IP Library › Granted Patent US 9,117,625
Granted Patent B2
US 9,117,625 · App. 14/348,559 · Granted Aug 25, 2015

Electrostatic lens and charged particle beam apparatus using the same

Inventor: Yukio Noguchi (Kyoto, JP)
Assignee: Kyocera Corporation
H01J37/12B82Y10/00B82Y40/00H01J3/18H01J37/28H01J37/3007H01J37/3177H01J2237/03H01J2237/1205
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Quick Facts
Patent No.
US 9,117,625
App. No.
14/348,559
Granted
Aug 25, 2015
Kind
B2
Abstract

To provide an electrostatic lens which improves an irradiation accuracy of an electron beam while satisfying the need for higher throughput. An electrostatic lens according to one embodiment of the present invention includes a substrate which includes an insulating plate in which a plurality of first through holes that allow an electron beam to pass through are formed, a plurality of electrodes that are formed on an inner wall of the plurality of first through holes, and a plurality of wirings that are formed on the insulating plate and are electrically connected to each of the electrodes, wherein the plurality of electrodes are electrically independent from each other.

Claims (14)

1. An electrostatic lens comprising a plurality of substrates that each includes an insulating plate in which:

a plurality of through holes that allow an electron beam to pass through are formed,

a plurality of electrodes are formed on an inner wall of the plurality of through holes, and

a plurality of wirings are formed on the insulating plate and are electrically connected to each of the electrodes, wherein the plurality of electrodes are electrically independent from each other, and

wherein a stack body is formed by stacking the plurality of substrates, and a frame that surrounds the stack body in plan view is further provided, and

wherein the frame includes a first plate and a second plate which are connected to each other and is configured such that an end face which is perpendicular to one main surface of the second plate is abutted against part of one main surface of the first plate at a connecting section between the first plate and the second plate, and the stack body is configured such that a first side face is abutted against the one main surface of the first plate and a second side face which is perpendicular to the first side face is abutted against the one main surface of the second plate thereby providing alignment of through holes of respective substrates.

2. The electrostatic lens according to claim 1 further comprising a screw member that penetrates between both main surfaces of the first plate of the frame in a thickness direction and is connected to the end face of the second plate.

3. The electrostatic lens according to claim 2 , wherein a thickness between both main surfaces of the second plate is larger than a thickness between both main surfaces of the first plate.

4. The electrostatic lens according to claim 1 , wherein the stack body includes an insulating spacer that is disposed between adjacent substrates.

5. The electrostatic lens according to claim 1 , wherein the insulating plate is in a rectangular shape having a set of long sides and a set of short sides in a plan view, and the plurality of through holes are arranged in two rows along the long side.

6. The electrostatic lens according to claim 5 , wherein the plurality of wirings are routed to an end faces located to the long sides which are adjacent to the electrodes to which the wirings are electrically connected.

7. The electrostatic lens according to claim 1 , wherein the insulating plate is in a rectangular shape having a set of long sides and a set of short sides in a plan view, and the plurality of through holes are arranged in one row along the long side.

8. The electrostatic lens according to claim 7 , wherein the plurality of wirings are routed to an end face located to one long side of the insulating plate.

9. A charged particle beam apparatus comprising: the electrostatic lens according to claim 1 ; and an electron gun that emits an electron beam which passes through the through hole of the electrostatic lens.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2014
From: NOGUCHI, YUKIO
To: KYOCERA CORPORATION
Reel/Frame 032554/0614 →
Priority Claims (1)
JP 2011-216760 · Sep 30, 2011 · national
Continuity (1)
Related Publication 20140224999A1 · Aug 14, 2014