PROBE CARD FOR TESTING SEMICONDUCTOR WAFERS
A probe card is disclosed. The probe card includes a top plate, a disc, a removable plate and multiple micro probes. One of the micro probes includes a curved segment and a linear segment connected to each other at an angle stop. The linear segment is shorter than the curved segment. The top plate includes a set of holes formed therein, and one of the holes is configured to receive the curved segment of the micro probe. The disc includes a set of holes formed therein, and one of the holes is configured to receive the linear segment of the micro probe at the angle stop. The removable plate is removably connected to the disc, and the removable plate includes a set of holes formed therein, wherein one of the holes is configured to receive the linear segment of the micro probe.
1 . A probe card comprising:
a plurality of micro probes, wherein one of said micro probes includes a curved segment and a linear segment connected to each other at an angle stop, wherein said linear segment is shorter than said curved segment;
a top plate having a plurality of holes formed therein, wherein one of said holes is configured to receive said curved segment of said one micro probe;
a disc having a plurality of holes formed therein, wherein one of said holes is configured to receive said linear segment of said one micro probe at said angle stop; and
a removable plate removably connected to said disc, wherein said removable plate includes a plurality of holes formed therein, wherein one of said holes is configured to receive said linear segment of said one micro probe.
2 . The probe card of claim 1 , wherein said curved segment includes a first contact tip configured to provide electrical contact to an electronic test circuitry, wherein said linear segment includes a second contact tip configured to provide electrical contact to a solder bump on a semiconductor wafer.
3 . The probe card of claim 1 , wherein said curved and linear segments have a uniform thickness.
4 . The probe card of claim 1 , wherein said curved region is in a bowed shape.
5 . The probe card of claim 1 , wherein said angle stop is an obtuse angle.
6 . The probe card of claim 1 , wherein said angle stop forms a sharp bend.
7 . The probe card of claim 1 , wherein said micro probe is made of a single piece of material.