Bessel beam plane illumination microscope
A microscope has a light source for generating a light beam having a wavelength, λ, and beam-forming optics configured for receiving the light beam and generating a Bessel-like beam that is directed into a sample. The beam-forming optics include an excitation objective having an axis oriented in a first direction. Imaging optics are configured for receiving light from a position within the sample that is illuminated by the Bessel-like beam and for imaging the received light on a detector. The imaging optics include a detection objective having an axis oriented in a second direction that is non-parallel to the first direction. A detector is configured for detecting signal light received by the imaging optics, and an aperture mask is positioned.
1. A microscope comprising:
a light source for generating a light beam having a wavelength, κ;
beam-forming optics, including an optical element positioned in a path of the light beam and configured for generating an annular ring of light, the beam-forming optics being configured for generating from the light beam an excitation beam having a central lobe and at least one side lobe and also configured to direct the excitation beam to a position within a sample, wherein the beam-forming optics include an excitation objective having an axis oriented in a first direction, and wherein a transverse profile of the excitation beam in the sample is intermediate between a profile of a lowest order Bessel function and the Gaussian function, wherein the Bessel-like beam has a ratio of a Rayleigh length, z R to a minimum beam waist, w o , of more than 2πw o /λ and less than 100πw o /λ;
imaging optics configured for receiving signal light from a position within the sample that is illuminated by the excitation beam and for imaging the received light on a detector, the imaging optics including a detection objective having an axis oriented in a second direction that is non-parallel to the first direction, wherein the signal light is generated though a non-linear signal generation process; and
a detector configured for detecting the signal light received by the imaging optics.
2. The microscope of claim 1 , further comprising beam scanning optics configured for scanning the Bessel-like beam in a direction having a component perpendicular to the first direction.
3. The microscope of claim 1 , wherein the Bessel-like beam has a non-zero ratio of a minimum numerical aperture to a maximum numerical aperture of less than 0.95.
4. The microscope of claim 1 , wherein the Bessel-like beam has a non-zero ratio of a minimum numerical aperture to a maximum numerical aperture of less than 0.90.
5. The microscope of claim 1 , wherein the Bessel-like beam has a minimum numerical aperture greater than zero and a ratio of energy in a first side lobe of the beam to energy in the central lobe of the beam of less than 0.5.
6. The microscope of claim 1 , further comprising a coverslip that supports the sample, wherein a normal direction to a plane of the sample that supports the sample forms an angle with the first direction of more than 10 degrees and less than 80 degrees.
7. The microscope of claim 6 , wherein the sample is less than ten micrometers thick.
8. The microscope of claim 6 , wherein the angle is selected such that neither the excitation beam, nor the outgoing signal light, intercepts the coverslip.
9. The microscope of claim 6 , wherein the signal light has a wavelength of λ/2.
10. The microscope of claim 6 , wherein the signal light includes fluorescence light emitted from the sample after excitation by the Bessel-like beam.
11. The microscope of claim 6 , further comprising an annular mask in a path of the light beam configured to generate the annular ring of light from which the Bessel-like beam is formed.
12. A microscope comprising:
a light source for generating a light beam having a wavelength, λ;
beam-forming optics, including an optical element positioned in a path of the light beam and configured for generating an annular ring of light, the beam-forming optics being configured for generating from the light beam an excitation beam having a central lobe and at least one side lobe and also configured to direct the excitation beam to a position within a sample, wherein the beam-forming optics include an excitation objective having an axis oriented in a first direction, and wherein a transverse profile of the excitation beam in the sample is intermediate between a profile of a lowest order Bessel function and the Gaussian function, wherein the Bessel-like beam has a non-zero ratio of a minimum numerical aperture to a maximum numerical aperture of less than 0.95;
imaging optics configured for receiving signal light from a position within the sample that is illuminated by the excitation beam and for imaging the received light on a detector, the imaging optics including a detection objective having an axis oriented in a second direction that is non-parallel to the first direction, wherein the signal light is generated though a non-linear signal generation process; and
a detector configured for detecting the signal light received by the imaging optics.
13. The microscope of claim 12 , further comprising beam scanning optics configured for scanning the Bessel-like beam in a direction having a component perpendicular to the first direction.
14. The microscope of claim 12 , wherein the Bessel-like beam has a ratio of a Rayleigh length, z R to a minimum beam waist, w o , of more than 2πw o /λ and less than 100πw o /λ.
15. The microscope of claim 12 , wherein the Bessel-like beam has a non-zero ratio of a minimum numerical aperture to a maximum numerical aperture of less than 0.90.
16. The microscope of claim 12 , wherein the Bessel-like beam has a minimum numerical aperture greater than zero and a ratio of energy in a first side lobe of the beam to energy in the central lobe of the beam of less than 0.5.
17. The microscope of claim 12 , further comprising a coverslip that supports the sample, wherein a normal direction to a plane of the sample that supports the sample forms an angle with the first direction of more than 10 degrees and less than 80 degrees.
18. The microscope of claim 17 , wherein the sample is less than ten micrometers thick.
19. The microscope of claim 17 , wherein the angle is selected such that neither the excitation beam, nor the outgoing signal light, intercepts the coverslip.
20. The microscope of claim 17 , wherein the signal light has a wavelength of λ/2.
21. The microscope of claim 17 , wherein the signal light includes fluorescence light emitted from the sample after excitation by the Bessel-like beam.
22. The microscope of claim 17 , further comprising an annular mask in a path of the light beam configured to generate the annular ring of light from which the Bessel-like beam is formed.
23. A microscope comprising:
a light source for generating a light beam having a wavelength, λ;
beam-forming optics, including an optical element positioned in a path of the light beam and configured for generating an annular ring of light, the beam-forming optics being configured for generating from the light beam an excitation beam having a central lobe and at least one side lobe and also configured to direct the excitation beam to a position within a sample, wherein the beam-forming optics include an excitation objective having an axis oriented in a first direction, and wherein a transverse profile of the excitation beam in the sample is intermediate between a profile of a lowest order Bessel function and the Gaussian function, wherein the Bessel-like beam has a minimum numerical aperture greater than zero and a ratio of energy in a first side lobe of the beam to energy in the central lobe of the beam of less than 0.5;
imaging optics configured for receiving signal light from a position within the sample that is illuminated by the excitation beam and for imaging the received light on a detector, the imaging optics including a detection objective having an axis oriented in a second direction that is non-parallel to the first direction, wherein the signal light is generated though a non-linear signal generation process; and
a detector configured for detecting the signal light received by the imaging optics.
24. The microscope of claim 23 , further comprising beam scanning optics configured for scanning the Bessel-like beam in a direction having a component perpendicular to the first direction.
25. The microscope of claim 23 , wherein the Bessel-like beam has a ratio of a Rayleigh length, z R to a minimum beam waist, w o , of more than 2πw o /λ and less than 100πw o /λ.
26. The microscope of claim 23 , wherein the Bessel-like beam has a non-zero ratio of a minimum numerical aperture to a maximum numerical aperture of less than 0.95.
27. The microscope of claim 23 , wherein the Bessel-like beam has a non-zero ratio of a minimum numerical aperture to a maximum numerical aperture of less than 0.90.
28. The microscope of claim 23 , further comprising a coverslip that supports the sample, wherein a normal direction to a plane of the sample that supports the sample forms an angle with the first direction of more than 10 degrees and less than 80 degrees.
29. The microscope of claim 28 , wherein the sample is less than ten micrometers thick.
30. The microscope of claim 28 , wherein the angle is selected such that neither the excitation beam, nor the outgoing signal light, intercepts the coverslip.
31. The microscope of claim 28 , wherein the signal light has a wavelength of λ/2.
32. The microscope of claim 28 , wherein the signal light includes fluorescence light emitted from the sample after excitation by the Bessel-like beam.
33. The microscope of claim 28 , further comprising an annular mask in a path of the light beam configured to generate the annular ring of light from which the Bessel-like beam is formed.