Generation of simulated errors for high-level system validation

1. A device comprising:

logic operable to request information concerning an address of a storage, the requested information corresponding to original data of the storage; and

an integrated circuit operably coupled to the processor, the integrated circuit operable to:

intercept the original data,

virtualize an error in the original data by generating modified data, and

generate an interrupt according to the virtualized error.

2. The device of claim 1 , wherein the device comprises the storage.

3. The device of claim 1 , wherein the original data comprises an original read value.

4. The device of claim 1 , wherein the integrated circuit comprises modify logic coupled to the storage, the storage storing an original read value.

5. The device of claim 4 , wherein the modify logic is operable to modify the original read value by error data, thereby generating the modified data to virtualize the error in the original data.

6. The device of claim 1 , wherein the integrated circuit comprises selection logic operable to select either the modified data or the original data according to a comparison between a stored address data and a requested address.

7. The device of claim 1 , wherein the interrupt indicates that the modified data is selected.

8. The device of claim 1 , wherein the interrupt is delayed by a predetermined delay time.

9. The device of claim 1 , wherein the virtualized error in the original data is virtualized according to a location in a bit mask register.

10. The device of claim 1 , wherein the device comprises a register operable to store error data, wherein the modified data is generated based on the error data,

wherein the register is within a closed system and the error data of the register is programmable from outside the closed system.

11. A method comprising:

accessing an original data value from a storage;

intercepting the original data value by an integrated circuit;

virtualizing an error in the original data value by generating a modified data value; and

generating an interrupt according to the virtualized error.

12. The method of claim 11 , wherein virtualizing an error in the original data value comprises modifying the original data value by error data.

13. The method of claim 11 , wherein the method comprises selecting either the modified data value or the original data value according to a comparison between a stored address data and a requested address.

14. The method of claim 11 , wherein the interrupt indicates that the modified data value is selected.

15. The method of claim 11 , wherein the method comprises delaying the interrupt by a predetermined delay time.

16. The method of claim 11 , wherein the virtualized error in the original data value is virtualized according to a location in a bit mask register.

17. The method of claim 11 , wherein the modified data value is generated based on error data programmed from outside a closed system.

18. An integrated circuit comprising:

access logic operable to access an original data value from a storage;

intercept logic operable to intercept the original data value;

virtualization logic operable to virtualize an error in the original data value by producing a modified data value; and

interrupt logic operable to generate an interrupt according to the virtualized error.

19. The integrated circuit of claim 18 , wherein the virtualization logic is within a closed system, wherein the virtualization logic is operable to be programmed from outside the closed system.

20. The integrated circuit of claim 18 , wherein the interrupt logic is operable to delay the interrupt by a predetermined amount of time.