IP Library Granted Patent US 9,287,351
Granted Patent B2
US 9,287,351 · App. 14/130,217 · Granted Mar 15, 2016

Composite substrate and method for manufacturing same

Inventors: Masanobu Kitada (Omihachiman, JP); Tomofumi Honjo (Higashiomi, JP)
Assignee: Kyocera Corporation
H01L29/02H01L21/76256H01L21/76262H01L21/86H01L21/02263H01L21/02304H01L21/2007
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,287,351
App. No.
14/130,217
Granted
Mar 15, 2016
Kind
B2
Abstract

[Problem] To provide a composite substrate which includes a silicon substrate having few lattice defects. [Solution] A composite substrate ( 50 ) that comprises a first substrate ( 10 ), which is constituted of a semiconductor material, a second substrate ( 40 ), which is constituted of an insulating material, and an oxide layer ( 30 ) and a semiconducting epitaxial layer ( 20 ) which have been disposed between the substrates ( 10 ) and ( 40 ) in this order from the second substrate ( 40 ) side, the oxide layer ( 30 ) having oxygen atoms arranged on the side thereof which faces the epitaxial layer ( 20 ).

Claims (13)

1. A method for manufacturing a composite substrate, the method comprising:

preparing a first substrate comprising a semiconductor material and a second substrate comprising an insulating material;

forming an epitaxial layer having semiconductor characteristics on the first substrate;

forming an oxide layer on the epitaxial layer by an Atomic Layer Deposition method; and

bonding the second substrate to the oxide layer to obtain a composite substrate.

2. The method for manufacturing a composite substrate according to claim 1 , wherein forming the oxide layer comprises:

supplying oxide atoms and metal atoms alternately and repeatedly; and

stopping the forming oxide layer after metal atoms are supplied.

3. The method for manufacturing a composite substrate according to claim 1 , wherein

the semiconductor material comprises silicon,

the insulating material comprises sapphire,

the epitaxial layer comprises silicon, and

the oxide layer comprises aluminum oxide.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 30, 2013
From: KITADA, MASANOBU; HONJO, TOMOFUMI
To: KYOCERA CORPORATION
Reel/Frame 031859/0511 →
Priority Claims (1)
JP 2011-145608 · Jun 30, 2011 · national
Continuity (1)
Related Publication 20140167230A1 · Jun 19, 2014