Method of making a system-in-package device
View Patent ↗A method of making a system-in-package device, and a system-in-package device is disclosed. In the method, at least one first species die with predetermined dimensions, at least one second species die with predetermined dimensions, and at least one further component of the system-in-device is included in the system-in package device. At least one of the first and second species dies is selected for redimensioning, and material is added to at least one side of the selected die such that the added material and the selected die form a redimensioned die structure. A connecting layer is formed on the redimensioned die structure. The redimensioned die structure is dimensioned to allow mounting of the non-selected die and the at least one further component into contact with the redimensioned die structure via the connecting layer.
1. A method of making a system-in-package device, the method comprising
including in the system-in package device at least one first species die with predetermined dimensions, at least one second species die with predetermined dimensions, and at least one further component of the system-in-device;
selecting at least one of the first and second species dies for redimensioning;
adding material to at least one side of the selected die(s) such that the added material and the selected die(s) form a redimensioned die structure;
forming a connecting layer on the redimensioned die structure;
dimensioning the redimensioned die structure to allow mounting of the non-selected die and the at least one further component into contact with the redimensioned die structure via the connecting layer; and
thinning the added material of the redimensioned die structure by removing a portion of the added material.
2. The method according to claim 1 , wherein the method further comprises:
manufacturing on to a native first wafer a first plurality of first species dies with a first allotment of the first species dies on said native first wafer, the predetermined dimensions of the one first species die being determined by the first allotment;
manufacturing on to a native second wafer a second plurality of second species dies with a second allotment of the second species dies on said native second wafer, the predetermined dimensions of the one second species die being determined by the second allotment.
3. The method according to claim 1 , wherein the at least one further component of the system-in-device is a connection member for input and output operations of the system-in-package device.
4. The method according to claim 1 , wherein the method comprises including two or more dies into the redimensioned die structure.
5. The method according to claim 1 , wherein the method comprises mounting two or more dies into contact with the redimensioned die structure via the connecting layer.
6. The method according to claim 1 , wherein the method comprises including in the redimensioned die structure of the system-in package device a die that includes a passage for fluids.
7. The method according to claim 1 , wherein the method comprises including in the redimensioned die structure of the system-in package device a die that includes at least one of the following elements: an optical element, a motion sensor, a pressure sensor a timing device, a filter device, an accelerometer, a magnetometer, a micro pump, and a microphone.
8. The method according to claim 3 , wherein the method comprises connecting the connection member to the connecting layer by means of a through-encapsulant via extending through the redimensioned die structure.
9. The method according to claim 1 , wherein the first species die or the second species die comprises at least one of the following elements: a MEMS device, an integrated semiconductor circuit, an ASIC circuit, oscillator, an optical device, an opto-electrical device, a magnetic device, a transducer, a sensor, a filter, switching board, wiring board, magnetostrictive element, electrostrictive element, piezoelectric device.