IP Library Granted Patent US 9,312,369
Granted Patent B2
US 9,312,369 · App. 14/295,377 · Granted Apr 12, 2016

Bipolar transistor structure and a method of manufacturing a bipolar transistor structure

Inventors: Dmitri Alex Tschumakow (Dresden, DE); Claus Dahl (Dresden, DE); Armin Tilke (Dresden, DE)
Assignee: INFINEON TECHNOLOGIES DRESDEN GMBH
H01L29/732H01L29/41708H01L29/42304H01L29/66287
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,312,369
App. No.
14/295,377
Granted
Apr 12, 2016
Kind
B2
Abstract

According to various embodiments, a bipolar transistor structure may include: a substrate; a collector region in the substrate; a base region disposed over the collector region, an emitter region disposed over the base region; a base terminal laterally electrically contacting the base region, wherein the base terminal includes polysilicon.

Claims (20)

1. A bipolar transistor structure comprising:

a substrate;

a collector region in the substrate;

a base region disposed over the collector region;

an emitter region disposed over the base region; and

a base terminal laterally electrically contacting the base region, wherein the base terminal comprises polysilicon; and

a dielectric layer structure disposed between the substrate and the base terminal so that substantially all of a surface of the base terminal facing the substrate is disposed on the dielectric layer structure.

2. The bipolar transistor structure of claim 1 ,

wherein the substrate comprises a silicon.

3. The bipolar transistor structure of claim 1 ,

wherein the collector region and the emitter region comprise silicon doped with a first doping type, and

wherein the base region comprises silicon doped with a second doping type different from the first doping type.

4. The bipolar transistor structure of claim 3 ,

wherein the base terminal comprises silicon doped with the second doping type.

5. The bipolar transistor structure of claim 1 ,

wherein the base region comprises at least one material of the following group of materials, the group consisting of:

epitaxially grown silicon; and

an epitaxially grown silicon/germanium alloy.

6. The bipolar transistor structure of claim 1 , further comprising:

a dielectric isolation structure arranged in the substrate next to the collector region.

Assignments (2)
CHANGE OF NAME Recorded Jun 12, 2024
From: INFINEON TECHNOLOGIES DRESDEN GMBH
To: INFINEON TECHNOLOGIES DRESDEN GMBH & CO. KG
Reel/Frame 067699/0648 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 16, 2014
From: TSCHUMAKOW, DMITRI ALEX; DAHL, CLAUS; TILKE, ARMIN
To: INFINEON TECHNOLOGIES DRESDEN GMBH
Reel/Frame 033105/0130 →
Continuity (1)
Related Publication 20150357446A1 · Dec 10, 2015