IP Library Granted Patent US 9,318,339
Granted Patent B2
US 9,318,339 · App. 14/347,637 · Granted Apr 19, 2016

Polishing slurry and polishing method

Inventors: Ryuichi Sato (Saitama, JP); Yohei Maruyama (Saitama, JP); Atsushi Koike (Saitama, JP)
Assignee: MITSUI MINING & SMELTING, LTD
H01L21/30625B24B37/044C09G1/02C09K3/1409C09K3/1463H01L21/02024H01L21/02527H01L29/1608H01L29/2003
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Quick Facts
Patent No.
US 9,318,339
App. No.
14/347,637
Granted
Apr 19, 2016
Kind
B2
Abstract

The present invention provides a polishing slurry capable of polishing even high-hardness materials such as silicon carbide and gallium nitride at a high polishing speed. The present invention is a polishing slurry including a slurry containing a manganese oxide particle and a manganate ion for polishing high-hardness materials having a Mohs hardness of 8 or higher. In the present invention, the manganese oxide particle in the slurry is preferably 1.0 mass % or more; the manganese oxide is preferably manganese dioxide; and the manganate ion is preferably permanganate ion. The polishing slurry according to the present invention enables even high-hardness hardly-machinable materials such as silicon carbide and gallium nitride to be polished smoothly at a high speed.

Claims (11)

1. A polishing slurry comprising a slurry comprising a manganese oxide particle comprised of manganese dioxide and a manganate ion, wherein the manganate ion in the slurry is present in an amount of 0.1 mass % or more and 4.0 mass % or less, and wherein a molar concentration ratio of the manganate ion to the manganese oxide is 0.2 or higher and 1.5 or lower, and wherein the slurry has a pH of 7 to 10.

2. The polishing slurry according to claim 1 , wherein the manganese oxide particle in the slurry is present in an amount of 1.0 mass % or more.

3. The polishing slurry according to claim 1 wherein the manganate ion is permanganate ion.

4. The polishing slurry according to claim 1 which comprises a solvent.

5. The polishing slurry according to claim 2 , wherein the manganate ion is permanganate ion.

6. The polishing slurry according to claim 4 , wherein the manganate ion is permanganate ion.

7. A method for polishing comprising contacting a surface of a high-hardness material having a Mohs hardness of 8 or higher with the polishing slurry defined in claim 1 .

8. The method according to claim 7 wherein the high-hardness material is silicon carbide.

9. The method for polishing according to claim 7 , comprising repeatedly contacting the surface of the high-hardness material with the polishing slurry.

10. The method of claim 7 where in the high-hardness material comprises one or more of silicon carbide, gallium nitride and diamond.

11. The method for polishing according to claim 7 , comprising subsequently contacting a surface of a plurality of high-hardness materials having a Mohs hardness of 8 or higher with the same polishing slurry.

Assignments (2)
CHANGE OF NAME Recorded Mar 31, 2026
From: MITSUI MINING AND SMELTING COMPANY, LIMITED
To: MITSUI KINZOKU COMPANY, LIMITED
Reel/Frame 075357/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 27, 2014
From: SATO, RYUICHI; MARUYAMA, YOHEI; KOIKE, ATSUSHI
To: MITSUI MINING & SMELTING CO., LTD.
Reel/Frame 032541/0509 →
Priority Claims (2)
JP 2011-225625 · Oct 13, 2011 · national
JP 2012-018931 · Jan 31, 2012 · national
Continuity (1)
Related Publication 20140242750A1 · Aug 28, 2014