INTEGRATED CIRCUIT WITH LBIST SUB-PARTITIONS
A Logic Built-In Self-Test (LBIST) domain of an integrated circuit is divided into partitions that in turn are subdivided into sub-partitions. Each sub-partition has an associated clock gating logic circuit that enables or inhibits the clock signal supplied to scan chains within the sub-partition. A user-defined number of sub-partitions, which can be specified on the basis of silicon results and power requirements of the integrated circuit, may be activated at any one time during a portion of an LBIST execution, which reduces toggling of concurrent scan chains, resulting in a reduction of energy consumption during testing, and reduces voltage droop due to inertia of power management control modules at the start of an LBIST test.
1 . An integrated circuit, comprising:
a Logic built-in self-test (LBIST) partition having a plurality of sub-partitions;
a controller, coupled to the LBIST partition, for providing control signals, wherein each of the sub-partitions receives the control signals; and
a power management module, coupled to to the controller, for generating a clock enable/inhibit signal and enabling clock signals to be provided to selected ones of the plurality of sub-partitions.
2 . The integrated circuit of claim 1 , wherein the control signals comprise scan signals and the sub-partitions each include scan chains for receiving the scan signals and a clock signal.
3 . The integrated circuit of claim 1 , wherein the selected ones of the plurality of sub-partitions are dynamically selected.
4 . The integrated circuit of claim 1 , further comprising:
a plurality of clock gating logic modules, each of the clock gating logic modules being associated with a respective one of the sub-partitions, for receiving the clock enable/inhibit signal from the power management module and a clock signal, and enabling or inhibiting the clock signal from reaching an associated sub-partition depending on the received enable/inhibit signal.
5 . An integrated circuit, comprising:
a Logic built-in self-test (LBIST) partition having a plurality of LBIST sub-partitions;
an LBIST controller coupled to the LBIST partition for providing control signals, wherein each of the sub-partitions receives the control signals;
an LBIST power management module coupled to the LBIST controller for providing a clock enable/inhibit signal for enabling clock signals provided to selected ones of the sub-partitions; and
a plurality of clock gating logic modules, each of the clock gating logic modules being associated with a respective one of the sub-partitions, for receiving the clock enable/inhibit signal from the LBIST power management module and a clock signal, and enabling or inhibiting the clock signal from reaching a sub-partition depending on the received enable/inhibit signal.
6 . A method for testing an LBIST partition of an integrated circuit, the method comprising:
dividing an LBIST partition into a plurality of LBIST sub-partitions;
providing control signals to each sub-partition; and
providing clock signals to selected ones of the plurality of sub-partitions.