.

4. The cyclotron of claim 1 wherein said intermediate electrode defines an intermediate aperture for permitting the charged particles to pass through said intermediate electrode.

5. The cyclotron of claim 1 wherein the magnitude of said first electric field is less than or equal to a minimum magnitude of said second electric field occurring during a phase acceptance time period associated with a phase acceptance of the cyclotron.

6. The cyclotron of claim 5 wherein said phase acceptance is in a range of 20 to 50 degrees.

7. The cyclotron of claim 5 wherein said intermediate electrode has a voltage applied thereto such that the waveform of the magnitude of said second electric field during said phase acceptance time period and the waveform of the magnitude of said first electric field during a corresponding time period offset from said phase acceptance time period have substantially equal waveform shapes.

8. A method of reducing divergence of a beam of charged particles in a cyclotron, the method comprising passing the charged particles through a first electric field from a source of the charged particles toward an intermediate electrode and then passing the charged particles through a second electric field from said intermediate electrode toward a second electrode when said source, said intermediate electrode and said second electrode are internal to the cyclotron, when a time-varying voltage is being applied to said second electrode such that said second electric field is time-varying, and when the magnitude of said first electric field is less than a peak magnitude of said second electric field.

9. The method of claim 8 wherein passing the charged particles through a first electric field from a source of the charged particles toward an intermediate electrode and then passing the charged particles through a second electric field from said intermediate electrode toward a second electrode comprises passing the charged particles through said first electric field and then through said second electric field when said intermediate electrode has a time-varying voltage applied thereto such that the magnitude of said first electric field is time-varying.

10. The method of claim 8 wherein passing the charged particles through a first electric field from a source of the charged particles toward an intermediate electrode and then passing the charged particles through a second electric field from said intermediate electrode toward a second electrode comprises passing the charged particles through said first electric field and then through said second electric field when said intermediate electrode has a DC voltage applied thereto such that the magnitude of said first electric field is substantially non-varying in time.

11. The method of claim 8 wherein passing the charged particles through a first electric field from a source of the charged particles toward an intermediate electrode and then passing the charged particles through a second electric field from said intermediate electrode toward a second electrode comprises passing the charged particles through said first electric field and then through said second electric field when said intermediate electrode defines an intermediate aperture for permitting the charged particles to pass through said intermediate electrode.

12. The method of claim 8 wherein passing the charged particles through a first electric field from a source of the charged particles toward an intermediate electrode and then passing the charged particles through a second electric field from said intermediate electrode toward a second electrode comprises passing the charged particles through said first electric field and then through said second electric field when the magnitude of said first electric field is less than or equal to a minimum magnitude of said second electric field occurring during a phase acceptance time period associated with a phase acceptance of the cyclotron.

13. The method of claim 12 wherein passing the charged particles through said first electric field and then through said second electric field when the magnitude of said first electric field is less than or equal to a minimum magnitude of said second electric field occurring during a phase acceptance time period associated with a phase acceptance of the cyclotron comprises passing the charged particles through said first electric field and then through said second electric field when said phase acceptance is in a range of 20 to 50 degrees.

14. The method of claim 12 wherein passing the charged particles through said first electric field and then through said second electric field when the magnitude of said first electric field is less than or equal to a minimum magnitude of said second electric field occurring during a phase acceptance time period associated with a phase acceptance of the cyclotron comprises passing the charged particles through said first electric field and then through said second electric field when said intermediate electrode has a voltage applied thereto such that the waveform of the magnitude of said second electric field during said phase acceptance time period and the waveform of the magnitude of said first electric field during a corresponding time period offset from said phase acceptance time period have substantially equal waveform shapes.

15. A cyclotron comprising:

(a) first electric field means for passing charged particles through a first electric field from a source of the charged particles toward an intermediate electrode when said source and said intermediate electrode are internal to the cyclotron;

(b) second electric field means for passing the charged particles through a second electric field from said intermediate electrode toward a second electrode when said second electrode is internal to the cyclotron;

(c) time-varying field means for applying a time-varying voltage to said second electrode such that said second electric field is time-varying; and

(d) beam focusing means for causing the magnitude of said first electric field to be less than a peak magnitude of said second electric field.

16. The cyclotron of claim 15 wherein said first electric field means causes said first electric field to be time-varying.

17. The cyclotron of claim 15 wherein said beam focusing means causes the magnitude of said first electric field to be less than or equal to a minimum magnitude of said second electric field occurring during a phase acceptance time period associated with a phase acceptance of the cyclotron.

18. The cyclotron of claim 17 further comprising waveform shaping means for applying a voltage to said intermediate electrode such that the waveform of the magnitude of said second electric field during said phase acceptance time period and the waveform of the magnitude of said first electric field during a corresponding time period offset from said phase acceptance time period have substantially equal waveform shapes.

19. A kit for reducing divergence of a beam of charged particles in a cyclotron, the kit comprising an intermediate electrode dimensioned for installation within the cyclotron between a source of the charged particles and a second electrode of the cyclotron, said source and said second electrode being internal to the cyclotron, and instructions for exposing the charged particles to a first electric field extending between said source and said intermediate electrode prior to exposing the charged particles to a second electric field extending between said intermediate electrode and said second electrode, said second electrode having a time-varying voltage applied thereto such that said second electric field is time-varying, the magnitude of said first electric field being less than a peak magnitude of said second electric field.

20. The kit of claim 19 wherein said intermediate electrode defines an intermediate aperture for permitting the charged particles to pass through said intermediate electrode.

21. The cyclotron of claim 1 wherein said intermediate electrode is formed of a planar sheet aligned transversely to a direction of travel of the charged particles.

22. The method of claim 8 wherein passing the charged particles through a first electric field from a source of the charged particles toward an intermediate electrode and then passing the charged particles through a second electric field from said intermediate electrode toward a second electrode comprises passing the charged particles through said first electric field and then through said second electric field when said intermediate electrode is formed of a planar sheet aligned transversely to a direction of travel of the charged particles.

23. The cyclotron of claim 15 wherein said intermediate electrode is formed of a planar sheet aligned transversely to a direction of travel of the charged particles.

24. The kit of claim 19 wherein said intermediate electrode is formed of a planar sheet dimensioned for being installed in transverse alignment to a direction of travel of the charged particles.