IP Library › Granted Patent US 9,548,200
Granted Patent B2
US 9,548,200 · App. 14/322,484 · Granted Jan 17, 2017

Variable frequency microwave (VFM) processes and applications in semiconductor thin film fabrications

Inventors: Loke Yuen Wong (Singapore, SG); Ke Chang (Singapore, SG); Yueh Sheng Ow (Singapore, SG); Ananthkrishna Jupudi (Milpitas, CA); Glen T. Mori (Gilroy, CA); Aksel Kitowski (Singapore, SG); Arkajit Roy Barman (Singapore, SG)
Assignee: APPLIED MATERIALS, INC.
H01L21/02345H01L21/0234H01L21/02118H01L21/31058H01L21/67115
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Quick Facts
Patent No.
US 9,548,200
App. No.
14/322,484
Granted
Jan 17, 2017
Kind
B2
Abstract

Methods and apparatus for processing a substrate are described herein. A vacuum multi-chamber deposition tool can include a degas chamber with both a heating mechanism and a variable frequency microwave source. The methods described herein use variable frequency microwave radiation to increased quality and speed of the degas process without damaging the various components.

Claims (39)

1. A method for processing a substrate, comprising:

positioning a substrate in a physical vapor deposition chamber, the substrate comprising a first surface;

depositing an uncured layer comprising a polymer, an epoxy or combinations thereof over the first surface of the substrate; and

performing a hard-cure of the uncured layer in the physical vapor deposition chamber, the hard-cure comprising:

heating at least the uncured layer to a degas temperature ranging from about 85 degrees Celsius to about 95 degrees Celsius, the degas temperature being less than a hard-cure temperature for the uncured layer;

setting the physical vapor deposition chamber to a hard-cure pressure, the hard-cure pressure being under 100 mTorr;

directing a source of microwave radiation toward the uncured layer, the source of microwave radiation producing microwave radiation at a frequency selected from a frequency range of less than 7 GHz; and

delivering the microwave radiation at a variable frequency from the source of microwave radiation to the uncured layer to heat the uncured layer to the hard-cure temperature, the variable frequency comprising two or more frequencies selected from the frequency range, the variable frequency changing over a period of time, wherein the degas temperature, the hard-cure pressure and the microwave radiation act in conjunction to produce a cured and degassed layer.

2. The method of claim 1 , wherein the hard-cure temperature is between 300° C. and 400° C.

3. The method of claim 1 , further comprising depositing a seed layer.

4. The method of claim 1 , wherein the hard-cure pressure is less than 1 mTorr.

5. The method of claim 1 , wherein the frequency range is from 5850 MHz to 6650 MHz.

6. The method of claim 1 , wherein the variable frequency comprises two or more frequencies, each frequency varying from a previous frequency by from 200 MHz to 280 MHz.

7. The method of claim 1 , wherein the period of time is between 6 minutes and 10 minutes.

8. The method of claim 1 , wherein the variable frequency change occurs during the period of time in a time interval of from 20 microseconds to 30 microseconds.

9. The method of claim 1 , further comprising flowing an inert gas into the physical vapor deposition chamber to clear the physical vapor deposition chamber of outgassed substances.

10. A method for processing a substrate, comprising:

positioning a substrate in a physical vapor deposition chamber, the substrate comprising a first surface;

depositing an uncured layer comprising a polymer, an epoxy, or combinations thereof over the first surface of the substrate; and

performing a hard-cure of the uncured layer in the physical vapor deposition chamber, the hard-cure comprising:

heating at least the uncured layer to a degas temperature ranging from about 85 degrees Celsius to about 95 degrees Celsius, the degas temperature being less than a hard-cure temperature for the uncured layer;

setting the physical vapor deposition chamber to a hard-cure pressure, the hard-cure pressure being under 100 mTorr;

directing a source of microwave radiation toward the uncured layer, the source of microwave radiation producing microwave radiation at a frequency selected from a frequency range of less than 7 GHz; and

delivering the microwave radiation at a variable frequency from the source of microwave radiation to the uncured layer to heat the uncured layer to the hard-cure temperature, the variable frequency comprising two or more frequencies selected from the frequency range, the variable frequency changing over a period of time, wherein each of the two or more frequencies varying from a previous frequency by from 200 MHz to 280 MHz, and wherein the degas temperature, the hard-cure pressure and the microwave radiation act in conjunction to produce a cured and degassed layer.

11. The method of claim 10 , wherein the hard-cure temperature is between 300° C. and 400° C.

12. The method of claim 10 , further comprising depositing a seed layer.

13. The method of claim 10 , wherein the hard-cure pressure is less than 1 mTorr.

14. The method of claim 10 , wherein the frequency range is from 5850 MHz to 6650 MHz.

15. The method of claim 10 , wherein the period of time is between 6 minutes and 10 minutes.

16. The method of claim 10 , wherein the variable frequency change occurs during the period of time in a time interval of from 20 microseconds to 30 microseconds.

17. The method of claim 10 , further comprising flowing an inert gas into the physical vapor deposition chamber to clear the physical vapor deposition chamber of outgassed substances.

18. A method for processing a substrate, comprising:

positioning a substrate in a physical vapor deposition chamber, the substrate comprising a first surface;

depositing an uncured layer comprising a polymer, an epoxy or combinations thereof over the first surface of the substrate; and

performing a hard-cure of the uncured layer in the physical vapor deposition chamber, the hard-cure comprising:

heating at least the uncured layer to a degas temperature ranging from about 85 degrees Celsius to about 95 degrees Celsius, the degas temperature being less than a hard-cure temperature for the uncured layer;

setting the physical vapor deposition chamber to a hard-cure pressure, the hard-cure pressure being under 100 mTorr;

directing a source of microwave radiation toward the uncured layer, the source of microwave radiation producing microwave radiation at a frequency selected from a frequency range of less than 7 GHz; and

delivering the microwave radiation at a variable frequency from the source of microwave radiation to the uncured layer to heat the uncured layer to the hard-cure temperature, the variable frequency comprising two or more frequencies selected from the frequency range, the variable frequency changing over a period of time, the variable frequency comprising two or more frequencies, each of the two or more frequencies varying from a previous frequency by from 200 MHz to 280 MHz, wherein the variable frequency change occurs during the period of time in a time interval of from 20 microseconds to 30 microseconds, and wherein the degas temperature, the hard-cure pressure and the microwave radiation act in conjunction to produce a cured and degassed layer.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT SERIAL NUMBER 14/322,848 PREVIOUSLY RECORDED ON REEL 038000 FRAME 0377. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT SHOULD HAVE BEEN FILED UNDER SERIAL NUMBER 14/322,484. Recorded Sep 9, 2016
From: WONG, LOKE YUEN; CHANG, KE; OW, YUEH SHENG; JUPUDI, ANANTHKRISHNA; MORI, GLEN T.; KITOWSKI, AKSEL; BARMAN, ARKAJIT ROY
To: APPLIED MATERIALS, INC.
Reel/Frame 039973/0242 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2016
From: WONG, LOKE YUEN; CHANG, KE; OW, YUEH SHENG; JUPUDI, ANANTHKRISHNA; MORI, GLEN T; KITOWSKI, AKSEL; BARMAN, ARKAJIT ROY
To: APPLIED MATERIALS, INC.
Reel/Frame 038000/0377 →
Continuity (3)
Provisional Application 61868108 · Aug 21, 2013
Provisional Application 61868110 · Aug 21, 2013
Related Publication 20150056819A1 · Feb 26, 2015