IP Library Granted Patent US 9,176,802
Granted Patent B2
US 9,176,802 · App. 14/236,338 · Granted Nov 3, 2015

Integrated circuit device and method of identifying a presence of a broken connection within an external signal path

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Quick Facts
Patent No.
US 9,176,802
App. No.
14/236,338
Granted
Nov 3, 2015
Kind
B2
Abstract

An integrated circuit device comprises at least one connectivity identification module. The at least one connectivity identification module is arranged to determine an initial sensed state of at least one external signal path of the integrated circuit device, cause the at least one external signal path to be pulled towards an opposing state to the initial sensed state therefor, determine a new sensed state of the at least one external signal path of the integrated circuit device, and identify a presence of a broken connection within the at least one external signal path, if the new sensed state of the at least one external signal path does not match the initial sensed state of the at least one external signal path.

Claims (30)

1. An integrated circuit device comprising:

at least one connectivity identification module; the at least one connectivity identification module being arranged to:

determine an initial sensed state of at least one external signal path of the integrated circuit device;

cause the state of the at least one external signal path to be pulled towards an opposed state relative to the initial sensed state therefor;

determine a new sensed state of the at least one external signal path of the integrated circuit device; and

identify a presence of a broken connection within the at least one external signal path, if the new sensed state of the at least one external signal path does not match the initial sensed state of the at least one external signal path.

2. The integrated circuit device of claim 1 wherein the at least one connectivity identification module is arranged to identify a presence of a broken connection within the at least one external signal path in a non-intrusive manner.

3. The integrated circuit device of claim 1 wherein the at least one connectivity identification module is arranged to determine a new sensed state of the at least one external signal path of the integrated circuit device after a known period ‘T’ from causing the at least one external signal path to be pulled towards an opposed state relative to the initial sensed state therefor.

4. The integrated circuit device of claim 3 , wherein the known period ‘T’ is identified by at least one from a group consisting of: a calculation, a measurement at an external device, a measurement at the actual device, and derived by a measurement from reference information from at least one of: a voltage value, a power value, a time value.

5. The integrated circuit device of claim 3 wherein the known period ‘T’ is greater than a period of time required to charge or discharge at least on-chip capacitances of the at least one external signal path.

6. The integrated circuit device of claim 3 wherein the known period ‘T’ is less than a period of time required to charge or discharge an aggregated capacitance comprising on-chip capacitances and at least one additional external capacitance of the at least one external signal path.

7. The integrated circuit device of claim 1 wherein the at least one connectivity identification module comprises or is operably coupled to a sensing element arranged to determine the new sensed state by way of a representation of a signal value at the external signal path including one of a group consisting of: a voltage state representation, and a power state representation.

8. The integrated circuit device of claim 1 wherein the at least one external signal path comprises at least one from a group consisting of: an input signal path; and an output signal path.

9. The integrated circuit device of claim 7 wherein the at least one connectivity identification module is further arranged to disable at least an internal driver coupled to the output signal path when causing the output signal path to be pulled towards an opposing state relative to the initial sensed state therefor.

10. The integrated circuit device of claim 1 wherein the integrated circuit device further comprises at least one pull up element selectively couplable to the at least one external signal path and arranged to pull the at least one external signal path to a first, ‘HIGH’ sensed state, and at least one pull down element selectively couplable to the at least one external signal path and arranged to pull the at least one external signal path to a second, ‘LOW’ state;

the connectivity identification module being arranged to cause the at least one external signal path to be pulled towards an opposed state relative to the initial sensed state therefor by selectively coupling the appropriate pull up or pull down element thereto.

11. The integrated circuit device of claim 1 wherein the at least one connectivity identification module is arranged to cause the at least one external signal path to be pulled towards an opposed state relative to the initial sensed state therefor in a sufficiently weak manner such that a sensed state of the at least one external signal path is only affected in absence of a driver driving the at least one external signal path.

12. The integrated circuit device of claim 10 further comprising at least one controllable switching element arranged to selectively couple the pull up or pull down elements to pull the at least one external signal path to a respective sensed state.

13. The integrated circuit device of claim 12 wherein the at least one controllable switching element is arranged to selectively couple the pull up or pull down elements to pull the at least one external signal path to a respective sensed state via at least one from a group consisting of: a configurable resistor or a configurable driver or a configurable supply.

14. The integrated circuit device of claim 12 wherein the at least one controllable switching element is arranged to selectively couple the pull up or pull down elements in response to a change in at least one environmental condition including one of a group consisting of: a change in supply voltage, a change in temperature, and a change in humidity.

15. A method of identifying a presence of a broken connection within an external signal path of an integrated circuit device, the method comprising:

determining an initial sensed state of at least one external signal path of the integrated circuit device;

causing the state of the at least one external signal path to be pulled towards an opposed state relative to the initial sensed state therefor;

determining a new sensed state of the at least one external signal path of the integrated circuit device after waiting for a known time; and

identifying a presence of a broken connection within the at least one external signal path, if the new sensed state of the at least one external signal path does not match the initial sensed state of the at least one external signal path.

16. A tangible computer program product having executable program code stored therein for identifying a presence of a broken connection within an external signal path of an integrated circuit device, the program code operable for:

determining an initial sensed state of at least one external signal path of the integrated circuit device;

causing the at least one external signal path to be pulled towards an opposed state relative to the initial state therefor;

determining a new sensed state of the at least one external signal path of the integrated circuit device for example after waiting for a known time; and

identifying a presence of a broken connection within the at least one external signal path, if the new sensed state of the at least one external signal path does not match the initial sensed state of the at least one external signal path.

Assignments (26)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 13, 2025
From: NXP USA, INC.
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED
Reel/Frame 072889/0939 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT APPLICATION NUMBERS 12222918, 14185362, 14147598, 14185868 & 14196276 PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0479. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded May 12, 2016
From: CITIBANK, NA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038665/0498 →
CORRECTIVE ASSIGNMENT TO CORRECT THE APPLICATION NUMBERS PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0438. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded May 12, 2016
From: CITIBANK, NA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038665/0136 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0438 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0479 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0763 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 032845/0522 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 032845/0497 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 032845/0442 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2014
From: ROHLEDER, MICHAEL; ADERHOLZ, ERNST; BRAUN, BERNHARD; DONNER, FRANK
To: FREESCALE SEMICONDUCTOR INC
Reel/Frame 032101/0028 →