Charge gradient microscopy

1. A method for rapid imaging of a material specimen, the method comprising:

positioning a tip to contact the material specimen;

applying a force to a surface of the material specimen via the tip;

moving the tip across the surface of the material specimen while removing or depositing electrical charge therefrom;

generating a signal produced by contact between the tip and the surface;

detecting, based on data from the signal, the removed electrical charge induced through the tip during movement of the tip across the surface, and

measuring the detected electrical charge,

wherein removing the electrical charge from the surface of the material specimen comprises scraping the material specimen while moving the tip across the surface.

2. The method of claim 1 , wherein moving the tip comprises scanning the material specimen at a scan frequency between 5-30 Hz.

3. The method of claim 1 , wherein the electrical charge comprises at least one of a displacement element, a piezoelectric charge flow element, and a relocated element.

4. The method of claim 1 , wherein the tip comprises a coating of at least one of platinum or diamond.

5. The method of claim 1 , wherein the material specimen is a ferroelectric or piezoelectric material.

6. The method of claim 1 , wherein the electrical charge is collected without application of an external bias.

7. The method of claim 1 , wherein the electrical charge is removed without altering polarization charges in the material specimen.

8. A device for rapid imaging of a material specimen, the device comprising:

an apparatus configured to store the material specimen;

a probing mechanism comprising a tip configured to:

come into contact with a surface of the specimen, generating a force thereon, and

remove charges from the surface by movement of the tip across the surface by scraping the charges from the surface of the specimen, and

a measurement unit configured to measure the removed charges,

wherein the tip comprises a coating of at least one of platinum or diamond.

9. The device of claim 8 , wherein the probing mechanism is configured to be operable at a scan frequency between 5-30 Hz.

10. The device of claim 8 , wherein the material specimen is a ferroelectric or piezoelectric material.

11. The device of claim 8 , wherein the measurement unit is configured to measure electric polarization beneath the surface of the material specimen.

12. The device of claim 8 , wherein the charge is collected without application of an external bias.

13. The device of claim 8 , wherein a difference between a maximum current and a minimum current correlates linearly to a frequency at which the material specimen is scanned.

14. The device of claim 8 , wherein the tip is configured to impart a mechanical impression on the material specimen.