Systems and methods for detecting abnormalities within a circuit of an electrosurgical generator
An electrosurgical generator includes primary and test sources. The primary source supplies a primary signal and the test source supplies a test signal. The electrosurgical generator includes an output circuit and an abnormality detection circuit. The output circuit is electrically coupled to the primary and test sources. The output circuit receives the primary and test signals from the primary and test sources, respectively. The output circuit is electrically coupled to a load to supply the primary signal thereto. The abnormality detection circuit is electrically coupled to the output circuit to detect an abnormality therein as a function of the test signal. The abnormality detection circuit can also determine a location of the abnormality within the output circuit.
1. A method for abnormality detection in an electrosurgical generator, which includes an inverter and a circuit having at least a first portion and a second portion, the method comprising:
generating a primary control signal that controls the inverter to generate an electrosurgical signal and a test signal that facilitates determining an abnormality in the circuit;
applying the primary control signal and the test signal to control switching of switches in the inverter;
sensing a first signal at the first portion of the circuit and a second signal at the second portion of the circuit;
detecting an abnormality within the circuit based on the first signal and the second signal; and
determining, after detecting the abnormality, whether the abnormality is located at one of the first portion of the circuit and the second portion of the circuit, based on the first signal and the second signal.
2. The method according to claim 1 , further comprising:
generating an impulse signal defining the test signal;
determining an impulse response of the circuit as a function of at least one of the first signal and the second signal; and
detecting an abnormality within the circuit as a function of the impulse response.
3. The method according to claim 1 , further comprising:
modulating the test signal in accordance with a maximum length sequence algorithm; and
cross-correlating the first signal and the second signal with the test signal.
4. The method according to claim 1 , wherein the abnormality is one of a short within an output circuit, an open circuit within the output circuit, an abnormality of a resistor within the output circuit, an abnormality of a sensor coupled within the output circuit, an abnormality of a coil within the output circuit, a circuit component of the output circuit being different than a predetermined value, the circuit component of the output circuit being different than a calibrated value, or the circuit component of the output circuit being outside of a predetermined range of values.
5. The method according to claim 1 , wherein the test signal is applied during a power-on self-test of the electrosurgical generator.
6. The method according to claim 1 , further comprising modulating the test signal according to at least one of a pseudo-random noise algorithm, a chirp algorithm, or a swept sine impetus algorithm.
7. The method according to claim 1 , further comprising generating a pseudo-random noise signal defining the test signal such that the test signal is orthogonal to the primary signal.
8. The method according to claim 1 , wherein the test signal is selected from the group consisting of narrowband limited and orthogonal.