IP Library Granted Patent US 9,263,461
Granted Patent B2
US 9,263,461 · App. 14/200,348 · Granted Feb 16, 2016

Apparatuses including memory arrays with source contacts adjacent edges of sources

Inventor: Toru Tanzawa (Tokyo, JP)
Assignee: Micron Technology, Inc.
H01L27/11556H01L27/11582H01L27/249
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Quick Facts
Patent No.
US 9,263,461
App. No.
14/200,348
Granted
Feb 16, 2016
Kind
B2
Abstract

Various apparatuses, including three-dimensional (3D) memory devices and systems including the same, are described herein. In one embodiment, a 3D memory device can include at least two sources; at least two memory arrays respectively formed over and coupled to the at least two sources; and a source conductor electrically respectively coupled to the at least two sources using source contacts adjacent one or more edges of the source. Each of the at least two memory arrays can include memory cells, control gates, and data lines. There is no data line between an edge of a source and the source contacts adjacent the edge.

Claims (36)

1. An apparatus comprising:

at least two sources;

at least two memory arrays respectively formed over and coupled to the at least two sources, wherein each of the at least two memory arrays includes vertical strings of memory cells, control gates, and data lines; and

a source conductor coupled to the at least two sources respectively using source contacts adjacent source edges, wherein there is no data line between a source edge of the source edges and a source contact of the source contacts for each of the at least two sources, wherein each of the source contacts includes a first contact electrically coupled to the source conductor, a second contact electrically coupled to a source of the at least two sources, and a conductive connector connecting the first and second contacts.

2. The apparatus of claim 1 , wherein each of the at least two sources comprises metal material.

3. The apparatus of claim 1 , wherein each of the at least two sources comprises WSi.

4. The apparatus of claim 1 , wherein each of the at least two sources comprises a stack of metal material and polysilicon.

5. The apparatus of claim 1 , wherein each of the at least two sources comprises a stack of polysilicon and WSi.

6. An apparatus comprising:

a source;

a memory array formed over and coupled to the source, the memory array including vertical strings of memory cells, control gates, and data lines; and

a source conductor coupled to the source through a source contact adjacent an edge of the source, wherein there is no data line between the edge of the source and the source contact, wherein the source conductor extends over the memory array, and further comprising an interconnection component extending perpendicular to the source conductor and coupled to the source conductor using an interconnection contact.

7. The apparatus of claim 6 , wherein the source contact comprises a plurality of source contacts, and further wherein there is no source routing inside the memory array.

8. The apparatus of claim 6 , wherein the source contact is adjacent the edge of the source in a control gate direction.

9. The apparatus of claim 6 , wherein the source contact is adjacent the edge of the source on a side of and between groups of control gate contacts.

10. The apparatus of claim 6 , wherein the source contact is adjacent the edge of the source on a side opposite to groups of control gate contacts.

11. The apparatus of claim 6 , wherein the source contact comprises a first source contact, and wherein a second source contact is adjacent another edge of the source.

12. The apparatus of claim 6 , wherein the interconnection component extends below the source.

13. The apparatus of claim 6 , wherein the source extends between the source conductor and the interconnection component.

14. The apparatus of claim 6 , wherein the interconnection contact includes a first contact electrically coupled to the source conductor, a second contact electrically coupled to the interconnection component, and a third contact connecting the first contact and the second contact.

15. The apparatus of claim 6 , wherein the interconnection component extends over the source conductor.

16. The apparatus of claim 6 , wherein the source conductor extends between the interconnection component and the source.

17. The apparatus of claim 6 , wherein the interconnection contact comprises a single conductive plug.

18. The apparatus of claim 6 , wherein the control gates comprise a plurality of tiers of a first semiconductor material.

19. The apparatus of claim 18 , wherein the first semiconductor material comprises polysilicon.

20. The apparatus of claim 19 , wherein the memory array comprises a plurality of vertical pillars of a second semiconductor material.

21. The apparatus of claim 20 , wherein the second semiconductor material comprises polysilicon.

22. An apparatus comprising:

at least two sources;

at least two memory arrays respectively coupled to the at least two sources, each of the at least two memory arrays including memory cells, control gates, and data lines;

a source conductor over the at least two memory arrays, and coupled to the at least two sources through source contacts adjacent edges of the at least two sources; and

a signal conductor parallel with the source conductor, and coupled to gates of transistors to provide control signals to the at least two memory arrays.

23. The apparatus of claim 22 , wherein the transistors are formed on a same semiconductor substrate.

24. The apparatus of claim 23 , wherein the semiconductor substrate comprises silicon.

25. The apparatus of claim 1 , wherein the at least two memory arrays and the source conductor are included in a memory device, and wherein the memory device is coupled to a memory controller and/or a processor to send a control signal to the at least two memory arrays.

26. The apparatus of claim 1 , wherein there is no source routing inside any of the at least two arrays.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 12, 2015
From: TANZAWA, TORU
To: MICRON TECHNOLOGY, INC.
Reel/Frame 035151/0410 →
Continuity (1)
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