Method to reduce CO
Described is a method of reducing CO 2 to CO using visible radiation and plasmonic photocatalysts. The method includes contacting CO 2 with a catalyst, in the presence of H 2 , wherein the catalyst has plasmonic photocatalytic reductive activity when exposed to radiation having a wavelength between 380 nm and 780 nm. The catalyst, CO 2 , and H 2 are exposed to non-coherent radiation having a wavelength between 380 nm and 780 nm such that the catalyst undergoes surface plasmon resonance. The surface plasmon resonance increases the rate of CO 2 reduction to CO as compared to the rate of CO 2 reduction to CO without surface plasmon resonance in the catalyst.
1. A method of reducing CO 2 to CO, the method comprising:
(a) contacting CO 2 with a catalyst, in the presence of H 2 , wherein the H 2 is present in a greater concentration than the CO 2 , wherein the catalyst has plasmonic photocatalytic reductive activity when exposed to radiation having a wavelength between about 380 nm and about 780 nm, and wherein the catalyst comprises a metallic element selected from the group consisting of calcium, copper, europium, gold, lithium, magnesium, palladium, platinum, potassium, silver, sodium, rubidium, and yttrium, and combinations thereof, has an average particle size no greater than 100 nm, and is deposited on an oxide semiconductor material; and
(b) exposing the catalyst, CO 2 , and H 2 to non-coherent radiation having a wavelength between about 380 nm and about 780 nm such that the catalyst undergoes surface plasmon resonance, wherein the surface plasmon resonance increases the rate of CO 2 reduction to CO as compared to the rate of CO 2 reduction to CO without surface plasmon resonance in the catalyst.
2. The method of claim 1 , comprising, in step (b), exposing the catalyst, CO 2 , and H 2 to solar radiation.
3. The method of claim 1 , wherein the oxide semiconductor material is selected from the group consisting of oxides of titanium, aluminum, iron, silicon, zinc, and cerium, and combinations thereof.
4. The method of claim 1 , wherein the metallic element comprises copper, silver, platinum, or gold, and the semiconductor material comprises titania or ceria.
5. The method according to any one of claim 1 , 2 , 3 , or 4 , wherein the surface plasmon resonance in the catalyst increases the rate of CO 2 reduction to CO by a factor of at least 1.8 as compared to the rate of CO 2 reduction to CO in the absence of surface plasmon resonance in the catalyst.
6. The method according to any one of claim 1 , 2 , 3 , or 4 , wherein the surface plasmon resonance in the catalyst increases the rate of CO 2 reduction to CO by a factor of at least 3 as compared to the rate of CO 2 reduction to CO in the absence of surface plasmon resonance in the catalyst.
7. The method according to any one of claim 1 , 2 , 3 , or 4 , wherein the surface plasmon resonance in the catalyst increases the rate of CO 2 reduction to CO by a factor of at least 4 as compared to the rate of CO 2 reduction to CO in the absence of surface plasmon resonance in the catalyst.
8. The method according to any one of claim 1 , 2 , 3 , or 4 , wherein the surface plasmon resonance in the catalyst increases the rate of CO 2 reduction to CO by a factor of at least 5 as compared to the rate of CO 2 reduction to CO in the absence of surface plasmon resonance in the catalyst.
9. A method of reducing CO 2 to CO, the method comprising:
(a) contacting CO 2 with a catalyst, in the presence of H 2 , wherein the H 2 is present in a greater concentration than the CO 2 , wherein the catalyst has plasmonic photocatalytic reductive activity when exposed to non-coherent radiation having a wavelength between about 380 nm and about 780 nm, and wherein the catalyst comprises a metallic element selected from the group consisting of calcium, copper, europium, gold, lithium, magnesium, palladium, platinum, potassium, silver, sodium, rubidium, and yttrium, and combinations thereof, has an average particle size no greater than 100 nm, and is deposited on an oxide semiconductor material; and
(b) exposing the catalyst, CO 2 , and H 2 to solar radiation such that the catalyst undergoes surface plasmon resonance, wherein the surface plasmon resonance increases the rate of CO 2 reduction to CO as compared to the rate of CO 2 reduction to CO without surface plasmon resonance in the catalyst.
10. The method of claim 9 , wherein upon exposing the catalyst, CO 2 , and H 2 to solar radiation, the catalyst achieves a light efficiency of at least about 2%.
11. The method of claim 9 , wherein upon exposing the catalyst, CO 2 , and H 2 to solar radiation, the catalyst achieves a solar light efficiency of at least about 3%.
12. The method of claim 9 , wherein upon exposing the catalyst, CO 2 , and H 2 to solar radiation, the catalyst achieves a solar light efficiency of at least about 4%.
13. The method of claim 9 , wherein the oxide semiconductor material is selected from the group consisting of oxides of titanium, aluminum, iron, silicon, zinc, and cerium, and combinations thereof.
14. The method of claim 9 , wherein the metallic element comprises copper, silver, platinum, or gold, and the semiconductor material comprises titania or ceria.
15. The method according to any one of claim 9 , 10 , 11 , 12 , 13 , or 14 , wherein the surface plasmon resonance in the catalyst increases the rate of CO 2 reduction to CO by a factor of at least 1.8 as compared to the rate of CO 2 reduction to CO in the absence of surface plasmon resonance in the catalyst.
16. The method according to any one of claim 9 , 10 , 11 , 12 , 13 , or 14 , wherein the surface plasmon resonance in the catalyst increases the rate of CO 2 reduction to CO by a factor of at least 3 as compared to the rate of CO 2 reduction to CO in the absence of surface plasmon resonance in the catalyst.
17. The method according to any one of claim 9 , 10 , 11 , 12 , 13 , or 14 , wherein the surface plasmon resonance in the catalyst increases the rate of CO 2 reduction to CO by a factor of at least 4 as compared to the rate of CO 2 reduction to CO in the absence of surface plasmon resonance in the catalyst.
18. The method according to any one of claim 9 , 10 , 11 , 12 , 13 , or 14 , wherein the surface plasmon resonance in the catalyst increases the rate of CO 2 reduction to CO by a factor of at least 5 as compared to the rate of CO 2 reduction to CO in the absence of surface plasmon resonance in the catalyst.
19. The method of any one of claim 9 , 10 , 11 , 12 , 13 , or 14 , wherein the method is conducted at a temperature of from about 100° C. to about 400° C., wherein H 2 is present in a greater concentration than CO 2 , and the H 2 and CO 2 are present at a pressure of from atmospheric to about 2000 psi.