IP Library Granted Patent US 9,275,871
Granted Patent B2
US 9,275,871 · App. 14/151,635 · Granted Mar 1, 2016

Nanostructures having low defect density and methods of forming thereof

Inventor: Gurtej S. Sandhu (Boise, ID)
Assignee: Micron Technology, Inc.
H01L21/3081H01L21/3086H01L2924/0002
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Quick Facts
Patent No.
US 9,275,871
App. No.
14/151,635
Granted
Mar 1, 2016
Kind
B2
Abstract

A method of forming nanostructure comprises forming self-assembled nucleic acids on at least a portion of a substrate. The method further comprises contacting the self-assembled nucleic acids on the at least a portion of a substrate with a solution comprising at least one repair enzyme to repair defects in the self-assembled nucleic acids. The method may comprise repeating the repair of defects in the self-assembled nucleic acids on the at least a portion of a substrate until a desired, reduced threshold level of defect density is achieved. A semiconductor structure comprises a pattern of self-assembled nucleic acids defining a template having at least one aperture therethrough. At least one of the apertures has a dimension of less than about 50 nm.

Claims (40)

1. A method of forming a nanostructure, comprising:

forming a pattern of self-assembled nucleic acids on at least a portion of a substrate; and

exposing the pattern of self-assembled nucleic acids on the at least a portion of a substrate to at least one repair enzyme to repair defects in the self-assembled nucleic acids.

2. The method of claim 1 , wherein forming a pattern of self-assembled nucleic acids on at least a portion of a substrate comprises:

forming the self-assembled nucleic acids on the substrate; and

selectively removing portions of the self-assembled nucleic acids to form the pattern of self-assembled nucleic acids on the at least a portion of a substrate.

3. The method of claim 1 , wherein forming a pattern of self-assembled nucleic acids on at least a portion of a substrate comprises contacting at least a portion of the substrate with a solution comprising the self-assembled nucleic acids.

4. The method of claim 3 , further comprising repeating the contacting at least a portion of the substrate with a solution comprising the self-assembled nucleic acids until a desired thickness of the self-assembled nucleic acids is obtained.

5. The method of claim 1 , further comprising transferring the pattern of self-assembled nucleic acids to the at least a portion of the substrate.

6. The method of claim 5 , wherein transferring the pattern of self-assembled nucleic acids to the at least a portion of the substrate comprises forming a corresponding pattern on the substrate, the corresponding pattern on the substrate comprising at least one dimension less than about 50 nm.

7. A method of forming a nanostructure, comprising:

forming self-assembled nucleic acids on at least a portion of a substrate, the self-assembled nucleic acids exhibiting an initial defect density;

contacting the self-assembled nucleic acids on the at least a portion of a substrate with a solution comprising at least one repair enzyme to repair defects in the self-assembled nucleic acids; and

repeating the repair of defects in the self-assembled nucleic acids until a desired, reduced threshold level of defect density is achieved.

8. The method of claim 7 , wherein contacting the self-assembled nucleic acids on the at least a portion of a substrate with a solution comprising at least one repair enzyme comprises:

contacting the self-assembled nucleic acids on the at least a portion of the substrate with a first solution comprising a first repair enzyme; and

contacting the self-assembled nucleic acids on the at least a portion of the substrate with a second solution comprising a second repair enzyme.

9. A method of decreasing a defect density in self-assembled nucleic acids on at least a portion of a substrate, the method comprising:

repairing defects in self-assembled nucleic acids on at least a portion of a substrate by exposure to at least one repair enzyme.

10. The method of claim 9 , wherein repairing defects in self-assembled nucleic acids on at least a portion of a substrate comprises:

exposing the self-assembled nucleic acids on the at least a portion of the substrate to more than one repair enzyme simultaneously.

11. The method of claim 9 , wherein repairing defects in self-assembled nucleic acids on at least a portion of a substrate comprises:

exposing the self-assembled nucleic acids on the at least a portion of the substrate to one repair enzyme and, subsequently, to at least one other repair enzyme.

12. The method of claim 9 , wherein the method comprises repeating the repair of defects in the self-assembled nucleic acids on the at least a portion of the substrate by exposure to the at the least one repair enzyme to reduce defect density.

13. The method of claim 9 , wherein the self-assembled nucleic acids comprise a member selected from the group consisting of self-assembled multi-stranded nucleic acids, self-assembled scaffolded nucleic acids, and self-assembled single-stranded nucleic acids.

14. The method of claim 9 , wherein the at least one repair enzyme comprises an enzyme in a metallo-β-lactamase superfamily, a haloacid dehalogenase superfamily, or an Fe (II)/α-ketoglutarate-dependent dioxygenase superfamily.

15. The method of claim 9 , wherein the at least one repair enzyme comprises an enzyme selected from the group consisting of β-lactamase, oxidoreductase (rubredoxin/oxygen, ROO), glyoxalase II, and artemis/DNA nuclease.

16. The method of claim 9 , wherein the at least one repair enzyme comprises an enzyme selected from the group consisting of haloacid dehalogenase, phosphonatase, Ca 2+ -ATpase, and DNA 3′-phosphatase.

17. The method of claim 9 , wherein the at least one repair enzyme comprises an enzyme selected from the group consisting of clavimate synthase, isopenicillin synthase, taurine dioxygenase, and AlkB.

18. The method of claim 7 , wherein forming self-assembled nucleic acids on at least a portion of a substrate comprises forming the self-assembled nucleic acids comprising ribonucleic acid (RNA) strands, deoxyribonucleic acid (DNA) strands, peptide nucleic acid (PNA) strands, or combinations thereof.

19. A method of forming a nanostructure, comprising:

forming a mask comprising a pattern of self-assembled nucleic acids over at least a portion of a substrate surface;

removing at least one portion of the substrate exposed through the pattern of the mask; and

exposing the pattern of self-assembled nucleic acids to at least one repair enzyme to repair defects in the self-assembled nucleic acids.

20. The method of claim 19 , further comprising removing the mask by a heat treatment at a temperature of from about 90° C. to about 200° C., or by an acidic solution.

21. A method of forming a nanostructure, comprising:

forming a mask comprising a pattern of self-assembled nucleic acids over at least a portion of a substrate surface;

forming a nanocomponent on at least a portion of the substrate exposed through the pattern of the mask, the nanocomponent comprising a material selected from the group consisting of nanowires, gold nanoparticles, semiconductive quantum dots, and fluorescent quantum dots; and

contacting the pattern of self-assembled nucleic acids with a solution comprising at least one repair enzyme to repair defects in the self-assembled nucleic acids, prior to forming the nanocomponent on the at least a portion of the substrate exposed through the pattern of the mask.

22. The method of claim 21 , further comprising removing the self-assembled nucleic acids after forming the nanocomponent on the at least a portion of the substrate exposed through the pattern of the mask.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2014
From: SANDHU, GURTEJ S.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 031937/0378 →
Continuity (1)
Related Publication 20150194316A1 · Jul 9, 2015