Methods and systems for analyzing samples
The disclosure features methods for analyzing a sample, the methods including exposing the sample to plurality of pulses of electromagnetic radiation to convert a portion of the sample into a plasma, recording a spectrum of electromagnetic radiation emitted in response to each of the plurality of pulses to define a sequence of spectra for the sample, and using an electronic processor to determine information about the sample based on the spectra, where exposing the sample to the plurality of pulses of electromagnetic radiation includes directing the pulses to be incident on different spatial regions of the sample, and where a temporal delay between exposing the sample to each successive radiation pulse is constant.
1. A method for analyzing a sample, the method comprising:
exposing the sample to plurality of pulses of electromagnetic radiation to convert a portion of the sample into a plasma by directing the pulses to be distributed among different spatial regions on a surface of the sample, the plurality of pulses defining an exposure sequence and the spatial regions defining a two-dimensional exposure pattern on the sample surface;
recording a spectrum of electromagnetic radiation emitted in response to each of the plurality of pulses to define a sequence of spectra for the sample, wherein each member of the sequence corresponds to the spectrum recorded in response to a different one of the pulses;
using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of multiple reference samples in a reference library; and
using the electronic processor to determine information about the sample based on the comparison to the multiple reference samples in the library,
wherein exposing the sample to the plurality of pulses of electromagnetic radiation comprises directing single pulses from among the plurality of pulses to be incident on each of the spatial regions of the exposure pattern in sequence, and directing additional single pulses from among the plurality of pulses to be incident on at least some of the spatial regions of the exposure pattern, so that multiple pulses are incident on the at least some of the spatial regions;
wherein for each one of the at least some of the spatial regions, a total of two or more pulses are incident at a common location on the sample that corresponds to the one of the at least some of the spatial regions; and
wherein for the exposure sequence, a temporal delay between each one of the plurality of pulses and an immediately prior pulse in the exposure sequence is a constant value D.
2. The method of claim 1 , wherein the spatial regions form a hexagonal array on the sample.
3. The method of claim 1 , wherein the spatial regions form an array of equally spaced exposure regions on the sample.
4. The method of claim 3 , wherein the exposure regions are positioned along a circumference of a common circle.
5. The method of claim 1 , wherein the plurality of pulses comprises 60 or more pulses.
6. The method of claim 1 , further comprising adjusting a spacing between the different spatial regions of the sample and maintaining the temporal delay at the constant value D.
7. The method of claim 6 , further comprising selecting the temporal delay based on the sample.
8. The method of claim 6 , further comprising selecting a power of each of the plurality of radiation pulses.
9. The method of claim 6 , further comprising measuring a first sequence of spectra for the sample corresponding to a first constant temporal delay, and measuring a second sequence of spectra for the sample corresponding to a second constant temporal delay that is different from the first constant temporal delay.
10. The method of claim 9 , further comprising determining the information about the sample based on the first and second sequences of spectra.
11. The method of claim 1 , wherein each member of the sequence of spectra corresponds to a different one of the spatial regions and comprises information from a single measurement of a spectrum of electromagnetic radiation emitted from the different one of the spatial regions.
12. A system for analyzing a sample, the system comprising:
an electromagnetic radiation source configured to expose the sample to plurality of pulses of electromagnetic radiation to convert a portion of the sample into a plasma;
a detector configured to record a spectrum of electromagnetic radiation emitted in response to each of the plurality of pulses to define a sequence of spectra for the sample, wherein each member of the sequence corresponds to the spectrum recorded in response to a different one of the pulses; and
an electronic processor configured to:
control the radiation source to direct the plurality of electromagnetic radiation pulses to be distributed among different spatial regions on a surface of the sample such that:
the plurality of pulses define an exposure sequence and the spatial regions define a two-dimensional exposure pattern on the sample surface;
single pulses from among the plurality of pulses are incident on each of the spatial regions of the exposure pattern, and additional single pulses from among the plurality of pulses are incident on at least some of the spatial regions of the exposure pattern, so that multiple pulses are incident on the at least some of the spatial regions;
for each one of the at least some of the spatial regions, a total of two or more pulses are incident at a common location on the sample that corresponds to the one of the at least some of the spatial regions; and
for the exposure sequence, a temporal delay between each one of the plurality of pulses and an immediately prior pulse in the exposure sequence is a constant value D;
compare the sequence of spectra for the sample to a sequence of spectra for each of multiple reference samples in a reference library; and
determine information about the sample based on the comparison to the multiple reference samples in the library.
13. The system of claim 12 , wherein electronic processor is configured to control the radiation source so that the spatial regions form an array of equally spaced exposure regions on the sample.
14. The system of claim 12 , wherein the electronic processor is configured to control the radiation source so that the spatial regions form a hexagonal array on the sample.
15. The system of claim 12 , wherein electronic processor is configured to control the radiation source so that the spatial regions form an array of equally spaced exposure regions on the sample.
16. The system of claim 15 , wherein the exposure regions are equally spaced along a circumference of a circle.
17. The system of claim 12 , wherein the plurality of pulses comprises 60 or more pulses.
18. The system of claim 12 , wherein the electronic processor is configured to adjust a spacing between the different spatial regions of the sample, and to maintain the temporal delay at the constant value D.
19. The system of claim 18 , wherein the electronic processor is configured to select the temporal delay based on the sample.
20. The system of claim 18 , wherein the electronic processor is configured to control the radiation source to select a power of each of the plurality of radiation pulses.
21. The system of claim 18 , wherein the electronic processor is configured to:
use the detector to measure a first sequence of spectra for the sample corresponding to a first constant temporal delay; and
use the detector to measure a second sequence of spectra for the sample corresponding to a second constant temporal delay that is different from the first constant temporal delay.
22. The system of claim 21 , wherein the electronic processor is configured to determine the information about the sample based on the first and second sequences of spectra.