Method, apparatus and system for transmittance measurement
An apparatus for testing transmittance includes a sample unit to position a material under test. The material under test is disposed between respective flat surfaces of a first mount and a second mount, which are positioned in the sample unit for a test round. The sample unit defines a first volume and a second volume, wherein arc shapes, variously formed by respective surfaces of the first and second volume, conform to an imaginary circle. During the test round, a rotation unit successively changes an angular position of the MUT relative to a light source. A light detector receives light from the light source which has been transmitted through the first volume, the MUT and the second volume. Based on the received light, a transmittance signature of the MUT is determined for a range of incidence angles.
1. An apparatus for testing transmittance, the apparatus comprising:
a sample unit to define at least in part a first volume on a first side of a flat plane and a second volume on a second side of the flat plane, wherein a first curved surface of the first volume forms a first arc shape and a second curved surface of the second volume forms a second arc shape, together the first arc shape and the second arc shape to conform to a circle, the sample unit further to position a material under test (MUT) between a first mount disposed at least in part on the first side and a second mount disposed at least in part on the second side, including the sample unit to position the MUT between the first volume and the second volume;
a light source coupled to move to different angular positions relative to the MUT during a test round performed by the apparatus, wherein the first volume includes a first light transmissive material and the second volume includes a second light transmissive material during the test round and the test round includes a first plurality of tests each corresponding to one of the different angular positions;
a first light detector;
metering logic, wherein for each of the first plurality of tests:
the light source emits light into the first volume via the first curved surface; and
the first light detector receives a first portion of the emitted light via the second curved surface, the first portion other than any portion of the emitted light that is reflected by the MUT, the metering logic including circuitry to generate, based on the received first portion of the emitted light, a signal representing a measurement of light transmittance through the MUT; and
a rotation unit to mount the sample unit, wherein during the test round the rotation unit successively changes an angular position of the light source relative to the MUT.
2. The apparatus of claim 1 , wherein the first volume is hemicylindrical.
3. The apparatus of claim 1 , wherein the first volume is hemispherical.
4. The apparatus of claim 1 , wherein a curved surface of the first mount includes the first arc shape.
5. The apparatus of claim 1 , wherein the apparatus to perform a plurality of test rounds including the first test round, the plurality of test rounds each corresponding to a different respective polarization state of light to be provided for evaluating the MUT.
6. The apparatus of claim 1 , wherein the circuitry to generate the signal representing the measurement further based on a value representing absorption of light by the sample unit.
7. The apparatus of claim 6 , wherein the value representing absorption of light is determined based on a reference scan.
8. The apparatus of claim 1 , wherein the circuitry to generate the signal representing the measurement further based on a value representing Fresnel losses.
9. The apparatus of claim 1 , further comprising a second light detector, wherein for each of the first plurality of tests:
the second light detector to receive via the first curved surface a second portion of the emitted light for the test; and
the metering logic further to generate, based on the received second portion of the emitted light, a signal representing a reflectance measurement of the MUT.
10. The apparatus of claim 1 , the test round further comprising a second plurality of tests each corresponding to a different respective angular position of the light source relative to the MUT, wherein for each of the second plurality of tests:
the light source to emit light into one of the first volume and the second volume;
the first light detector to receive a second portion of the emitted light via the one of the first volume and the second volume; and
the metering logic to generate, based on the received second portion of the emitted light, a signal representing a reflectance measurement of the MUT.
11. A method comprising:
positioning a material under test (MUT) in a sample unit which defines at least in part a first volume on a first side of a flat plane and a second volume on a second side of the flat plane, wherein a first curved surface of the first volume forms a first arc shape and a second curved surface of the second volume forms a second arc shape, the positioning the MUT including:
disposing the MUT between a first mount disposed at least in part on the first side and a second mount disposed at least in part on the second side, including positioning the MUT between the first volume and the second volume; and
securing the first mount and the second mount within the sample unit, wherein the first arc shape and the second arc shape are positioned to conform to an imaginary circle;
mounting the sample unit with a rotation unit; and
performing a test round during which the first volume includes a first light transmissive material and the second volume includes a second light transmissive material, the test round including a first plurality of tests each corresponding to a different respective angular position of a light source relative to the MUT, the test round including:
for each of the first plurality of tests:
emitting light from the light source into the first volume via the first curved surface;
with a first light detector, receiving a first portion of the emitted light via the second curved surface, the first portion other than any portion of the emitted light that is reflected by the MUT; and
obtaining a measurement of light transmittance through the MUT based on the received first portion of the emitted light; and
successively changing an angular position of the light source relative to the MUT.
12. The method of claim 11 , wherein the first volume is a hemicylindrical volume.
13. The method of claim 11 , wherein the first volume is a hemispherical.
14. The method of claim 11 , wherein a curved surface of the first mount includes the first arc shape.
15. The method of claim 11 , wherein the first test round is one of a plurality of test rounds each corresponding to a different respective polarization state of light to be provided for evaluating the MUT, the method further comprising performing the others of the plurality of test rounds.
16. The method of claim 11 , wherein the measurement of light transmittance through the MUT is obtained based on a value representing absorption of light by the sample unit.
17. The method of claim 16 , wherein the value representing absorption of light is determined based on a reference scan.
18. The method of claim 11 , wherein the measurement of light transmittance through the MUT is obtained based on a value representing Fresnel losses.
19. The method of claim 11 , the test round further including, for each of the first plurality of tests:
with a second light detector, receiving via the first curved surface a second portion of the emitted light for the test; and
obtaining a reflectance measurement of the MUT based on the received second portion of the emitted light.
20. The method of claim 11 , the test round further comprising a second plurality of tests each corresponding to a different respective angular position of the light source relative to the MUT, the second plurality of tests each including:
emitting light into one of the first volume and the second volume;
with the first light detector, receiving a second portion of the emitted light via the one of the first volume and the second volume; and
obtaining a reflectance measurement of the MUT based on the received second portion of the emitted light.