Room temperature tunneling switches and methods of making and using the same
The tunneling channel of a field effect transistor comprising a plurality of tunneling elements contacting a channel substrate. Applying a source-drain voltage of greater than a turn-on voltage produces a source-drain current of greater than about 10 pA. Applying a source-drain voltage of less than a turn-on voltage produces a source-drain current of less than about 10 pA. The turn-on voltage at room temperature is between about 0.1V and about 40V.
1. A tunneling channel of a field effect transistor, the tunneling channel comprising:
an electrically insulating, essentially one-dimensional channel substrate, wherein the electrically insulating, essentially one-dimensional channel substrate is selected from the group consisting of a nanotube, a nanowire, a nanofiber, and a nanorod;
a source region, a drain region, and a gate region disposed therebetween, the electrically insulating, essentially one-dimensional channel substrate coupling the source region to the drain region;
a plurality of randomly spaced tunneling elements contacting the electrically insulating, essentially one-dimensional channel substrate, wherein the plurality of randomly spaced tunneling elements includes a plurality of quantum dots for electrically conducting a source-drain tunneling current based on a turn-on voltage;
wherein applying a source-drain voltage of greater than the turn-on voltage produces the source-drain tunneling current of greater than about 10 pA via the plurality of quantum dots,
wherein applying a source-drain voltage of less than the turn-on voltage produces a source-drain tunneling current of less than about 10 pA via the plurality of quantum dots,
wherein the turn-on voltage at room temperature is between about 0.1 V and about 40 V.
2. The tunneling channel of claim 1 , wherein the plurality of randomly spaced tunneling elements comprises a material selected from the group consisting of metal, doped semiconductors, graphene, carbon nanotubes, superconductors, conductive molecules, and combinations thereof.
3. The tunneling channel of claim 1 , wherein the plurality of randomly spaced tunneling elements comprises a material selected from the group consisting of Au, Ag, Al, Fe, Ni, Mo, doped Si, doped Ge, doped BN, doped AlN, doped GaN, doped GaP, doped InP, doped GaAs, doped InAs, doped ZnO, doped ZnS, doped InAs, and combinations thereof.
4. The tunneling channel of claim 1 , wherein the plurality of randomly spaced tunneling elements does not require insulation from the atmosphere.
5. The tunneling channel of claim 1 , wherein the electrically insulating, essentially one-dimensional channel substrate comprises a material selected from the group consisting of insulating semiconductors, oxides, nitrides, glasses, insulating polymers, and combinations thereof.
6. The tunneling channel of claim 1 , wherein the electrically insulating, essentially one-dimensional channel substrate comprises a boron nitride nanotube.
7. A device comprising:
a tunneling channel including an electrically insulating, essentially one-dimensional channel substrate and a plurality of randomly spaced tunneling elements contacting the electrically insulating, essentially one-dimensional channel substrate, wherein the electrically insulating, essentially one-dimensional channel substrate is selected from the group consisting of a nanotube, a nanowire, a nanofiber, and a nanorod, and wherein the plurality of randomly spaced tunneling elements includes a plurality of quantum dots,
a source region, a drain region, and a gate region disposed therebetween, the electrically insulating, essentially one-dimensional channel substrate coupling the source region to the drain region, and
a source electrode at the source region and a drain electrode at the drain region,
wherein the plurality of quantum dots for electrically conducting a source-drain tunneling current based on a turn-on voltage,
wherein applying a source-drain voltage of greater than the turn-on voltage produces the source-drain tunneling current of greater than about 10 pA via the plurality of quantum dots,
wherein applying a source-drain voltage of less than the turn-on voltage produces a source-drain tunneling current of less than about 10 pA via the plurality of quantum dots, and
wherein the turn-on voltage at room temperature is between about 0.1 V and about 40 V.
8. The device of claim 7 , further comprising a gate electrode at the gate region.
9. The device of claim 7 , wherein the tunneling channel is oriented on a macrosubstrate.
10. A logic gate comprising the device of claim 7 .
11. The logic gate of claim 10 , wherein a logic operator of the logic gate is selected from the group consisting of AND, OR, XOR, NOT, NAND, NOR, XNOR, and combinations thereof.