IP Library Granted Patent US 9,136,845
Granted Patent B2
US 9,136,845 · App. 14/180,322 · Granted Sep 15, 2015

Level shifter with improved operation

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Quick Facts
Patent No.
US 9,136,845
App. No.
14/180,322
Granted
Sep 15, 2015
Kind
B2
Abstract

A level shifter includes a first branch and a second branch. A trigger of the first branch is coupled to a low voltage input, an inverted high voltage output and a ground. A latch of the first branch is coupled to the inverted high voltage output and a high voltage output. A power gate of the first branch is coupled to an inverted low voltage input, the latch of the first branch and a high voltage supply. A trigger of the second branch is coupled to the inverted low voltage input, the high voltage output and the ground. A latch of the second branch is coupled to the high voltage output and the inverted high voltage output. A power gate of the second branch is coupled to the low voltage input, the latch of the second branch and the high voltage supply.

Claims (37)

1. A level shifter comprising:

a first branch and a second branch;

a trigger of the first branch coupled to a low voltage input, an inverted high voltage output and a ground, the trigger of the first branch configured to change a voltage of the inverted high voltage output in response to the low voltage input;

a latch of the first branch coupled to the inverted high voltage output and a high voltage output, the latch of the first branch configured to change a state of the high voltage output in response to the inverted high voltage output;

a power gate of the first branch coupled to an inverted low voltage input, the latch of the first branch and a high voltage supply, the power gate of the first branch configured to enable a first current flowing from the high voltage supply through the latch of the first branch, in response to the inverted low voltage input;

a trigger of the second branch coupled to the inverted low voltage input, the high voltage output and the ground, the trigger of the second branch configured to disable the first current from flowing to the ground in response to the inverted low voltage input;

a latch of the second branch coupled to the high voltage output and the inverted high voltage output, the latch of the second branch configured to enable the change of the state of the high voltage output in response to the inverted high voltage output; and

a power gate of the second branch coupled to the low voltage input, the latch of the second branch and the high voltage supply, the power gate of the second branch configured to reduce a value of a second current flowing from the high voltage supply through the latch of the second branch, in response to the low voltage input.

2. The level shifter of claim 1 wherein the low voltage input is nominally 1.1 Volts and the high voltage supply is nominally 3.3 Volts.

3. The level shifter of claim 1 wherein at least one of the trigger of the first branch and the trigger of the second branch comprises an N-channel Field Effect Transistor (NFET).

4. The level shifter of claim 1 wherein at least one of the latch of the first branch and the latch of the second branch comprises an NFET and a P-channel Field Effect Transistor (PFET), a drain of the NFET coupled to a gate of the PFET, and a drain of the PFET coupled to a gate of the NFET.

5. The level shifter of claim 1 wherein at least one of the power gate of the first branch and the power gate of the second branch comprises a first PFET and a second PFET, a drain of the first PFET coupled to a source of the second PFET, and a gate of the first PFET coupled to a gate of the second PFET.

6. The level shifter of claim 1 wherein at least one of the power gate of the first branch and the power gate of the second branch comprises a PFET.

7. The level shifter of claim 1 wherein the trigger of the first branch is configured to receive the low voltage input to initiate an activation of the latch of the first branch.

8. A method of level shifting comprising:

partially deactivating a power gate of a second branch with a low voltage input and partially activating a trigger of a first branch with the low voltage input, whereby an impedance of the trigger of the first branch is lowered to activate a latch of the first branch;

activating a power gate of the first branch and deactivating a trigger of the second branch;

providing a high voltage output from the power gate of the first branch conducting through the latch of the first branch; and

deactivating a latch of the second branch with the high voltage output.

9. The method of claim 8 further comprising applying a logical one state to the low voltage input.

10. The method of claim 8 further comprising deactivating the latch of the second branch with the latch of the first branch.

11. The method of claim 8 wherein activating the latch of the first branch comprises partially activating a P-channel Field Effect Transistor (PFET) with the trigger of the first branch, the PFET activating an N-channel Field Effect Transistor (NFET) and the NFET activating the PFET.

12. The method of claim 8 wherein deactivating the latch of the second branch comprises deactivating a PFET of the latch of the second branch with the high voltage output.

13. The method of claim 8 wherein deactivating the latch of the second branch comprises deactivating an NFET of the latch of the second branch with an NFET of the latch of the first branch.

14. The method of claim 8 wherein partially activating the trigger of the first branch further comprises sinking current through an NFET of the trigger of the first branch, the current sourced by the power gate of the second branch conducting through a PFET of the latch of the second branch.

15. A level shifter comprising:

a gate of a first N-channel Field Effect Transistor (NFET) connected to a low voltage input, and a drain of the first NFET connected to an inverted output;

a drain of a first P-channel Field Effect Transistor (PFET) connected to a gate of a second NFET and an output, and a drain of the second NFET connected to a gate of the first PFET and the inverted output;

a gate of a second PFET connected to an inverted low voltage input, a source of the second PFET connected to a high voltage supply, and a drain of the second PFET connected to a source of the first PFET;

a gate of a third NFET connected to the inverted low voltage input, and a drain of the third NFET connected to the output;

a drain of a third PFET connected to a gate of a fourth NFET and the inverted output, and a drain of the fourth NFET connected to a gate of the third PFET and the output; and

a gate of a fourth PFET connected to the low voltage input, a source of the fourth PFET connected to the high voltage supply, and a drain of the fourth PFET connected to a source of the third PFET.

16. The level shifter of claim 15 wherein the first NFET is configured to activate a latch including the first PFET and the second NFET, when the first NFET is partially activated.

17. The level shifter of claim 15 wherein the second PFET is comprised of a fifth PFET and a sixth PFET, a drain of the fifth PFET is connected to the source of the first PFET, a gate of the fifth PFET is connected to the inverted low voltage input, a source of the fifth PFET is connected to a drain of the sixth PFET, a gate of the sixth PFET is connected to the inverted low voltage input and a source of the sixth PFET is connected to the high voltage supply.

18. The level shifter of claim 15 wherein the fourth PFET is comprised of a seventh PFET and an eighth PFET, a drain of the seventh PFET is connected to the source of the third PFET, a gate of the seventh PFET is connected to the low voltage input, a source of the seventh PFET is connected to a drain of the eighth PFET, a gate of the eighth PFET is connected to the low voltage input and a source of the eighth PFET is connected to the high voltage supply.

19. The level shifter of claim 15 wherein a channel width of the first NFET is at least 30 microns, and a channel length of the first NFET is substantially 0.72 microns.

20. The level shifter of claim 15 wherein a bulk connection of each NFET is connected to a respective source of each NFET and a bulk connection of each PFET is connected to a respective source of each PFET.

Assignments (18)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 13, 2020
From: NXP USA, INC
To: SK HYNIX INC.
Reel/Frame 054357/0286 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT APPLICATION NUMBERS 12222918, 14185362, 14147598, 14185868 & 14196276 PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0479. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded May 12, 2016
From: CITIBANK, NA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038665/0498 →
CORRECTIVE ASSIGNMENT TO CORRECT THE APPLICATION NUMBERS PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0438. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded May 12, 2016
From: CITIBANK, NA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038665/0136 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0438 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0479 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0763 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 032845/0522 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 032845/0497 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 032845/0442 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 13, 2014
From: BADRUDDUZA, SAYEED AHMED; HOEFLER, ALEXANDER BERNHARD
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 032216/0151 →