IP Library Granted Patent US 9,692,398
Granted Patent B2
US 9,692,398 · App. 14/417,105 · Granted Jun 27, 2017

Apparatuses and methods for voltage buffering

Inventor: Wei Lu Chu (Shanghai, CN)
Assignee: Micron Technology, Inc.
H03K3/356G11C7/1084G11C29/50H03F3/347G11C2029/5004
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Quick Facts
Patent No.
US 9,692,398
App. No.
14/417,105
Granted
Jun 27, 2017
Kind
B2
Abstract

An apparatuses and methods for buffering a voltage from a circuit without current drive ability are described. An example apparatus includes a voltage buffer that includes two identical stages. The first stage is configured to receive an input voltage and produce an intermediate voltage as an output. The second stage is configured to receive the intermediate voltage and provide an output voltage that is equal to the input voltage. The voltage buffer may be coupled to a current source. The second stage of the voltage buffer may have current drive ability.

Claims (28)

1. An apparatus, comprising:

a first load circuit;

a second load circuit;

a first transistor, wherein a drain of the first transistor is coupled to the first load circuit, a source of the first transistor is coupled to ground, and a gate of the first transistor is configured to receive an input voltage;

a second transistor, wherein a drain of the second transistor is coupled to the second load circuit, a source of the second transistor is coupled to ground, and a gate of the second transistor is coupled to the source of the first load circuit and the drain of the first transistor; and

wherein the drain of the second transistor is configured to provide an output voltage.

2. The apparatus of claim 1 , wherein the first load circuit, second load circuit, first transistor, and second transistor are n-channel transistors.

3. The apparatus of claim 2 , wherein the n-channel transistors have identical transistor characteristics.

4. The apparatus of claim 1 , wherein the first load circuit comprises an n-channel transistor having a gate coupled to a drain and wherein the second load circuit comprises an n-channel transistor having a gate coupled to a drain.

5. The apparatus of claim 1 , wherein the first load circuit and the second load circuit are configured to receive a current.

6. The apparatus of claim 1 , further comprising a current mirror configured to provide a current to the first and second load circuits.

7. The apparatus of claim 6 , wherein the current mirror comprises two p-channel transistors.

8. The apparatus of claim 6 , wherein the current mirror comprises a resistance coupled to a first p-channel transistor and a reference voltage.

9. A memory, comprising:

a pad;

a test circuit coupled to the pad and configured to provide an output voltage at the pad to be monitored, the test circuit including:

a voltage buffer configured to receive an input voltage and provide the output voltage, the voltage buffer including:

a first active load circuit;

a second active load circuit;

a first transistor, wherein a drain of the first transistor is coupled to the first load circuit, a source of the first transistor is coupled to ground, and a gate of the first transistor is configured to receive an input voltage; and

a second transistor, wherein a drain of the second transistor is coupled to the second load circuit, a source of the second transistor is coupled to ground, and a gate of the second transistor is coupled to the source of the first load circuit and the drain of the first transistor, wherein the first transistor, second transistor, and transistors of the first and second active load circuits are matched; and

a current source coupled to the voltage buffer and configured to provide a current to the voltage buffer.

10. The memory of claim 9 , wherein the current source comprises:

first and second p-channel transistors having gates coupled together; and

a resistance coupled to the first p-channel transistor.

11. The memory of claim 9 , wherein the test circuit further includes a multiplexer configured to receive a plurality of voltages, wherein the multiplexer is further configured to provide one of the plurality of voltages to the voltage buffer as the input voltage.

12. The memory of claim 9 , wherein the first and second load circuits of the voltage buffer are coupled to the current source.

13. The memory of claim 12 , wherein the first transistor, second transistor, and transistors of the first and second active load circuits comprise matched n-channel transistors.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 23, 2015
From: CHU, WEI LU
To: MICRON TECHNOLOGY, INC.
Reel/Frame 034804/0047 →
Continuity (1)
Related Publication 20160218699A1 · Jul 28, 2016