IP Library Granted Patent US 9,553,223
Granted Patent B2
US 9,553,223 · App. 14/163,745 · Granted Jan 24, 2017

Method for alignment of microwires

Inventors: Joseph A. Beardslee (Los Angeles, CA); Nathan S. Lewis (La Canada Flintridge, CA); Bryce Sadtler (Los Angeles, CA)
Assignee: California Institute of Technology
H01L31/0352H01F41/26Y10T29/4902
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Quick Facts
Patent No.
US 9,553,223
App. No.
14/163,745
Granted
Jan 24, 2017
Kind
B2
Abstract

A method of aligning microwires includes modifying the microwires so they are more responsive to a magnetic field. The method also includes using a magnetic field so as to magnetically align the microwires. The method can further include capturing the microwires in a solid support structure that retains the longitudinal alignment of the microwires when the magnetic field is not applied to the microwires.

Claims (27)

1. A method of forming a device, comprising:

modifying silicon microwires so as to increase the responsivity of the silicon microwires to a magnetic field;

using the magnetic field to longitudinally align the silicon microwires; and

at least partially embedding the aligned silicon microwires in a polymer to maintain longitudinal alignment of the silicon microwires.

2. The method of claim 1 , wherein using the magnetic field includes applying the magnetic field to the microwires such that more than 90% of the microwires each has a longitudinal axis that is within 7° of the direction of the magnetic field.

3. The method of claim 1 , wherein the longitudinal axis of less than 90% of the microwires was within 7° of the direction of the magnetic field before using the magnetic field.

4. The method of claim 1 , wherein modifying the microwires includes forming a coating of a material on a body of the microwire.

5. The method of claim 4 , further comprising:

removing at least a portion of the coating after using the magnetic field.

6. The method of claim 4 , wherein the coating is more than 20 nm thick.

7. The method of claim 4 , wherein coating includes a ferromagnetic material.

8. The method of claim 7 , wherein forming the coating includes electroplating or sputtering the microwires with the ferromagnetic material.

9. The method of claim 8 , wherein the ferromagnetic material includes at least one components selected from nickel and cobalt.

10. The method of claim 1 , further comprising:

placing the microwires in a liquid so as to form an alignment liquid before using the magnetic field.

11. The method of claim 10 , further comprising:

placing the alignment liquid on a substrate before using the magnetic field.

12. The method of claim 11 , further comprising:

making a surface of the substrate hydrophilic before placing the placing the alignment liquid on the surface of the substrate.

13. The method of claim 11 , wherein the electrical field is used such that ends of the aligned microwires are pulled into contact with the surface of the substrate.

14. The method of claim 11 , wherein the alignment liquid is placed on a surface of the substrate such that less than 90% of the microwires was within 7° of the direction of the magnetic field before using the magnetic field.

15. The method of claim 14 , wherein the magnetic field causes the microwires to re-arrange themselves in the alignment liquid such that more than 90% of the microwires have a longitudinal axis that is within 7° of the line that is perpendicular to the surface of the substrate.

16. The method of claim 1 , further comprising:

capturing the longitudinally aligned microwires in a solid support that holds the microwires in a longitudinally aligned configuration when the magnetic field is not applied to the microwires.

17. The method of claim 16 , wherein modifying the microwires includes forming a coating of a material on a body of the microwire, and further comprising:

removing at least a portion of the coating after capturing the longitudinally aligned microwires in the solid support.

18. The method of claim 1 , wherein the microwires have a diameter that is less than 2 μm and an aspect ratio that is greater than 10.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2016
From: LEWIS, NATHAN S.; BEARDSLEE, JOSEPH A.; SADTLER, BRYCE
To: THE CALIFORNIA INSTITUTE OF TECHNOLOGY
Reel/Frame 040740/0850 →
CONFIRMATORY LICENSE Recorded Jun 6, 2014
From: CALIFORNIA INSTITUTE OF TECHNOLOGY
To: ENERGY, UNITED STATES DEPARTMENT OF
Reel/Frame 033153/0304 →
Continuity (2)
Provisional Application 61756381 · Jan 24, 2013
Related Publication 20140201980A1 · Jul 24, 2014