Optical measurement method and device
The invention relates to an optical measurement method and to an optical measurement device for determining the spatial or spatiotemporal distribution of a sample, the sample comprising at least one retransmission source, said at least one retransmission source retransmitting light depending on the projected light, according to a predetermined law, onto the sample, the method comprising: the projection onto the sample of at least two compact light distributions belonging to different topological families, which propagate along the same optical path, the detection of the light retransmitted by said at least one retransmission source of the sample; the generation of at least one optical image from the detected light; and the algorithmic analysis of the optical images for obtaining location data on said at least one retransmission source.
1. An optical measuring method for determining the spatial or spatiotemporal distribution of a sample, the sample comprising at least one reemitting source, said at least one reemitting source reemitting light as a function of the projected light, according to a determined law, on the sample, the method comprising:
projecting onto the sample, by means of an achromatic optical projection apparatus, a first compact light distribution;
detecting light reemitted by said at least one reemitting source and generating a first optical image on a basis of light detected due to the first compact light distribution;
after generating the first optical image, subsequently projecting onto the sample, by means of the achromatic optical projection apparatus, a second compact light distribution of a different topological family from that of the first compact light distribution, spreading in an optical path identical to that of the first compact light distribution;
detecting light reemitted by said at least one reemitting source of the sample;
generating a second optical image on a basis of light detected due to the second compact light distribution; and
algorithmically analyzing the first and the second optical images to obtain location information of said at least one reemitting source.
2. The optical measuring method according to claim 1 , wherein generating a first optical image from detected light is carried out at each instant when the sample is illuminated by the first compact light distribution.
3. The optical measuring method according to claim 1 , wherein said first and second compact light distributions of different topological families are created by interference between a regular wave and a singular wave, or between two singular waves, and spatial differentiation between said first and second distributions is created by varying at least one of the following parameters:
a) at least one of the parameters of the regular wave;
b) at least one parameter of at least one singular wave and
c) phase difference between the regular wave and the singular wave or between the two singular waves.
4. The optical measuring method according to claim 1 , wherein the projection of light distributions of different topological families is carried out by conical diffraction in a thin crystal.
5. The method according to claim 1 , further comprising transmission along part of the optical path of the compact light distributions of different topological families by fibre optic.
6. The method according to claim 1 , further comprising temporal separation by application of a physical effect, by means of an additional, regular or singular wave, by a photoactivation or photodepletion effect, of positioned reemitting sources, in the sample, at minimal distances from each other, using a Microscopy localisation technique.
7. The method according to claim 1 , wherein the waves of light distributions projected interact in non-linear manner, by multiphoton fluorescence effect or by Raman effect.
8. The method according to claim 1 , wherein said first and second compact light distributions of different topological families are collocated.