IP Library Granted Patent US 9,078,322
Granted Patent B2
US 9,078,322 · App. 14/205,014 · Granted Jul 7, 2015

Method of driving LED chips of different specifications

Inventor: Ming-Feng Lin (Taichung, TW)
Assignees: HEP TECH CO., LTD.; Ming-Feng Lin
H05B33/0842
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Quick Facts
Patent No.
US 9,078,322
App. No.
14/205,014
Granted
Jul 7, 2015
Kind
B2
Abstract

A method of driving LED chips, wherein the LED chips have different specifications, includes the steps of: A. defining a plurality of setting currents; B. connecting a LED chip; C. selecting one of the setting currents which matches a rated current of the LED chip; and D. providing power with the selected setting current to the LED chip. Whereby, the method could be applied to drive LED chips of several different specifications.

Claims (19)

1. A method of driving LED chips, wherein the LED chips have different specifications, comprising the steps of:

(a) defining a plurality of setting currents;

(b) connecting a LED chip;

(c) selecting one of the setting currents which matches a rated current of the LED chip;

(d) providing power with the selected setting current to the LED chip;

wherein each setting current relates to a reference voltage;

the step of selecting one of the setting currents includes providing the LED chip with a testing current, which is a constant current, measuring a voltage of the LED chip while the LED chip is operating with the testing current, and selecting one of the setting currents according to the reference voltage which matches the measured voltage.

2. The method of claim 1 , wherein the testing current is lower than any one of the setting currents.

3. The method of claim 1 , further comprising the step of maintaining a voltage of the power provided to the LED chip as an upper limit voltage when the voltage of the power is measured higher than the upper limit voltage in the step (d).

4. A method of driving LED chips, wherein the LED chips have different specifications, comprising the steps of:

(a) defining a plurality of setting currents;

(b) connecting a LED chip;

(c) selecting one of the setting currents which matches a rated current of the LED chip; and

(d) providing power with the selected setting current to the LED chip;

wherein each setting current relates to a reference voltage segment;

the step of selecting one of the setting currents includes providing the LED with a testing current, which is a constant current, measuring a voltage of the LED chip while the LED chip is operating with the testing current, and selecting one of the setting currents according to the reference voltage segment in which the measured voltage falls.

5. The method of claim 4 , wherein the testing current is lower than any one of the setting currents.

6. The method of claim 4 , wherein zero voltage is included in one of the reference voltage segments.

7. The method of claim 4 , further comprising the step of maintaining a voltage of the power provided to the LED chip as an upper limit voltage when the voltage of the power is measured higher than the upper limit voltage in the step (d).

Assignments (4)
SECURITY INTEREST Recorded Dec 3, 2019
From: ESPEN TECHNOLOGY INC.
To: PIERMONT BANK
Reel/Frame 051164/0250 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 13, 2019
From: LIN, MING-FENG, MR.
To: ESPEN TECHNOLOGY, INC
Reel/Frame 048583/0007 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2018
From: HEP TECH CO., LTD.; LIN, MING-FENG
To: LIN, MING-FENG
Reel/Frame 046678/0447 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2014
From: LIN, MING-FENG
To: HEP TECH CO., LTD.; LIN, MING-FENG
Reel/Frame 032408/0669 →
Priority Claims (1)
TW 102110957 A · Mar 27, 2013 · national
Continuity (1)
Related Publication 20140292230A1 · Oct 2, 2014