SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE PROFILES WITH COAXIAL SOCKET

1 . A thermal control unit (TCU) is used in association with an IC tester. The TCU is configured to maintain a set point temperature on an IC device under test (DUT) and operatively coupled to a test socket assembly. The TCU comprises;

a pedestal assembly with a heat-conductive pedestal having a bottom end configured to contact the die of the DUT;

a temperature-control fluid circulation block;

a thermally-conductive heater having a fuse coupled to a heating element;

a substrate pusher configured to contact the substrate of the DUT; and

a controllable force distributor for receiving a force and controllably distribute such force between the pedestal assembly and the substrate pusher.

2 . A coaxial test socket assembly useful in association with an integrated circuit (IC) device tester, the coaxial socket assembly comprising:

a socket contactor frame with an opening configured to accommodate an IC device under test (DUT);

a heat transfer plate made of a material having high thermal conductivity;

an array of coaxial pins having good thermal conductivity and good electrical signal transmission is configured to contact the DUT. The coaxial pin comprises:

a spring-loaded metallic plunger

a metallic barrel wherein the spring-loaded metallic plunger can move inside the metallic barrel under the poll or push of the spring;

an insulating layer surrounding the metallic barrel;

a socket base hosting the top part of the array of coaxial pins;

a socket bottom hosting the bottom part of the array of coaxial pins.

3 . The coaxial pin of claim 2 is configured to efficiently transfer heat to the IC device under test.

4 . The coaxial pin of claim 2 is configured to efficiently transfer electrical signals to the IC device under test.

5 . The coaxial pin of claim 2 , wherein the insulating layer is air or a dielectric material.

6 . The coaxial pin of claim 2 , wherein the dimensions of its constituent components and dielectric properties of the insulating layer are chosen to achieve electrical impedance value of the coaxial pins suitable for good signal transmission and allowing testing of high-frequency IC configured to operate at approximately 20 GHz and above.

7 . The coaxial pin of claim 2 , wherein the electrical impedance value of the coaxial pin matches the electrical impedance value of the device under test.

8 . The coaxial pin of claim 2 , wherein the electrical impedance value of the coaxial pin is approximately 50 Ohms.