IP Library Granted Patent US 9,601,320
Granted Patent B2
US 9,601,320 · App. 14/389,340 · Granted Mar 21, 2017

Method for stabilizing a plasma and an improved ionization chamber

Inventors: Marc Mestres (Gennevilliers, FR); Paul Ceccato (Gennevilliers, FR)
Assignee: LASER SYSTEMS & SOLUTIONS OF EUROPE
H01J47/026H01S3/09775H05G2/003H05G2/008
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Quick Facts
Patent No.
US 9,601,320
App. No.
14/389,340
Granted
Mar 21, 2017
Kind
B2
Abstract

A method for stabilizing a plasma is disclosed. The method includes (a) providing in an ionization chamber a number of high voltage wires and a gas suitable for forming a plasma, and (b) exposing the gas to a high voltage thereby igniting the gas to form the plasma. Upon ignition, the plasma is subjected to an amount of light. A use of the method to generate X-rays is also disclosed. The invention is further directed to an ionization chamber including (a) a gas suitable for forming a plasma, and (b) a number of high voltage wires for exposing the gas to a high voltage thereby igniting the gas to form the plasma. The ionization chamber includes a device for subjecting the plasma upon ignition to an amount of light. The invention relates to an X-ray generator including such ionization chamber and to a laser apparatus including such X-ray generator.

Claims (27)

1. A method for stabilizing a plasma comprising:

(a) providing in an ionization chamber, a number of high voltage wires and a gas suitable for forming a plasma; and

(b) exposing the gas to a high voltage thereby igniting the gas to form the plasma,

wherein upon ignition, the plasma is subjected to an amount of light having a radiation energy from 100 mW to 1500 mW.

2. The method according to claim 1 , wherein the light has a wavelength between 10 and 1100 nanometers.

3. The method according to claim 1 , wherein the light is continuous.

4. The method according to claim 3 , wherein the light is substantially directed into the ionization chamber as a whole.

5. The method according to claim 1 , further comprising the step of C using X-rays generated after exposing the gas to the light.

6. The method of claim 2 , wherein the light is continuous while subjecting the plasma to the light.

7. An ionization chamber comprising:

(a) a gas suitable for forming a plasma; and

(b) a number of high voltage wires for exposing the gas to a high voltage thereby igniting the gas to form the plasma,

wherein the ionization chamber comprises a device for subjecting the plasma upon ignition to an amount of light, having a radiation energy from 100 mW to 1500 mW.

8. The ionization chamber according to claim 7 , wherein the device for subjecting the plasma to an amount of light comprises a light source with a wavelength between 10 and 1100 nanometers.

9. The ionization chamber according to claim 8 , wherein the device for subjecting the plasma to an amount of light comprises a continuous light source.

10. The ionization chamber according to claim 7 , wherein the device for subjecting the plasma to an amount of light is adapted for directing light substantially into the ionization chamber as a whole.

11. The ionization chamber according to claim 10 , wherein the device for subjecting the plasma to an amount of light comprises one or a plurality of external light sources and optical waveguides for guiding the light into the ionization chamber.

12. The ionization chamber according to claim 11 , wherein the optical waveguides comprise optical fibers.

13. A laser apparatus comprising an ionization chamber comprising:

(a) a gas suitable for forming a plasma; and

(b) a number of high voltage wires for exposing the gas to a high voltage thereby igniting the gas to form the plasma,

wherein the ionization chamber comprises a device for subjecting the plasma upon ignition to an amount of light with radiation energy from 100 mW to 1500 mW, said device comprising a light source having the radiation energy from 100 mW to 1500 mW.

14. The laser apparatus according to claim 13 comprising an X-ray generator.

15. The laser apparatus according to claim 13 , wherein the light is continuous.

16. The laser apparatus according to claim 13 , wherein the light is substantially directed into the ionization chamber as a whole.

17. The laser apparatus of claim 13 , wherein the light source is a continuous light source that provides continuous light at the radiation energy from 100 mW to 1500 mW.

18. The ionization chamber of claim 13 , wherein the light source is a continuous light source that provides continuous light at the radiation energy from 100 mW to 1500 mW.

Assignments (3)
CHANGE OF ADDRESS Recorded Oct 19, 2020
From: LASER SYSTEMS & SOLUTIONS OF EUROPE
To: LASER SYSTEMS & SOLUTIONS OF EUROPE
Reel/Frame 054121/0226 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 23, 2015
From: MESTRES, MARC; CECCATO, PAUL
To: LASER SYSTEMS & SOLUTIONS OF EUROPE
Reel/Frame 035882/0795 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2015
From: EXCICO FRANCE
To: LASER SYSTEMS & SOLUTIONS OF EUROPE
Reel/Frame 034866/0194 →
Priority Claims (1)
EP 12290116 · Apr 2, 2012 · regional
Continuity (1)
Related Publication 20150063547A1 · Mar 5, 2015