Dynamic compensation circuit
A test and measurement system including a device under test, an accessory, a controller and a test and measurement instrument. The accessory is connected to the device under test and includes a signal input to receive an input signal from the device under test, a compensation unit configured to apply a compensation signal internal to the accessory, and a signal output to output an output signal read from the device under test. The controller is connected to the accessory and includes one or more receivers to receive the input signal and the output signal from the accessory, and a microcontroller or correction circuit configured to compare the input signal and the output signal and in response to the comparison provide a compensation signal to the compensation unit.
1. A test and measurement system, comprising:
an accessory connected to a device under test, including:
a signal input configured to receive an input signal from the device under test,
an amplifier configured to amplify the input signal to create an amplified input signal,
a compensation unit configured to receive the input signal and continuously apply a compensation signal to the amplified input signal based on a compensation value internal to the accessory to create a compensated input signal, and output the input signal,
a first signal path configured to output the compensated input signal of the device under test, and
a second signal path configured to forward the input signal and receive the compensation value;
a controller connected to the accessory, including:
a first connection to receive the input signal from the accessory and output the compensation value to the compensation unit, and
a second connection to receive the compensated input signal from the accessory,
wherein the controller is configured to compare the compensated input signal and the input signal and, in response to the comparison, determine the compensation value; and
a test and measurement instrument connected to the controller.
2. The system of claim 1 , wherein the accessory is a transducer.
3. The system of claim 2 , wherein the transducer is a voltage probe or a current probe.
4. The system of claim 1 , wherein the controller is further configured to output the compensated input signal to the test and measurement instrument for display on a display of the test and measurement instrument.
5. The system of claim 1 , wherein the compensation unit is further configured to apply the compensation signal when the accessory is attached to the device under test.
6. A method of internally compensating an accessory in a measurement system including a host, a controller and a device under test, the method comprising:
receiving at the accessory an input signal from a device under test;
amplifying the input signal to create an amplified input signal;
continuously applying a compensation signal, by a compensation unit, to the amplified input signal to create a compensated input signal;
outputting the compensated input signal to a controller;
forwarding the input signal to the controller,
comparing the compensated input signal and the input signal at the controller to determine a compensation value; and
outputting the compensation value, from the controller to the compensation unit in the accessory for continuous application of the compensation signal to the amplified input signal from the device under test.
7. The method of claim 6 , wherein the compensation signal is sent while the accessory is attached to a device under test.
8. The method of claim 6 , further comprising providing the compensated input signal as an output signal to the test and measurement instrument.
9. The system of claim 1 , wherein the controller includes a microcontroller to determine the compensation value.
10. The system of claim 1 , wherein the controller includes a correction circuit to determine the compensation value.