Structure analyzing device and a structure analyzing method
Disclosed is a structure analyzing device and a structure analyzing method which can analyze a state change of a structure, which is caused before the structure is destroyed, such as a state change of degradation of the structure or the like. A structure analyzing device ( 10 ) includes a vibration detecting unit ( 11 ) which detects a vibration of a structure, and an analysis unit ( 12 ) which analyzes an output signal of the vibration detecting unit ( 11 ). The analysis unit ( 12 ) analyzes a state change of the structure by comparing a value of resonant sharpness Q, which is measured by use of the following formula (1) in a state existing when carrying out analysis, with a value of resonant sharpness Q which is measured by use of the following formula (1) in a standard state.
1. A structure analyzing device, comprising:
a plurality of vibration detecting sensors configured to detect a vibration of a structure; and
a processor configured to analyze an output signal of the plurality of vibration detecting sensors, wherein
the plurality of vibration detecting sensors are arranged respectively at locations different from each other in the structure,
the processor analyzes distribution of change in the structure by comparing a measured value of a resonant sharpness Q, which is calculated by use of the following formula (1), with a standard value of the resonant sharpness Q, and comparing the measured value of the resonant sharpness Q of each sensor in high order resonant frequency,
Q=f/Δf (1)
where f is a resonant frequency of the structure, and Δf is a full width at half maximum, and
the processor identifies a degradation position of the structure based on a result of a comparison with respect to the resonant sharpness Q of each sensor in the high order resonant frequency.
2. The structure analyzing device according to claim 1 , wherein the standard value of the resonant sharpness Q is a value in a state before the change occurs in the structure.
3. The structure analyzing device according to claim 1 , wherein the standard value of the resonant sharpness Q is stored in a storage device, and wherein
the processor reads the standard value of the resonant sharpness Q from the storage device, and compares the measured value of the resonant sharpness Q with the standard value of the resonant sharpness Q.
4. The structure analyzing device according to claim 1 , wherein the plurality of vibration detecting sensors are contact sensors.
5. The structure analyzing device according to claim 1 , further comprising:
a vibration adding device which vibrates the structure.
6. The structure analyzing device according to claim 5 , wherein
the vibration adding device adds a vibration, which includes a high order resonant frequency component, to the structure, and causes the structure mechanical distortion, and wherein
at least one of the plurality of vibration detecting sensors is arranged at a position at which the mechanical distortion is caused.
7. A non-destructive inspection apparatus, comprising:
the structure analyzing device according to claim 1 .
8. A leak analyzing device, comprising:
the structure analyzing device according to claim 1 , wherein
the plurality of vibration detecting sensors detect a vibration of plumbing, and
the processor analyzes a degradation state of the plumbing by comparing a value of the resonant sharpness Q of the plumbing.
9. A structure analyzing method, comprising:
detecting a vibration of a structure; and
analyzing an output signal being output, wherein
analyzing a state change of the structure, by comparing a measured value of a resonant sharpness Q, which is calculated by use of the following formula (1), with a standard value of the resonant sharpness Q, and comparing the measured value of the resonant sharpness Q of each sensor in high order resonant frequency,
Q=f/Δf (1)
where f is a resonant frequency of the structure, and Δf is a full width at half maximum, and
identifying a degradation position of the structure based on a result of a comparison with respect to the resonant sharpness Q of each sensor in the high order resonant frequency.
10. The structure analyzing method according to claim 9 , wherein the standard value of the resonant sharpness Q is a value in a state before the change occurs in the structure.
11. The structure analyzing method according to claim 9 , wherein the standard value of the resonant sharpness Q is stored, and wherein
reading the standard value of the resonant sharpness Q and comparing the measured value of the resonant sharpness Q.
12. The structure analyzing method according to claim 9 , further comprising:
vibrating a structure, before detecting a vibration of a structure.
13. The structure analyzing method according to claim 12 , further comprising:
adding a vibration including a high order resonant frequency component of the structure, and in which by adding the vibration, cause the mechanical distortion to the structure,
detecting a vibration of the structure caused at a position, at which the mechanical distortion is caused, and
analyzing a state change of the structure on the basis of an output signal related to the vibration of the structure existing at the position at which the mechanical distortion is caused.
14. A non-destructive inspection method which uses the structure analyzing method according to claim 9 .
15. A leak analyzing method which uses the structure analyzing method according to claim 9 , wherein
detecting a vibration of plumbing is detected, and wherein
analyzing, a degradation state of the plumbing, by comparing the value of resonant sharpness Q of the plumbing.