High dose implantation for ultrathin semiconductor-on-insulator substrates
Methods and structures for forming highly-doped, ultrathin layers for transistors formed in semiconductor-on-insulator substrates are described. High dopant concentrations may be achieved in ultrathin semiconductor layers to improve device characteristics. Ion implantation at elevated temperatures may mitigate defect formation for stoichiometric dopant concentrations up to about 30%. In-plane stressors may be formed adjacent to channels of transistors formed in ultrathin semiconductor layers.
1. An ultrathin semiconductor-on-insulator structure comprising:
a substrate;
an insulating layer on the substrate;
an ultrathin semiconductor layer on the insulating layer,
the ultrathin semiconductor layer having a first surface and a second surface, the second surface being on the insulating layer, the ultrathin semiconductor layer including:
a first portion including a first in-plane stressor and a second in-plane stressor that are implanted with an element, the first in-plane stressor and the second in-plane stressor being between the first and second surface of the ultrathin semiconductor layer; and
a second portion of the ultrathin semiconductor layer is not implanted with the element;
a first transistor on the first portion of the ultrathin semiconductor layer, the first transistor including:
a raised source region and a raised drain region formed on the first surface of the ultrathin semiconductor layer and aligned with the first in-plane stressor and the second in-plane stressor, respectively, the first in-plane stressor and the second in-plane stressor being distinct from the raised source region and the raised drain region, respectively, the raised source region and the raised drain region having widths that are substantially the same as widths of the first in-plane stressor and second in-plane stressor, respectively; and
a second transistor on the second portion of the ultrathin semiconductor layer.
2. The structure of claim 1 , wherein the insulating layer has a thickness between approximately 5 nm and approximately 50 nm.
3. The structure of claim 1 , wherein the insulating layer comprises an oxide.
4. The structure of claim 1 , wherein a thickness of the ultrathin semiconductor layer is less than approximately 10 nm.
5. The structure of claim 1 , wherein the ultrathin semiconductor layer comprises silicon and the element is germanium.
6. The structure of claim 1 , wherein the ultrathin semiconductor layer comprises silicon and the element is carbon.
7. An ultrathin semiconductor-on-insulator structure comprising:
a substrate;
an insulating layer on the substrate;
an ultrathin semiconductor layer on the insulating layer, the ultrathin semiconductor layer including:
a first portion and a second portion that are implanted with an element, the first portion being a first in-plane stressor and the second portion being a second in-plane stressor;
a transistor formed on the ultrathin semiconductor layer, the transistor including:
a channel in the ultrathin semiconductor layer between the first and second portion;
a gate structure on the channel; and
raised source and drain regions on the first and second portions of the ultrathin semiconductor layer, respectively, the raised source and drain regions have widths that are substantially the same as widths of the first and second portions, respectively, of the ultrathin semiconductor layer, the raised source and drain regions being distinct from the first in-plane stressor and the second in-plane stressor.
8. The structure of claim 7 , wherein the insulating layer has a thickness between approximately 5 nm and approximately 50 nm.
9. The structure of claim 7 , wherein the insulating layer comprises an oxide.
10. The structure of claim 7 , wherein a thickness of the ultrathin semiconductor layer is less than approximately 10 nm.
11. The structure of claim 7 , wherein the ultrathin semiconductor layer comprises silicon and the element is germanium.
12. The structure of claim 7 , wherein the ultrathin semiconductor layer comprises silicon and the element is carbon.
13. A device, comprising:
a substrate;
an insulating layer on the substrate;
an ultrathin semiconductor layer on the insulating layer, the ultrathin semiconductor layer including:
a first portion that is a first in-plane stressor, the first portion having a first width;
a second portion that is a second in-plane stressor, the second portion having a second width; and
a third portion between the first and second in-plane stressors, the third portion having a third width;
a transistor on the ultrathin semiconductor layer, the transistor including:
a channel region in the third portion;
a gate electrode structure on the channel region;
first spacers adjacent to the gate electrode;
second spacers adjacent to the first spacers, the third width corresponding to a dimension between outer edges of the second spacers; and
raised source and drain regions adjacent to the second spacers, the raised source and drain regions being distinct from and on the first and second in-plane stressors, respectively, and the raised source region having a fourth width and the drain region having a fifth width, the fourth and fifth widths are substantially the same as the first and second widths of the first and second in-plane stressors, respectively.
14. The device of claim 13 , wherein the ultrathin semiconductor layer comprises silicon and the element is germanium.
15. The device of claim 13 , wherein the ultrathin semiconductor layer comprises silicon and the element is carbon.
16. The device of claim 13 , wherein the first and second in-plane stressors are completely on and above the insulating layer.
17. The structure of claim 1 , further comprising first spacers adjacent to a gate structure over the channel region and second spacers adjacent to the first spacers, wherein the channel region extends to outer edges of the second spacers, and wherein the raised source region and the raised drain region are adjacent to the second spacers.
18. The structure of claim 7 , wherein the first and second in-plane stressors are completely on and above the insulating layer.
19. The structure of claim 7 , further comprising first spacers adjacent to the gate structure and second spacers adjacent to the first spacers, wherein the channel extends to outer edges of the second spacers, and wherein the raised source and drain regions are adjacent to the second spacers.