Semiconductor chip and semiconductor package having the same

1. A semiconductor chip, comprising:

a semiconductor substrate having a front surface, a circuit unit formed within the semiconductor substrate and extending from the front surface into the semiconductor substrate, and a rear surface opposite the front surface, wherein the semiconductor substrate is divided into a main region and a peripheral region surrounding the main region, wherein the circuit unit is disposed in the main region, wherein the circuit unit comprise a semiconductor memory device and a semiconductor logic device; and

a girder beam formed within a portion of the semiconductor substrate outside of the circuit unit,

wherein the girder beam comprises:

longitudinal girders formed within the semiconductor substrate and extending in a longitudinal direction of the peripheral region; and

lateral girders formed within the semiconductor substrate and connecting side walls of the longitudinal girders,

wherein the longitudinal girder beam comprises:

first longitudinal girders disposed in the peripheral region and extending in a longitudinal direction of the peripheral region; and

second longitudinal girders disposed in the main region and extending in a direction parallel to the first longitudinal girders, and

wherein the lateral girder beam comprises:

first lateral girders disposed in the peripheral region and connecting side walls of the first longitudinal girders; and

second lateral girders disposed in the main region and connecting side walls of the second longitudinal girders.

2. The semiconductor chip of claim 1 , further comprising

an insulating film formed over the front surface of the semiconductor substrate;

at least one bonding pad formed over the insulating film in the peripheral region and electrically coupled with the circuit unit; and

a guard ring disposed in the insulating film in the peripheral region.

3. The semiconductor chip of claim 1 , wherein the longitudinal girders extend from the rear surface to the front surface.

4. The semiconductor chip of claim 1 , wherein the longitudinal girders have a height that is greater than the height of the lateral girders.

5. The semiconductor chip of claim 4 , wherein the longitudinal girders have a height ranging from approximately 1.5 to approximately 2.5 times greater than the height of the lateral girders.

6. The semiconductor chip of claim 1 , wherein the second longitudinal girders extend from the rear surface of the semiconductor substrate partially into the semiconductor substrate and do not reach the circuit unit.

7. The semiconductor chip of claim 1 , wherein the first longitudinal girders have the same height as the height of the second longitudinal girders.

8. The semiconductor chip of claim 1 , wherein the first longitudinal girders extend from the rear surface to the front surface.

9. The semiconductor chip of claim 1 , wherein the first longitudinal girders have a height that is greater than the height of the first lateral girders.

10. The semiconductor chip of claim 9 , wherein the first longitudinal girders have a height ranging from approximately 1.5 to approximately 2.5 times greater than the height of the first lateral girders.

11. The semiconductor chip of claim 1 , wherein the second longitudinal girders have a height that is greater than the height of the second lateral girders.

12. The semiconductor chip of claim 11 , wherein the second longitudinal girders have a height ranging from approximately 1.5 to approximately 2.5 times greater than the height of the second lateral girders.

13. The semiconductor chip of claim 1 , wherein the girder beam is formed of a material having a modulus that is larger than that of the semiconductor substrate.

14. The semiconductor chip of claim 13 , wherein the semiconductor substrate includes silicon and the girder beam includes at least one of tungsten and graphene.