COF type semiconductor package and method of manufacturing the same
View Patent ↗Provided is a chip on film (COF) type semiconductor package. The COF type semiconductor device includes a flexible film, an electrode pattern formed on the flexible film, a semiconductor device disposed on the electrode pattern, a conductive pad disposed between the electrode pattern and the semiconductor device to electrically connect the semiconductor device with the electrode pattern, and a first protective layer which seals the conductive pad and the semiconductor device and is formed on a portion of the electrode pattern and the semiconductor device. The first protective layer includes a heat conductive material for dissipating heat generated from the semiconductor device.
1. A chip on film (COF) type semiconductor package, comprising:
a flexible film;
an electrode pattern formed on the flexible film;
a semiconductor device disposed on the electrode pattern;
a conductive pad disposed between the electrode pattern and the semiconductor device to electrically connect the semiconductor device with the electrode pattern; and
a first protective layer that covers an entire outside surface of the flexible film to seal the conductive pad and the semiconductor device and is formed directly on a portion of the electrode pattern and the semiconductor device,
wherein the first protective layer includes: a heat conductive material for dissipating heat generated from the semiconductor device; and an adhesive material.
2. The COF type semiconductor package of claim 1 , further comprising a second protective layer formed on the electrode pattern to be spaced apart from the conductive pad,
wherein the first protective layer seals a space between the semiconductor device, the conductive pad, and the second protective layer.
3. The COF type semiconductor package of claim 2 , wherein the first protective layer comprises:
an underfill formed in a space between the second protective layer and the conductive pad; and
an upperfill formed on the semiconductor device, the underfill, and a portion of the second protective layer.
4. The COF type semiconductor package of claim 1 ,wherein the heat conductive material comprises aluminum oxide or iron oxide, and
the adhesive material comprises a resin composition including an epoxy resin and imidazole or a resin composition including an epoxy resin and amine.
5. The COF type semiconductor package of claim 1 , wherein the first protective layer comprises the heat conductive material in an amount of 80 wt % to 90 wt % and the adhesive material in an amount of 1 wt % to 10 wt %.
6. The COF type semiconductor package of claim 1 , wherein the conductive pad is formed in one piece with the semiconductor device under the semiconductor device.
7. The COF type semiconductor package of claim 1 , wherein the first protective layer is formed by coating or depositing a heat dissipation paint comprising the heat conductive material.
8. The COF type semiconductor package of claim 1 , wherein the first protective layer is continuously formed along a top surface and sides of the semiconductor device, sides of the conductive pad, and a top surface of the portion of the electrode pattern.
9. A chip on film (COF) type semiconductor package comprising:
a base film formed of a flexible material;
an electrode pattern formed on a first surface of the base film;
a semiconductor device mounted on the electrode pattern;
a protective layer formed on the electrode pattern and formed of an insulation material;
an underfill filled in a space between the semiconductor device and the protective layer; and
a heat dissipation layer formed on a second surface of the base film to dissipate heat generated from the semiconductor device,
wherein the heat dissipation layer comprises a heat conductive material and an adhesive material.