Surface charge measurement
The invention relates to methods and apparatus for determining properties of a surface. Embodiments disclosed include an apparatus for measuring a surface charge of a sample, comprising: a sample holder having an opposed pair of electrodes and configured to hold a sample in position in a measurement volume between the electrodes such that a planar surface of the sample is aligned orthogonal to the electrode surfaces; a measurement chamber for containing a measurement liquid and having an open end configured to receive the sample holder to position the electrodes in a preset orientation; a laser light source positioned and configured to direct a laser beam through the measurement chamber between the electrodes and parallel to the planar surface of the sample when the sample holder is received in the measurement chamber; and a detector positioned and configured to detect scattered light from the measurement volume, wherein the apparatus is configured to allow for detection of the scattered light by the detector over a range of distances from the surface of the sample.
1. A zeta potential measurement accessory, comprising:
a static section including a first support surface for supporting the static section with respect to an upward-facing cuvette,
a sample support surface for holding a sample, which sample support surface is positioned inside the cuvette facing downward when the static section is supported with respect to the upward-facing cuvette by the first support surface,
a pair of electrodes facing each other below the sample support surface when the static section is supported with respect to the upward-facing cuvette by the first support surface, wherein the sample support surface is located between the electrodes, and
an adjustment mechanism operatively connected between the static section and the sample support surface and operative to move the sample support surface vertically with respect to the static section when the static section is supported with respect to the upward-facing cuvette by the first support surface.
2. The accessory of claim 1 wherein the static section includes a second support surface for supporting the static section at a different height from the height at which the static section is supported by the first support surface.
3. The accessory of claim 1 wherein the adjustment mechanism is motorized.
4. The accessory of claim 1 wherein the adjustment mechanism is manual.
5. The accessory of claim 4 wherein the adjustment mechanism includes a micrometer.
6. The accessory of claim 1 wherein the first support surface is constructed to be supported by an upper surface of the cuvette.
7. The accessory of claim 1 further including an adjustment jig including a contact surface for contacting at least the first support surface of the static section and a contact surface for contacting a sample on the sample support surface.
8. The accessory of claim 1 further including tracer particles for performing measurements with the accessory.
9. The accessory of claim 1 further including an electrical interface for connection to a zeta potential measuring instrument.