Method for characterizing a material
View Patent ↗A method for characterizing a material, comprising: arranging a piece of the material near a source of ionizing photons and a detector; irradiating the piece with photons and acquiring, via the detector, two energy spectra of a photon flux that has been diffused into the material at various depths, the ratio of the photon paths in the material before and after diffusion remaining constant; determining a combined attenuation function with the spectra and the paths; selecting a plurality of energy ranges from said function; calculating, in each range, a quantity that is representative of the function; and estimating, from at least two of said quantities, a physical characteristic of the material by comparison with the same quantities obtained from known materials.
1. Method for characterizing a material comprising the following steps:
a) arranging an object made of the material to be characterized, a collimated ionizing photon source having a collimation axis and a collimated detector having a collimation axis, such that the two collimation axes are secant in the material of the object and define a scatter depth in the material of the object and a scatter angle different to zero,
b) irradiating the object with ionizing photons generated by the source and acquiring, by means of the detector, a first energy spectrum corresponding to scatter of a first ionizing photon flux at a first scatter depth according to said scatter angle and a second energy spectrum corresponding to scatter of a second ionizing photon flux at a second scatter depth according to said scatter angle, the ionizing photons passing through the material by paths before and after scattering such that the ratio of the paths before and after scattering, called asymmetry factor, is substantially constant from one acquisition to another,
c) determining a combined linear attenuation function based on the two energy spectra after scattering and the path difference travelled by the ionizing photons before and after scattering from one acquisition to another,
d) selecting in this combined linear attenuation function a plurality of energy ranges,
e) calculating in each energy range a representative quantity of the combined linear attenuation function,
f) estimating on the basis of at least two of these quantities, at least one physical characteristic of the material to be characterized, by means of a comparison with the same quantities obtained using known materials.
2. Method according to claim 1 , wherein, in step e), the representative quantity of the combined linear attenuation function is a statistical indicator such as a mean or an integral.
3. Method according to claim 1 , wherein the asymmetry factor is substantially equal to one.
4. Method according to claim 1 , wherein, when in step d), two energy ranges including a lower range and an upper range are selected, the lower range comprising at least one energy less than those of the upper range, the physical characteristic of the material to be characterized estimated in step f) is the atomic number thereof or the mass effective atomic number thereof.
5. Method according to claim 1 , wherein, in step f), a ratio between said two quantities is produced.
6. Method according to claim 4 , wherein the lower range is between approximately 20 and 50 keV and the upper range is between approximately 50 and 150 keV.
7. Method according to claim 4 , wherein, when in step d), a third energy range is selected, comprising at least one energy greater than those of the lower range, in step f) the characteristic of the material to be characterized then being the density thereof.
8. Method according to claim 7 , wherein the third energy range is between approximately 50 and 150 keV.
9. Method according to claim 1 , wherein, when in step f), at least two physical characteristics of the material to be characterized are estimated, the method further comprises a step for identifying the material to be characterized consisting of:
obtaining for known materials of interest, the same physical characteristics, comparing the physical characteristics of the material to be characterized with those of the known materials of interest, the material being the material of interest most suitable for the comparison.
10. Method according to claim 9 , wherein the comparison is performed according to a geometric proximity criterion or a probabilistic criterion.
11. Device for characterizing a material, comprising:
a collimated ionizing photon source having a collimation axis, for irradiating an object of the material to be characterized with incident ionizing photons,
a collimated detector having a collimation axis, the source and the detector being collimated such that the collimation axes thereof form a scatter angle different to zero, and are secant in the material to be characterized at a scatter depth, the detector comprising means suitable for producing an energy spectrum of an ionizing photon flux detected thereby,
means for moving the source and/or the detector and/or the object, such that the intersection of the collimation axes of the source and the detector can vary between two different scatter depths in the material to be characterized,
means for determining a combined linear attenuation function based on a first energy spectrum corresponding to scatter of a first ionizing photon flux at a first scatter depth according to said scatter angle and a second energy spectrum corresponding to scatter of a second ionizing photon flux at a second scatter depth according to said scatter angle, and based on the positions of the source and the detector in relation to the material to be characterized, these first and second scattered ionizing photon fluxes being detected by the detector,
means for selecting in this combined linear attenuation function a plurality of energy ranges,
means for calculating, in each energy range, a representative quantity of the combined linear attenuation function,
means for estimating on the basis of at least two of these quantities, at least one physical characteristic of the material to be characterized, by means of a comparison with the same quantities obtained using known materials.