IP Library › Granted Patent US 9,632,411
Granted Patent B2
US 9,632,411 · App. 14/139,457 · Granted Apr 25, 2017

Vapor deposition deposited photoresist, and manufacturing and lithography systems therefor

Inventors: Timothy Michaelson (Milpitas, CA); Timothy W. Weidman (Sunnyvale, CA); Barry Lee Chin (Saratoga, CA); Majeed Foad (Sunnyvale, CA); Paul Deaton (San Jose, CA)
Assignee: Applied Materials, Inc.
G03F7/167G03F7/09G03F7/2037
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Quick Facts
Patent No.
US 9,632,411
App. No.
14/139,457
Granted
Apr 25, 2017
Kind
B2
Abstract

A photoresist vapor deposition system includes: a vacuum chamber having a heating element and cooled chuck for holding a substrate, the vacuum chamber having a heated inlet; and a vapor deposition system connected to the heated inlet for volatilizing a precursor into the vacuum chamber for condensing a photoresist over the substrate cooled by the cooled chuck. The deposition system creates a semiconductor wafer system that includes: a semiconductor wafer; and a vapor deposited photoresist over the semiconductor wafer. An extreme ultraviolet lithography system requiring the semiconductor wafer system includes: an extreme ultraviolet light source; a mirror for directing light from the extreme ultraviolet light source; a reticle stage for imaging the light from the extreme ultraviolet light source; and a wafer stage for placing a semiconductor wafer with a vapor deposited photoresist.

Claims (11)

1. A photoresist deposition system comprising:

a vacuum chamber having a heating element and cooled chuck to hold a substrate,

the vacuum chamber having a heated inlet; and

a vapor deposition system connected to the heated inlet to volatilize a precursor into the vacuum chamber and to condense a vapor deposited photoresist over the substrate cooled by the cooled chuck.

2. The system as claimed in claim 1 wherein the vapor deposition system varies deposition composition and conditions during vapor deposition.

3. The system as claimed in claim 1 wherein the vapor deposition system provides the precursor of a volatile metal oxide for depositing the vapor deposited photoresist.

4. The system as claimed in claim 1 wherein the vapor deposition system provides the precursor of a metal alkoxide for depositing the vapor deposited photoresist.

5. The system as claimed in claim 1 wherein the vacuum chamber is for reacting the precursor with an oxidizing agent to convert a metal oxide precursor into a metal oxide photoresist.

6. The system as claimed in claim 1 wherein the vacuum chamber is for driving a gas phase reaction resulting in a molecular deposition over the substrate.

7. The system as claimed in claim 1 wherein the vapor deposition system is for reacting a ligand precursor that initiates a ligand replacement reaction around a metal center.

8. The system as claimed in claim 1 wherein the vapor deposition system is for providing a ligand precursor for bonding with a metal oxide formed in the vacuum chamber.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 26, 2013
From: MICHAELSON, TIMOTHY; WEIDMAN, TIMOTHY W.; CHIN, BARRY LEE; FOAD, MAJEED; DEATON, PAUL
To: APPLIED MATERIALS, INC.
Reel/Frame 031850/0869 →
Continuity (2)
Provisional Application 61786042 · Mar 14, 2013
Related Publication 20140268082A1 · Sep 18, 2014