IP Library Granted Patent US 9,310,409
Granted Patent B2
US 9,310,409 · App. 14/282,152 · Granted Apr 12, 2016

Capacitance-to-voltage interface circuits

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Quick Facts
Patent No.
US 9,310,409
App. No.
14/282,152
Granted
Apr 12, 2016
Kind
B2
Abstract

A capacitance-to-voltage interface circuit is utilized to obtain a voltage corresponding to a detected capacitance differential, which may be associated with the operation of a capacitive sensing cell. The interface circuit includes a capacitive sensing cell, an operational amplifier adapted for selective coupling to the capacitive sensing cell, a feedback capacitor for the operational amplifier, a load capacitor for the operational amplifier, and a switching architecture associated with the capacitive sensing cell, the operational amplifier, the feedback capacitor, and the load capacitor. During use, the switching architecture reconfigures the capacitance-to-voltage interface circuit for operation in a plurality of different phases. The different operational phases enable the single operational amplifier to be used for both capacitance-to-voltage conversion and voltage amplification.

Claims (145)

1. A capacitance-to-voltage interface circuit comprising:

a capacitive sensing cell having a first sensing capacitor coupled in series with a second sensing capacitor;

an operational amplifier adapted for selective coupling to the capacitive sensing cell and having an inverting input node and a noninverting input node that receives a reference voltage;

an offset capacitor coupled between the inverting input node and a feedback node;

a first feedback capacitor coupled to the feedback node;

a second feedback capacitor coupled to the feedback node;

a first load capacitor for the operational amplifier; and

a second load capacitor for the operational amplifier;

wherein the capacitance-to-voltage interface circuit is configurable into a plurality of configurations in which:

when the capacitive sensing cell, the operational amplifier, the offset capacitor, the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor are arranged into a reset configuration to reset the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor to respective initial voltages, the capacitive sensing cell is disconnected from the operational amplifier;

when the capacitive sensing cell, the operational amplifier, the offset capacitor, the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor are thereafter switched from the reset configuration into an initial capacitance-to-voltage configuration, the capacitive sensing cell is connected to the operational amplifier;

when the capacitive sensing cell, the operational amplifier, the offset capacitor, the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor are thereafter switched from the initial capacitance-to-voltage configuration into a final capacitance-to-voltage configuration, a measured output voltage of the operational amplifier that is indicative of a measured difference in capacitance of the capacitive sensing cell is obtained; and

when the capacitive sensing cell, the operational amplifier, the offset capacitor, the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor are thereafter switched from the final capacitance-to-voltage configuration into an amplification topology, the measured output voltage of the operational amplifier is amplified into an output voltage.

2. The circuit of claim 1 , further comprising:

an analog-to-digital converter configured to perform an analog-to-digital conversion on the output voltage.

3. The circuit of claim 1 , wherein:

the capacitive sensing cell comprises a first sensor voltage node associated with the first sensing capacitor, a second sensor voltage node associated with the second sensing capacitor, and a common node shared by the first sensing capacitor and the second sensing capacitor;

the operational amplifier has an output node; and

when arranged in the reset configuration:

the common node of the capacitive sensing cell is disconnected from the feedback node;

an excitation voltage is applied to the first sensor voltage node;

the reference voltage is applied to the common node;

analog ground is established at the second sensor voltage node;

the first feedback capacitor is connected between the feedback node and the reference voltage;

the second feedback capacitor is connected between the feedback node and the reference voltage;

the inverting input node is connected to the output node;

the first load capacitor is connected between the output node and the reference voltage; and

the reference voltage is connected across the second load capacitor.

4. The circuit of claim 1 , wherein:

the capacitive sensing cell comprises a first sensor voltage node associated with the first sensing capacitor, a second sensor voltage node associated with the second sensing capacitor, and a common node shared by the first sensing capacitor and the second sensing capacitor;

the operational amplifier has an output node; and

when arranged in the initial capacitance-to-voltage configuration:

the common node of the capacitive sensing cell is connected to the feedback node;

an excitation voltage is applied to the first sensor voltage node;

the reference voltage is applied to the common node and to the feedback node;

analog ground is established at the second sensor voltage node;

the first feedback capacitor is connected between the feedback node and the reference voltage;

the second feedback capacitor is connected between the feedback node and the reference voltage;

the inverting input node is connected to the output node;

the first load capacitor is connected between the output node and the reference voltage; and

the reference voltage is connected across the second load capacitor.

5. The circuit of claim 1 , wherein:

the capacitive sensing cell comprises a first sensor voltage node associated with the first sensing capacitor, a second sensor voltage node associated with the second sensing capacitor, and a common node shared by the first sensing capacitor and the second sensing capacitor;

the operational amplifier has an output node; and

when arranged in the final capacitance-to-voltage configuration:

the common node of the capacitive sensing cell is connected to the feedback node;

analog ground is established at the first sensor voltage node;

the reference voltage is applied to the second sensor voltage node;

the first feedback capacitor is connected between the feedback node and the output node;

the second feedback capacitor is connected between the feedback node and the reference voltage;

the first load capacitor is connected between the output node and the reference voltage; and

the reference voltage is connected across the second load capacitor.

6. The circuit of claim 1 , wherein:

the capacitive sensing cell comprises a common node shared by the first sensing capacitor and the second sensing capacitor;

the operational amplifier has an output node; and

the capacitive sensing cell, the operational amplifier, the offset capacitor, the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor are configurable in an initial amplification configuration in which:

the common node of the capacitive sensing cell is disconnected from the feedback node;

the first feedback capacitor is connected between the feedback node and the output node;

the second feedback capacitor is connected between the feedback node and the reference voltage;

the first load capacitor is connected between the feedback node and the reference voltage; and

the second load capacitor is connected between the output node and the reference voltage.

7. The circuit of claim 1 , wherein:

the capacitive sensing cell comprises a common node shared by the first sensing capacitor and the second sensing capacitor;

the operational amplifier has an output node; and

the capacitive sensing cell, the operational amplifier, the offset capacitor, the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor are configurable in a final amplification configuration in which:

the common node of the capacitive sensing cell is disconnected from the feedback node;

an offset voltage is applied to the feedback node;

the second feedback capacitor is connected between the feedback node and the output node;

the reference voltage is connected across the first load capacitor; and

the second load capacitor is connected between the feedback node and the reference voltage.

8. The circuit of claim 1 , further comprising a switching architecture associated with the capacitive sensing cell, the operational amplifier, the offset capacitor, the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor.

9. The circuit of claim 8 , wherein the switching architecture reconfigures the circuit for operation in the reset configuration, the initial capacitance-to-voltage configuration, the final capacitance-to-voltage configuration, and the amplification topology such that the operational amplifier is used for capacitance-to-voltage conversion and for voltage amplification.

10. A capacitance-to-voltage interface circuit comprising:

a capacitive sensing cell having a first sensing capacitor coupled in series with a second sensing capacitor;

an operational amplifier having an inverting input node and a noninverting input node that receives a reference voltage;

an offset capacitor coupled between the inverting input node and a feedback node;

a first feedback capacitor coupled to the feedback node;

a second feedback capacitor coupled to the feedback node;

a first load capacitor;

a second load capacitor; and

a switching architecture associated with the capacitive sensing cell, the operational amplifier, the offset capacitor, the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor, wherein the switching architecture operates to arrange the capacitance-to-voltage interface circuit into a plurality of configurations, including:

a reset configuration to reset the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor to respective initial voltages, wherein the capacitive sensing cell is disconnected from the operational amplifier when the capacitance-to-voltage interface circuit is arranged in the reset configuration;

an initial capacitance-to-voltage configuration, wherein the capacitive sensing cell is connected to the operational amplifier when the capacitance-to-voltage interface circuit is arranged in the initial capacitance-to-voltage configuration;

a final capacitance-to-voltage configuration, wherein a measured output voltage of the operational amplifier that is indicative of a measured difference in capacitance of the capacitive sensing cell is obtained when the capacitance-to-voltage interface circuit is arranged in the final capacitance-to-voltage configuration; and

an amplification topology, wherein the measured output voltage of the operational amplifier is amplified into an output voltage when the capacitance-to-voltage interface circuit is arranged in the amplification topology.

11. The circuit of claim 10 , wherein the switching architecture operates to initialize the capacitance-to-voltage interface circuit by arranging the capacitance-to-voltage interface circuit into the reset configuration.

12. The circuit of claim 11 , wherein the switching architecture operates to transition the capacitance-to-voltage interface circuit from the reset configuration to the initial capacitance-to-voltage configuration.

13. The circuit of claim 12 , wherein the switching architecture operates to transition the capacitance-to-voltage interface circuit from the initial capacitance-to-voltage configuration to the final capacitance-to-voltage configuration.

14. The circuit of claim 13 , wherein the switching architecture operates to transition the capacitance-to-voltage interface circuit from the final capacitance-to-voltage configuration to an initial amplification topology.

15. The circuit of claim 14 , wherein the switching architecture operates to transition the capacitance-to-voltage interface circuit from the initial amplification topology to a final amplification topology.

16. The circuit of claim 10 , wherein:

the capacitive sensing cell comprises a first sensor voltage node associated with the first sensing capacitor, a second sensor voltage node associated with the second sensing capacitor, and a common node shared by the first sensing capacitor and the second sensing capacitor;

the operational amplifier has an output node; and

when arranged in the reset configuration:

the common node of the capacitive sensing cell is disconnected from the feedback node;

an excitation voltage is applied to the first sensor voltage node;

the reference voltage is applied to the common node;

analog ground is established at the second sensor voltage node;

the first feedback capacitor is connected between the feedback node and the reference voltage;

the second feedback capacitor is connected between the feedback node and the reference voltage;

the inverting input node is connected to the output node;

the first load capacitor is connected between the output node and the reference voltage; and

the reference voltage is connected across the second load capacitor.

17. The circuit of claim 10 , wherein:

the capacitive sensing cell comprises a first sensor voltage node associated with the first sensing capacitor, a second sensor voltage node associated with the second sensing capacitor, and a common node shared by the first sensing capacitor and the second sensing capacitor;

the operational amplifier has an output node; and

when arranged in the initial capacitance-to-voltage configuration:

the common node of the capacitive sensing cell is connected to the feedback node;

an excitation voltage is applied to the first sensor voltage node;

the reference voltage is applied to the common node and to the feedback node;

analog ground is established at the second sensor voltage node;

the first feedback capacitor is connected between the feedback node and the reference voltage;

the second feedback capacitor is connected between the feedback node and the reference voltage;

the inverting input node is connected to the output node;

the first load capacitor is connected between the output node and the reference voltage; and

the reference voltage is connected across the second load capacitor.

18. The circuit of claim 10 , wherein:

the capacitive sensing cell comprises a first sensor voltage node associated with the first sensing capacitor, a second sensor voltage node associated with the second sensing capacitor, and a common node shared by the first sensing capacitor and the second sensing capacitor;

the operational amplifier has an output node; and

when arranged in the final capacitance-to-voltage configuration:

the common node of the capacitive sensing cell is connected to the feedback node;

analog ground is established at the first sensor voltage node;

the reference voltage is applied to the second sensor voltage node;

the first feedback capacitor is connected between the feedback node and the output node;

the second feedback capacitor is connected between the feedback node and the reference voltage;

the first load capacitor is connected between the output node and the reference voltage; and

the reference voltage is connected across the second load capacitor.

19. The circuit of claim 10 , wherein:

the capacitive sensing cell comprises a common node shared by the first sensing capacitor and the second sensing capacitor;

the operational amplifier has an output node; and

the capacitive sensing cell, the operational amplifier, the offset capacitor, the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor are configurable in an initial amplification configuration in which:

the common node of the capacitive sensing cell is disconnected from the feedback node;

the first feedback capacitor is connected between the feedback node and the output node;

the second feedback capacitor is connected between the feedback node and the reference voltage;

the first load capacitor is connected between the feedback node and the reference voltage; and

the second load capacitor is connected between the output node and the reference voltage.

20. The circuit of claim 10 , wherein:

the capacitive sensing cell comprises a common node shared by the first sensing capacitor and the second sensing capacitor;

the operational amplifier has an output node; and

the capacitive sensing cell, the operational amplifier, the offset capacitor, the first feedback capacitor, the second feedback capacitor, the first load capacitor, and the second load capacitor are configurable in a final amplification configuration in which:

the common node of the capacitive sensing cell is disconnected from the feedback node;

an offset voltage is applied to the feedback node;

the second feedback capacitor is connected between the feedback node and the output node;

the reference voltage is connected across the first load capacitor; and

the second load capacitor is connected between the feedback node and the reference voltage.

Assignments (17)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
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From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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From: CITIBANK, N.A.
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