Vertical gate NAND memory devices

1. A device comprising:

a vertical stack of a plurality of memory cells, wherein a first memory cell of the plurality of memory cells comprises a plurality of memory elements arranged in a single layer of the vertical stack;

a first vertical gate line coupled to a first-memory element of the plurality of memory elements in the first memory cell; and

a second vertical gate line coupled to a second memory element of the plurality of memory elements in the first memory cell, wherein the first vertical gate line is electrically isolated from the second vertical gate line, and wherein the first memory element is electrically isolated from the second memory element by a horizontal insulation structure to store a different data state than the second memory element.

2. The device of claim 1 , wherein the first memory element is separately accessible from the second memory element in the first memory cell.

3. The device of claim 1 further comprising:

a first word line positioned above the vertical stack of memory cells and perpendicular to the first vertical gate line, wherein the first word line is electrically coupled to the first vertical gate line; and

a second word line positioned below the vertical stack of memory cells and perpendicular to the second vertical gate line, wherein the second word line is electrically coupled to the second vertical gate line.

4. The device of claim 1 , further comprising an array of vertical stacks including and similar to said vertical stack, wherein the memory cells in the array are configured to form memory strings, each comprising electrically connected memory cells from a row of vertical stacks of memory cells, and wherein, during a memory access operation on a selected one of the memory strings, any unselected memory cells in the selected memory string have their respective memory elements turned on by voltages on vertical gate lines coupled to the unselected memory cells.

5. The device of claim 4 , wherein, during the memory access operation on the selected memory string, a selected memory cell in the memory string is configured to have an unselected memory element turned off and a selected memory element set to a memory access voltage by voltages on vertical gate lines coupled to the respective memory elements of the selected memory cell.

6. A device comprising:

a vertical stack of a plurality of memory cells, wherein a first memory cell of the plurality of memory cells comprises a plurality of memory elements arranged in a single layer of the vertical stack and a horizontal insulation structure between the plurality of memory elements in the single layer to electrically isolate a first memory element of the plurality of memory elements in the first memory cell from a second memory element of the plurality of memory elements in the first memory cell; and

a plurality of vertical gate lines, each coupled to corresponding ones of the plurality of memory elements in the first memory cell.

7. The device of claim 6 , wherein the plurality of vertical gate lines comprise first and second vertical gate lines electrically isolated from each other.

8. The device of claim 7 further comprising:

a first word line positioned above the vertical stack of memory cells, wherein the first word line is electrically coupled to the first vertical gate line; and

a second word line positioned below the vertical stack of memory cells, wherein the second word line is electrically coupled to the second vertical gate line.

9. The device of claim 6 , wherein the plurality of memory elements are configured to store respective data states.

10. The device of claim 6 , wherein the first memory element is separately accessible from the second memory element.